Holdings: Proceedings :: THWS Bibkatalog

Proceedings: ICCD '84, Rye Town Hilton, Port Chester, NY, October 8 - October 11, 1984

Saved in:

Bibliographic Details
Corporate Author:	International Conference on Computer Design, VLSI in Computers Port Chester, NY (Author)
Format:	Conference Proceeding Book
Language:	Undetermined
Published:	Silver Spring, MD IEEE Computer Soc. Press 1984
Subjects:	Mikroelektronik Bildverstehen Testen Elektronik Computerunterstütztes Verfahren Computersimulation Mustererkennung Entwurf Maschinelles Sehen VLSI Datenverarbeitungssystem Integrierte Schaltung Telekommunikation Medizin Prüftechnik Konferenzschrift
Item Description:	Literaturangaben
Physical Description:	XIX, 876 S. graph. Darst.
ISBN:	0818605634

Staff View

MARC


LEADER	00000nam a2200000 c 4500
001	BV008028710
003	DE-604
005	20140610
007	t\|
008	930713s1984 xx d\|\|\| \|\|\|\| 10\|\|\| und d
020			\|a 0818605634 \|9 0-8186-0563-4
035			\|a (OCoLC)633013439
035			\|a (DE-599)BVBBV008028710
040			\|a DE-604 \|b ger \|e rakddb
041			\|a und
049			\|a DE-91 \|a DE-739 \|a DE-83
084			\|a ELT 272f \|2 stub
111	2		\|a International Conference on Computer Design, VLSI in Computers \|d 1984 \|c Port Chester, NY \|j Verfasser \|0 (DE-588)5002711-6 \|4 aut
245	1	0	\|a Proceedings \|b ICCD '84, Rye Town Hilton, Port Chester, NY, October 8 - October 11, 1984 \|c IEEE International Conference on Computer Design: VLSI in Computers
264		1	\|a Silver Spring, MD \|b IEEE Computer Soc. Press \|c 1984
300			\|a XIX, 876 S. \|b graph. Darst.
336			\|b txt \|2 rdacontent
337			\|b n \|2 rdamedia
338			\|b nc \|2 rdacarrier
500			\|a Literaturangaben
650	0	7	\|a Mikroelektronik \|0 (DE-588)4039207-7 \|2 gnd \|9 rswk-swf
650	0	7	\|a Bildverstehen \|0 (DE-588)4202022-0 \|2 gnd \|9 rswk-swf
650	0	7	\|a Testen \|0 (DE-588)4367264-4 \|2 gnd \|9 rswk-swf
650	0	7	\|a Elektronik \|0 (DE-588)4014346-6 \|2 gnd \|9 rswk-swf
650	0	7	\|a Computerunterstütztes Verfahren \|0 (DE-588)4139030-1 \|2 gnd \|9 rswk-swf
650	0	7	\|a Computersimulation \|0 (DE-588)4148259-1 \|2 gnd \|9 rswk-swf
650	0	7	\|a Mustererkennung \|0 (DE-588)4040936-3 \|2 gnd \|9 rswk-swf
650	0	7	\|a Entwurf \|0 (DE-588)4121208-3 \|2 gnd \|9 rswk-swf
650	0	7	\|a Maschinelles Sehen \|0 (DE-588)4129594-8 \|2 gnd \|9 rswk-swf
650	0	7	\|a VLSI \|0 (DE-588)4117388-0 \|2 gnd \|9 rswk-swf
650	0	7	\|a Datenverarbeitungssystem \|0 (DE-588)4125229-9 \|2 gnd \|9 rswk-swf
650	0	7	\|a Integrierte Schaltung \|0 (DE-588)4027242-4 \|2 gnd \|9 rswk-swf
650	0	7	\|a Telekommunikation \|0 (DE-588)4059360-5 \|2 gnd \|9 rswk-swf
650	0	7	\|a Medizin \|0 (DE-588)4038243-6 \|2 gnd \|9 rswk-swf
650	0	7	\|a Prüftechnik \|0 (DE-588)4047610-8 \|2 gnd \|9 rswk-swf
655		7	\|0 (DE-588)1071861417 \|a Konferenzschrift \|2 gnd-content
689	0	0	\|a Integrierte Schaltung \|0 (DE-588)4027242-4 \|D s
689	0	1	\|a Prüftechnik \|0 (DE-588)4047610-8 \|D s
689	0		\|8 1\p \|5 DE-604
689	1	0	\|a Datenverarbeitungssystem \|0 (DE-588)4125229-9 \|D s
689	1	1	\|a Computersimulation \|0 (DE-588)4148259-1 \|D s
689	1		\|8 2\p \|5 DE-604
689	2	0	\|a Telekommunikation \|0 (DE-588)4059360-5 \|D s
689	2	1	\|a Computersimulation \|0 (DE-588)4148259-1 \|D s
689	2		\|8 3\p \|5 DE-604
689	3	0	\|a Mikroelektronik \|0 (DE-588)4039207-7 \|D s
689	3	1	\|a Prüftechnik \|0 (DE-588)4047610-8 \|D s
689	3		\|8 4\p \|5 DE-604
689	4	0	\|a Elektronik \|0 (DE-588)4014346-6 \|D s
689	4	1	\|a Testen \|0 (DE-588)4367264-4 \|D s
689	4		\|8 5\p \|5 DE-604
689	5	0	\|a VLSI \|0 (DE-588)4117388-0 \|D s
689	5	1	\|a Entwurf \|0 (DE-588)4121208-3 \|D s
689	5		\|8 6\p \|5 DE-604
689	6	0	\|a Computerunterstütztes Verfahren \|0 (DE-588)4139030-1 \|D s
689	6	1	\|a Medizin \|0 (DE-588)4038243-6 \|D s
689	6		\|8 7\p \|5 DE-604
689	7	0	\|a Integrierte Schaltung \|0 (DE-588)4027242-4 \|D s
689	7	1	\|a Testen \|0 (DE-588)4367264-4 \|D s
689	7		\|8 8\p \|5 DE-604
689	8	0	\|a Bildverstehen \|0 (DE-588)4202022-0 \|D s
689	8	1	\|a Maschinelles Sehen \|0 (DE-588)4129594-8 \|D s
689	8		\|8 9\p \|5 DE-604
689	9	0	\|a Mustererkennung \|0 (DE-588)4040936-3 \|D s
689	9	1	\|a Maschinelles Sehen \|0 (DE-588)4129594-8 \|D s
689	9		\|8 10\p \|5 DE-604
883	1		\|8 1\p \|a cgwrk \|d 20201028 \|q DE-101 \|u https://d-nb.info/provenance/plan#cgwrk
883	1		\|8 2\p \|a cgwrk \|d 20201028 \|q DE-101 \|u https://d-nb.info/provenance/plan#cgwrk
883	1		\|8 3\p \|a cgwrk \|d 20201028 \|q DE-101 \|u https://d-nb.info/provenance/plan#cgwrk
883	1		\|8 4\p \|a cgwrk \|d 20201028 \|q DE-101 \|u https://d-nb.info/provenance/plan#cgwrk
883	1		\|8 5\p \|a cgwrk \|d 20201028 \|q DE-101 \|u https://d-nb.info/provenance/plan#cgwrk
883	1		\|8 6\p \|a cgwrk \|d 20201028 \|q DE-101 \|u https://d-nb.info/provenance/plan#cgwrk
883	1		\|8 7\p \|a cgwrk \|d 20201028 \|q DE-101 \|u https://d-nb.info/provenance/plan#cgwrk
883	1		\|8 8\p \|a cgwrk \|d 20201028 \|q DE-101 \|u https://d-nb.info/provenance/plan#cgwrk
883	1		\|8 9\p \|a cgwrk \|d 20201028 \|q DE-101 \|u https://d-nb.info/provenance/plan#cgwrk
883	1		\|8 10\p \|a cgwrk \|d 20201028 \|q DE-101 \|u https://d-nb.info/provenance/plan#cgwrk
943	1		\|a oai:aleph.bib-bvb.de:BVB01-005282956

Record in the Search Index

_version_	1820875974323994624
adam_text
any_adam_object
author_corporate	International Conference on Computer Design, VLSI in Computers Port Chester, NY
author_corporate_role	aut
author_facet	International Conference on Computer Design, VLSI in Computers Port Chester, NY
author_sort	International Conference on Computer Design, VLSI in Computers Port Chester, NY
building	Verbundindex
bvnumber	BV008028710
classification_rvk	SS 1984
classification_tum	ELT 272f
ctrlnum	(OCoLC)633013439 (DE-599)BVBBV008028710
discipline	Elektrotechnik
format	Conference Proceeding Book
fullrecord	<?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>00000nam a2200000 c 4500</leader><controlfield tag="001">BV008028710</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20140610</controlfield><controlfield tag="007">t\|</controlfield><controlfield tag="008">930713s1984 xx d\|\|\| \|\|\|\| 10\|\|\| und d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">0818605634</subfield><subfield code="9">0-8186-0563-4</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)633013439</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV008028710</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rakddb</subfield></datafield><datafield tag="041" ind1=" " ind2=" "><subfield code="a">und</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-91</subfield><subfield code="a">DE-739</subfield><subfield code="a">DE-83</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">ELT 272f</subfield><subfield code="2">stub</subfield></datafield><datafield tag="111" ind1="2" ind2=" "><subfield code="a">International Conference on Computer Design, VLSI in Computers</subfield><subfield code="d">1984</subfield><subfield code="c">Port Chester, NY</subfield><subfield code="j">Verfasser</subfield><subfield code="0">(DE-588)5002711-6</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Proceedings</subfield><subfield code="b">ICCD '84, Rye Town Hilton, Port Chester, NY, October 8 - October 11, 1984</subfield><subfield code="c">IEEE International Conference on Computer Design: VLSI in Computers</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Silver Spring, MD</subfield><subfield code="b">IEEE Computer Soc. Press</subfield><subfield code="c">1984</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">XIX, 876 S.</subfield><subfield code="b">graph. Darst.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">Literaturangaben</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Mikroelektronik</subfield><subfield code="0">(DE-588)4039207-7</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Bildverstehen</subfield><subfield code="0">(DE-588)4202022-0</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Testen</subfield><subfield code="0">(DE-588)4367264-4</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Elektronik</subfield><subfield code="0">(DE-588)4014346-6</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Computerunterstütztes Verfahren</subfield><subfield code="0">(DE-588)4139030-1</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Computersimulation</subfield><subfield code="0">(DE-588)4148259-1</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Mustererkennung</subfield><subfield code="0">(DE-588)4040936-3</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Entwurf</subfield><subfield code="0">(DE-588)4121208-3</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Maschinelles Sehen</subfield><subfield code="0">(DE-588)4129594-8</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">VLSI</subfield><subfield code="0">(DE-588)4117388-0</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Datenverarbeitungssystem</subfield><subfield code="0">(DE-588)4125229-9</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Integrierte Schaltung</subfield><subfield code="0">(DE-588)4027242-4</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Telekommunikation</subfield><subfield code="0">(DE-588)4059360-5</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Medizin</subfield><subfield code="0">(DE-588)4038243-6</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Prüftechnik</subfield><subfield code="0">(DE-588)4047610-8</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="655" ind1=" " ind2="7"><subfield code="0">(DE-588)1071861417</subfield><subfield code="a">Konferenzschrift</subfield><subfield code="2">gnd-content</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Integrierte Schaltung</subfield><subfield code="0">(DE-588)4027242-4</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="1"><subfield code="a">Prüftechnik</subfield><subfield code="0">(DE-588)4047610-8</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="8">1\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="1" ind2="0"><subfield code="a">Datenverarbeitungssystem</subfield><subfield code="0">(DE-588)4125229-9</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="1" ind2="1"><subfield code="a">Computersimulation</subfield><subfield code="0">(DE-588)4148259-1</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="1" ind2=" "><subfield code="8">2\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="2" ind2="0"><subfield code="a">Telekommunikation</subfield><subfield code="0">(DE-588)4059360-5</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="2" ind2="1"><subfield code="a">Computersimulation</subfield><subfield code="0">(DE-588)4148259-1</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="2" ind2=" "><subfield code="8">3\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="3" ind2="0"><subfield code="a">Mikroelektronik</subfield><subfield code="0">(DE-588)4039207-7</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="3" ind2="1"><subfield code="a">Prüftechnik</subfield><subfield code="0">(DE-588)4047610-8</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="3" ind2=" "><subfield code="8">4\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="4" ind2="0"><subfield code="a">Elektronik</subfield><subfield code="0">(DE-588)4014346-6</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="4" ind2="1"><subfield code="a">Testen</subfield><subfield code="0">(DE-588)4367264-4</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="4" ind2=" "><subfield code="8">5\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="5" ind2="0"><subfield code="a">VLSI</subfield><subfield code="0">(DE-588)4117388-0</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="5" ind2="1"><subfield code="a">Entwurf</subfield><subfield code="0">(DE-588)4121208-3</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="5" ind2=" "><subfield code="8">6\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="6" ind2="0"><subfield code="a">Computerunterstütztes Verfahren</subfield><subfield code="0">(DE-588)4139030-1</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="6" ind2="1"><subfield code="a">Medizin</subfield><subfield code="0">(DE-588)4038243-6</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="6" ind2=" "><subfield code="8">7\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="7" ind2="0"><subfield code="a">Integrierte Schaltung</subfield><subfield code="0">(DE-588)4027242-4</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="7" ind2="1"><subfield code="a">Testen</subfield><subfield code="0">(DE-588)4367264-4</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="7" ind2=" "><subfield code="8">8\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="8" ind2="0"><subfield code="a">Bildverstehen</subfield><subfield code="0">(DE-588)4202022-0</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="8" ind2="1"><subfield code="a">Maschinelles Sehen</subfield><subfield code="0">(DE-588)4129594-8</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="8" ind2=" "><subfield code="8">9\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="9" ind2="0"><subfield code="a">Mustererkennung</subfield><subfield code="0">(DE-588)4040936-3</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="9" ind2="1"><subfield code="a">Maschinelles Sehen</subfield><subfield code="0">(DE-588)4129594-8</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="9" ind2=" "><subfield code="8">10\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">1\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">2\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">3\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">4\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">5\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">6\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">7\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">8\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">9\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">10\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield><datafield tag="943" ind1="1" ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-005282956</subfield></datafield></record></collection>
genre	(DE-588)1071861417 Konferenzschrift gnd-content
genre_facet	Konferenzschrift
id	DE-604.BV008028710
illustrated	Illustrated
indexdate	2025-01-10T15:24:10Z
institution	BVB
institution_GND	(DE-588)5002711-6
isbn	0818605634
language	Undetermined
oai_aleph_id	oai:aleph.bib-bvb.de:BVB01-005282956
oclc_num	633013439
open_access_boolean
owner	DE-91 DE-BY-TUM DE-739 DE-83
owner_facet	DE-91 DE-BY-TUM DE-739 DE-83
physical	XIX, 876 S. graph. Darst.
publishDate	1984
publishDateSearch	1984
publishDateSort	1984
publisher	IEEE Computer Soc. Press
record_format	marc
spelling	International Conference on Computer Design, VLSI in Computers 1984 Port Chester, NY Verfasser (DE-588)5002711-6 aut Proceedings ICCD '84, Rye Town Hilton, Port Chester, NY, October 8 - October 11, 1984 IEEE International Conference on Computer Design: VLSI in Computers Silver Spring, MD IEEE Computer Soc. Press 1984 XIX, 876 S. graph. Darst. txt rdacontent n rdamedia nc rdacarrier Literaturangaben Mikroelektronik (DE-588)4039207-7 gnd rswk-swf Bildverstehen (DE-588)4202022-0 gnd rswk-swf Testen (DE-588)4367264-4 gnd rswk-swf Elektronik (DE-588)4014346-6 gnd rswk-swf Computerunterstütztes Verfahren (DE-588)4139030-1 gnd rswk-swf Computersimulation (DE-588)4148259-1 gnd rswk-swf Mustererkennung (DE-588)4040936-3 gnd rswk-swf Entwurf (DE-588)4121208-3 gnd rswk-swf Maschinelles Sehen (DE-588)4129594-8 gnd rswk-swf VLSI (DE-588)4117388-0 gnd rswk-swf Datenverarbeitungssystem (DE-588)4125229-9 gnd rswk-swf Integrierte Schaltung (DE-588)4027242-4 gnd rswk-swf Telekommunikation (DE-588)4059360-5 gnd rswk-swf Medizin (DE-588)4038243-6 gnd rswk-swf Prüftechnik (DE-588)4047610-8 gnd rswk-swf (DE-588)1071861417 Konferenzschrift gnd-content Integrierte Schaltung (DE-588)4027242-4 s Prüftechnik (DE-588)4047610-8 s 1\p DE-604 Datenverarbeitungssystem (DE-588)4125229-9 s Computersimulation (DE-588)4148259-1 s 2\p DE-604 Telekommunikation (DE-588)4059360-5 s 3\p DE-604 Mikroelektronik (DE-588)4039207-7 s 4\p DE-604 Elektronik (DE-588)4014346-6 s Testen (DE-588)4367264-4 s 5\p DE-604 VLSI (DE-588)4117388-0 s Entwurf (DE-588)4121208-3 s 6\p DE-604 Computerunterstütztes Verfahren (DE-588)4139030-1 s Medizin (DE-588)4038243-6 s 7\p DE-604 8\p DE-604 Bildverstehen (DE-588)4202022-0 s Maschinelles Sehen (DE-588)4129594-8 s 9\p DE-604 Mustererkennung (DE-588)4040936-3 s 10\p DE-604 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 2\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 3\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 4\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 5\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 6\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 7\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 8\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 9\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 10\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk
spellingShingle	Proceedings ICCD '84, Rye Town Hilton, Port Chester, NY, October 8 - October 11, 1984 Mikroelektronik (DE-588)4039207-7 gnd Bildverstehen (DE-588)4202022-0 gnd Testen (DE-588)4367264-4 gnd Elektronik (DE-588)4014346-6 gnd Computerunterstütztes Verfahren (DE-588)4139030-1 gnd Computersimulation (DE-588)4148259-1 gnd Mustererkennung (DE-588)4040936-3 gnd Entwurf (DE-588)4121208-3 gnd Maschinelles Sehen (DE-588)4129594-8 gnd VLSI (DE-588)4117388-0 gnd Datenverarbeitungssystem (DE-588)4125229-9 gnd Integrierte Schaltung (DE-588)4027242-4 gnd Telekommunikation (DE-588)4059360-5 gnd Medizin (DE-588)4038243-6 gnd Prüftechnik (DE-588)4047610-8 gnd
subject_GND	(DE-588)4039207-7 (DE-588)4202022-0 (DE-588)4367264-4 (DE-588)4014346-6 (DE-588)4139030-1 (DE-588)4148259-1 (DE-588)4040936-3 (DE-588)4121208-3 (DE-588)4129594-8 (DE-588)4117388-0 (DE-588)4125229-9 (DE-588)4027242-4 (DE-588)4059360-5 (DE-588)4038243-6 (DE-588)4047610-8 (DE-588)1071861417
title	Proceedings ICCD '84, Rye Town Hilton, Port Chester, NY, October 8 - October 11, 1984
title_auth	Proceedings ICCD '84, Rye Town Hilton, Port Chester, NY, October 8 - October 11, 1984
title_exact_search	Proceedings ICCD '84, Rye Town Hilton, Port Chester, NY, October 8 - October 11, 1984
title_full	Proceedings ICCD '84, Rye Town Hilton, Port Chester, NY, October 8 - October 11, 1984 IEEE International Conference on Computer Design: VLSI in Computers
title_fullStr	Proceedings ICCD '84, Rye Town Hilton, Port Chester, NY, October 8 - October 11, 1984 IEEE International Conference on Computer Design: VLSI in Computers
title_full_unstemmed	Proceedings ICCD '84, Rye Town Hilton, Port Chester, NY, October 8 - October 11, 1984 IEEE International Conference on Computer Design: VLSI in Computers
title_short	Proceedings
title_sort	proceedings iccd 84 rye town hilton port chester ny october 8 october 11 1984
title_sub	ICCD '84, Rye Town Hilton, Port Chester, NY, October 8 - October 11, 1984
topic	Mikroelektronik (DE-588)4039207-7 gnd Bildverstehen (DE-588)4202022-0 gnd Testen (DE-588)4367264-4 gnd Elektronik (DE-588)4014346-6 gnd Computerunterstütztes Verfahren (DE-588)4139030-1 gnd Computersimulation (DE-588)4148259-1 gnd Mustererkennung (DE-588)4040936-3 gnd Entwurf (DE-588)4121208-3 gnd Maschinelles Sehen (DE-588)4129594-8 gnd VLSI (DE-588)4117388-0 gnd Datenverarbeitungssystem (DE-588)4125229-9 gnd Integrierte Schaltung (DE-588)4027242-4 gnd Telekommunikation (DE-588)4059360-5 gnd Medizin (DE-588)4038243-6 gnd Prüftechnik (DE-588)4047610-8 gnd
topic_facet	Mikroelektronik Bildverstehen Testen Elektronik Computerunterstütztes Verfahren Computersimulation Mustererkennung Entwurf Maschinelles Sehen VLSI Datenverarbeitungssystem Integrierte Schaltung Telekommunikation Medizin Prüftechnik Konferenzschrift
work_keys_str_mv	AT internationalconferenceoncomputerdesignvlsiincomputersportchesterny proceedingsiccd84ryetownhiltonportchesternyoctober8october111984

Holdings

There is no print copy available.

Interlibrary loan Place Request Caution: Not in THWS collection!

MARC

Record in the Search Index

There is no print copy available.

Similar Items