Semiconductor devices: Testing and evaluation
Saved in:
| Main Author: | |
|---|---|
| Format: | Book |
| Language: | English |
| Published: |
London
Business Books
1974
|
| Subjects: | |
| Physical Description: | VII, 134 S. 108 graph. Darst. |
Staff View
MARC
| LEADER | 00000nam a2200000 c 4500 | ||
|---|---|---|---|
| 001 | BV007354902 | ||
| 003 | DE-604 | ||
| 005 | 20031223 | ||
| 007 | t | ||
| 008 | 930421s1974 d||| |||| 00||| eng d | ||
| 035 | |a (OCoLC)1095398 | ||
| 035 | |a (DE-599)BVBBV007354902 | ||
| 040 | |a DE-604 |b ger |e rakddb | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-355 |a DE-91 | ||
| 050 | 0 | |a TK7871.85 | |
| 082 | 0 | |a 621.3815/2 |2 18 | |
| 084 | |a ZN 4800 |0 (DE-625)157408: |2 rvk | ||
| 100 | 1 | |a Jowett, Charles E. |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a Semiconductor devices |b Testing and evaluation |
| 264 | 1 | |a London |b Business Books |c 1974 | |
| 300 | |a VII, 134 S. |b 108 graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 650 | 4 | |a Semiconductors |x Testing | |
| 650 | 0 | 7 | |a Test |0 (DE-588)4059549-3 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Halbleiterbauelement |0 (DE-588)4113826-0 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Halbleiterschaltung |0 (DE-588)4158811-3 |2 gnd |9 rswk-swf |
| 689 | 0 | 0 | |a Halbleiterbauelement |0 (DE-588)4113826-0 |D s |
| 689 | 0 | |5 DE-604 | |
| 689 | 1 | 0 | |a Test |0 (DE-588)4059549-3 |D s |
| 689 | 1 | |8 1\p |5 DE-604 | |
| 689 | 2 | 0 | |a Halbleiterschaltung |0 (DE-588)4158811-3 |D s |
| 689 | 2 | |8 2\p |5 DE-604 | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-004744002 | ||
| 883 | 1 | |8 1\p |a cgwrk |d 20201028 |q DE-101 |u https://d-nb.info/provenance/plan#cgwrk | |
| 883 | 1 | |8 2\p |a cgwrk |d 20201028 |q DE-101 |u https://d-nb.info/provenance/plan#cgwrk | |
Record in the Search Index
| _version_ | 1804121600595853312 |
|---|---|
| any_adam_object | |
| author | Jowett, Charles E. |
| author_facet | Jowett, Charles E. |
| author_role | aut |
| author_sort | Jowett, Charles E. |
| author_variant | c e j ce cej |
| building | Verbundindex |
| bvnumber | BV007354902 |
| callnumber-first | T - Technology |
| callnumber-label | TK7871 |
| callnumber-raw | TK7871.85 |
| callnumber-search | TK7871.85 |
| callnumber-sort | TK 47871.85 |
| callnumber-subject | TK - Electrical and Nuclear Engineering |
| classification_rvk | ZN 4800 |
| ctrlnum | (OCoLC)1095398 (DE-599)BVBBV007354902 |
| dewey-full | 621.3815/2 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 621 - Applied physics |
| dewey-raw | 621.3815/2 |
| dewey-search | 621.3815/2 |
| dewey-sort | 3621.3815 12 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
| format | Book |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01420nam a2200421 c 4500</leader><controlfield tag="001">BV007354902</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20031223 </controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">930421s1974 d||| |||| 00||| eng d</controlfield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)1095398</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV007354902</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rakddb</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-355</subfield><subfield code="a">DE-91</subfield></datafield><datafield tag="050" ind1=" " ind2="0"><subfield code="a">TK7871.85</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">621.3815/2</subfield><subfield code="2">18</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">ZN 4800</subfield><subfield code="0">(DE-625)157408:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Jowett, Charles E.</subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Semiconductor devices</subfield><subfield code="b">Testing and evaluation</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">London</subfield><subfield code="b">Business Books</subfield><subfield code="c">1974</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">VII, 134 S.</subfield><subfield code="b">108 graph. Darst.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Semiconductors</subfield><subfield code="x">Testing</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Test</subfield><subfield code="0">(DE-588)4059549-3</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Halbleiterbauelement</subfield><subfield code="0">(DE-588)4113826-0</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Halbleiterschaltung</subfield><subfield code="0">(DE-588)4158811-3</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Halbleiterbauelement</subfield><subfield code="0">(DE-588)4113826-0</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="1" ind2="0"><subfield code="a">Test</subfield><subfield code="0">(DE-588)4059549-3</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="1" ind2=" "><subfield code="8">1\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="2" ind2="0"><subfield code="a">Halbleiterschaltung</subfield><subfield code="0">(DE-588)4158811-3</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="2" ind2=" "><subfield code="8">2\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-004744002</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">1\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">2\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield></record></collection> |
| id | DE-604.BV007354902 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T17:00:34Z |
| institution | BVB |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-004744002 |
| oclc_num | 1095398 |
| open_access_boolean | |
| owner | DE-355 DE-BY-UBR DE-91 DE-BY-TUM |
| owner_facet | DE-355 DE-BY-UBR DE-91 DE-BY-TUM |
| physical | VII, 134 S. 108 graph. Darst. |
| publishDate | 1974 |
| publishDateSearch | 1974 |
| publishDateSort | 1974 |
| publisher | Business Books |
| record_format | marc |
| spelling | Jowett, Charles E. Verfasser aut Semiconductor devices Testing and evaluation London Business Books 1974 VII, 134 S. 108 graph. Darst. txt rdacontent n rdamedia nc rdacarrier Semiconductors Testing Test (DE-588)4059549-3 gnd rswk-swf Halbleiterbauelement (DE-588)4113826-0 gnd rswk-swf Halbleiterschaltung (DE-588)4158811-3 gnd rswk-swf Halbleiterbauelement (DE-588)4113826-0 s DE-604 Test (DE-588)4059549-3 s 1\p DE-604 Halbleiterschaltung (DE-588)4158811-3 s 2\p DE-604 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 2\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | Jowett, Charles E. Semiconductor devices Testing and evaluation Semiconductors Testing Test (DE-588)4059549-3 gnd Halbleiterbauelement (DE-588)4113826-0 gnd Halbleiterschaltung (DE-588)4158811-3 gnd |
| subject_GND | (DE-588)4059549-3 (DE-588)4113826-0 (DE-588)4158811-3 |
| title | Semiconductor devices Testing and evaluation |
| title_auth | Semiconductor devices Testing and evaluation |
| title_exact_search | Semiconductor devices Testing and evaluation |
| title_full | Semiconductor devices Testing and evaluation |
| title_fullStr | Semiconductor devices Testing and evaluation |
| title_full_unstemmed | Semiconductor devices Testing and evaluation |
| title_short | Semiconductor devices |
| title_sort | semiconductor devices testing and evaluation |
| title_sub | Testing and evaluation |
| topic | Semiconductors Testing Test (DE-588)4059549-3 gnd Halbleiterbauelement (DE-588)4113826-0 gnd Halbleiterschaltung (DE-588)4158811-3 gnd |
| topic_facet | Semiconductors Testing Test Halbleiterbauelement Halbleiterschaltung |
| work_keys_str_mv | AT jowettcharlese semiconductordevicestestingandevaluation |