Proceedings of the sixth International Conference on X-Ray Optics and Microanalysis:
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Bibliographic Details
Corporate Author: International Conference on X-Ray Optics and Microanalysis Osaka (Author)
Format: Conference Proceeding Book
Language:English
Published: Tokyo Univ. of Tokyo Pr. 1972
Subjects:
Physical Description:XI, 908 S. Ill., graph. Darst.

There is no print copy available.

Interlibrary loan Place Request Caution: Not in THWS collection!