Point and extended defects in semiconductors: [proceedings of the NATO Advanced Research Workshop / Internat. School of Materials Science and Technology Second Workshop on Point, Extended and Surface Defects in Semiconductors, held Nov. 2 - 7, 1988, in Erice, Italy]
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Bibliographic Details
Format: Conference Proceeding Book
Language:Undetermined
Published: New York u.a. Plenum Pr. 1989
Series:NATO: NATO ASI series / B 202
Subjects:
Physical Description:X, 287 S. Ill., graph. Darst.

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