(1992). Defect recognition in semiconductors before and after processing: Proceedings of the fourth international conference 18 - 22 March 1991, Wilmslow, UK. IOP Publ.
Chicago Style (17th ed.) CitationDefect Recognition in Semiconductors Before and After Processing: Proceedings of the Fourth International Conference 18 - 22 March 1991, Wilmslow, UK. Redcliffe Way: IOP Publ, 1992.
MLA (9th ed.) CitationDefect Recognition in Semiconductors Before and After Processing: Proceedings of the Fourth International Conference 18 - 22 March 1991, Wilmslow, UK. IOP Publ, 1992.
Warning: These citations may not always be 100% accurate.