Applied logistic regression:
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Bibliographic Details
Main Authors: Hosmer, David W. 1944- (Author), Lemeshow, Stanley 1948- (Author)
Format: Book
Language:English
Published: New York, NY u.a. Wiley 1989
Series:Wiley series in probability and mathematical statistics : Applied probability and statistics sect.
A Wiley-Interscience publication
Subjects:
Physical Description:XIII, 307 S. graph. Darst.
ISBN:0471615536

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