X rays in materials analysis: novel applications and recent developments 2 25 - 26 July 1991, San Diego, California
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Bibliographic Details
Format: Book
Language:English
Published: Bellingham, Wash. SPIE 1991
Series:Society of Photo-Optical Instrumentation Engineers: Proceedings of SPIE 1550
Subjects:
Physical Description:VIII, 172 S. Ill., graph. Darst.
ISBN:0819406783

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