Protocol test systems: proceedings of the IFIP TC 6 2nd International Workshop on Protocol Test Systems, organized by GMD-FOKUS and IBM-ENC, Berlin, FRG, 3 - 6 Oct., 1989
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Bibliographic Details
Format: Conference Proceeding Book
Language:English
Published: Amsterdam [u.a.] North-Holland 1990
Subjects:
Item Description:Literaturangaben
Physical Description:X, 371 S. graph. Darst.
ISBN:0444885633

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