Proceedings of IEEE Workshop on Expert Systems and Pattern Analysis: Oct. 31, 1986, Paris, France
Gespeichert in:
| Körperschaft: | |
|---|---|
| Format: | Tagungsbericht Buch |
| Sprache: | Undetermined |
| Veröffentlicht: |
Singapore
World Scientific
1987
|
| Schlagworte: | |
| Beschreibung: | Literaturangaben |
| Beschreibung: | V, 126 S. Ill., graph. Darst. |
| ISBN: | 9971504758 |
Internformat
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| 111 | 2 | |a Workshop on Expert Systems and Pattern Analysis |d 1986 |c Paris |j Verfasser |0 (DE-588)814863-6 |4 aut | |
| 245 | 1 | 0 | |a Proceedings of IEEE Workshop on Expert Systems and Pattern Analysis |b Oct. 31, 1986, Paris, France |c ed. by C. H. Chen |
| 264 | 1 | |a Singapore |b World Scientific |c 1987 | |
| 300 | |a V, 126 S. |b Ill., graph. Darst. | ||
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| author_corporate | Workshop on Expert Systems and Pattern Analysis Paris |
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| author_facet | Workshop on Expert Systems and Pattern Analysis Paris |
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| building | Verbundindex |
| bvnumber | BV007658003 |
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| genre | (DE-588)1071861417 Konferenzschrift 1986 Paris gnd-content |
| genre_facet | Konferenzschrift 1986 Paris |
| id | DE-604.BV007658003 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T17:07:04Z |
| institution | BVB |
| institution_GND | (DE-588)814863-6 (DE-588)1692-5 |
| isbn | 9971504758 |
| language | Undetermined |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-005020379 |
| oclc_num | 633149875 |
| open_access_boolean | |
| owner | DE-355 DE-BY-UBR DE-29T |
| owner_facet | DE-355 DE-BY-UBR DE-29T |
| physical | V, 126 S. Ill., graph. Darst. |
| publishDate | 1987 |
| publishDateSearch | 1987 |
| publishDateSort | 1987 |
| publisher | World Scientific |
| record_format | marc |
| spelling | Workshop on Expert Systems and Pattern Analysis 1986 Paris Verfasser (DE-588)814863-6 aut Proceedings of IEEE Workshop on Expert Systems and Pattern Analysis Oct. 31, 1986, Paris, France ed. by C. H. Chen Singapore World Scientific 1987 V, 126 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Literaturangaben Expertensystem (DE-588)4113491-6 gnd rswk-swf Mustererkennung (DE-588)4040936-3 gnd rswk-swf (DE-588)1071861417 Konferenzschrift 1986 Paris gnd-content Expertensystem (DE-588)4113491-6 s Mustererkennung (DE-588)4040936-3 s DE-604 Chen, Chi-hau 1937- Sonstige (DE-588)110444965 oth Institute of Electrical and Electronics Engineers Sonstige (DE-588)1692-5 oth |
| spellingShingle | Proceedings of IEEE Workshop on Expert Systems and Pattern Analysis Oct. 31, 1986, Paris, France Expertensystem (DE-588)4113491-6 gnd Mustererkennung (DE-588)4040936-3 gnd |
| subject_GND | (DE-588)4113491-6 (DE-588)4040936-3 (DE-588)1071861417 |
| title | Proceedings of IEEE Workshop on Expert Systems and Pattern Analysis Oct. 31, 1986, Paris, France |
| title_auth | Proceedings of IEEE Workshop on Expert Systems and Pattern Analysis Oct. 31, 1986, Paris, France |
| title_exact_search | Proceedings of IEEE Workshop on Expert Systems and Pattern Analysis Oct. 31, 1986, Paris, France |
| title_full | Proceedings of IEEE Workshop on Expert Systems and Pattern Analysis Oct. 31, 1986, Paris, France ed. by C. H. Chen |
| title_fullStr | Proceedings of IEEE Workshop on Expert Systems and Pattern Analysis Oct. 31, 1986, Paris, France ed. by C. H. Chen |
| title_full_unstemmed | Proceedings of IEEE Workshop on Expert Systems and Pattern Analysis Oct. 31, 1986, Paris, France ed. by C. H. Chen |
| title_short | Proceedings of IEEE Workshop on Expert Systems and Pattern Analysis |
| title_sort | proceedings of ieee workshop on expert systems and pattern analysis oct 31 1986 paris france |
| title_sub | Oct. 31, 1986, Paris, France |
| topic | Expertensystem (DE-588)4113491-6 gnd Mustererkennung (DE-588)4040936-3 gnd |
| topic_facet | Expertensystem Mustererkennung Konferenzschrift 1986 Paris |
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