Characterization of semiconductor materials: principles and methods 1
Gespeichert in:
| Format: | Buch |
|---|---|
| Sprache: | English |
| Veröffentlicht: |
Park Ridge, NJ
Noyes
(1989)
|
| Schriftenreihe: | Materials science and process technology series
|
| Schlagworte: | |
| Beschreibung: | XII, 330 S. Ill., graph. Darst. |
| ISBN: | 0815512007 |
Internformat
MARC
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| id | DE-604.BV006935023 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T16:52:27Z |
| institution | BVB |
| isbn | 0815512007 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-004383262 |
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| physical | XII, 330 S. Ill., graph. Darst. |
| publishDate | 1989 |
| publishDateSearch | 1989 |
| publishDateSort | 1989 |
| publisher | Noyes |
| record_format | marc |
| series2 | Materials science and process technology series |
| spelling | Characterization of semiconductor materials principles and methods 1 ed. by Gary E. McGuire Park Ridge, NJ Noyes (1989) XII, 330 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Materials science and process technology series Halbleiterwerkstoff (DE-588)4158817-4 gnd rswk-swf Halbleiterwerkstoff (DE-588)4158817-4 s DE-604 MacGuire, Gary E. Sonstige oth (DE-604)BV006935022 1 |
| spellingShingle | Characterization of semiconductor materials principles and methods Halbleiterwerkstoff (DE-588)4158817-4 gnd |
| subject_GND | (DE-588)4158817-4 |
| title | Characterization of semiconductor materials principles and methods |
| title_auth | Characterization of semiconductor materials principles and methods |
| title_exact_search | Characterization of semiconductor materials principles and methods |
| title_full | Characterization of semiconductor materials principles and methods 1 ed. by Gary E. McGuire |
| title_fullStr | Characterization of semiconductor materials principles and methods 1 ed. by Gary E. McGuire |
| title_full_unstemmed | Characterization of semiconductor materials principles and methods 1 ed. by Gary E. McGuire |
| title_short | Characterization of semiconductor materials |
| title_sort | characterization of semiconductor materials principles and methods |
| title_sub | principles and methods |
| topic | Halbleiterwerkstoff (DE-588)4158817-4 gnd |
| topic_facet | Halbleiterwerkstoff |
| volume_link | (DE-604)BV006935022 |
| work_keys_str_mv | AT macguiregarye characterizationofsemiconductormaterialsprinciplesandmethods1 |