Hot electron degradation in short-channel MOS transistors:
Saved in:
| Main Author: | |
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| Format: | Microfilm Book |
| Language: | Undetermined |
| Published: |
1989
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| Subjects: | |
| Item Description: | Lausanne, Ecole Polytechnique Federale, Diss., 1990. - Mikroreprod. e. Ms. Getr. Zählung : Ill., graph. Darst. |
| Physical Description: | 3 Mikrofiches; 24x |
Staff View
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| 100 | 1 | |a Acović, Alexandre |e Verfasser |4 aut | |
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| 264 | 1 | |c 1989 | |
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Record in the Search Index
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|---|---|
| any_adam_object | |
| author | Acović, Alexandre |
| author_facet | Acović, Alexandre |
| author_role | aut |
| author_sort | Acović, Alexandre |
| author_variant | a a aa |
| building | Verbundindex |
| bvnumber | BV006157851 |
| classification_tum | ELT 321d ELT 240d |
| ctrlnum | (OCoLC)631451519 (DE-599)BVBBV006157851 |
| discipline | Elektrotechnik |
| format | Microfilm Book |
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| genre | (DE-588)4113937-9 Hochschulschrift gnd-content |
| genre_facet | Hochschulschrift |
| id | DE-604.BV006157851 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-09T16:41:16Z |
| institution | BVB |
| language | Undetermined |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-003895330 |
| oclc_num | 631451519 |
| open_access_boolean | |
| owner | DE-91 DE-BY-TUM |
| owner_facet | DE-91 DE-BY-TUM |
| physical | 3 Mikrofiches; 24x |
| publishDate | 1989 |
| publishDateSearch | 1989 |
| publishDateSort | 1989 |
| record_format | marc |
| spelling | Acović, Alexandre Verfasser aut Hot electron degradation in short-channel MOS transistors par Alexandre Acović 1989 3 Mikrofiches; 24x txt rdacontent h rdamedia he rdacarrier Lausanne, Ecole Polytechnique Federale, Diss., 1990. - Mikroreprod. e. Ms. Getr. Zählung : Ill., graph. Darst. Degradation Technik (DE-588)4206992-0 gnd rswk-swf Heißes Elektron (DE-588)4159455-1 gnd rswk-swf MOS-FET (DE-588)4207266-9 gnd rswk-swf (DE-588)4113937-9 Hochschulschrift gnd-content MOS-FET (DE-588)4207266-9 s Degradation Technik (DE-588)4206992-0 s Heißes Elektron (DE-588)4159455-1 s DE-604 |
| spellingShingle | Acović, Alexandre Hot electron degradation in short-channel MOS transistors Degradation Technik (DE-588)4206992-0 gnd Heißes Elektron (DE-588)4159455-1 gnd MOS-FET (DE-588)4207266-9 gnd |
| subject_GND | (DE-588)4206992-0 (DE-588)4159455-1 (DE-588)4207266-9 (DE-588)4113937-9 |
| title | Hot electron degradation in short-channel MOS transistors |
| title_auth | Hot electron degradation in short-channel MOS transistors |
| title_exact_search | Hot electron degradation in short-channel MOS transistors |
| title_full | Hot electron degradation in short-channel MOS transistors par Alexandre Acović |
| title_fullStr | Hot electron degradation in short-channel MOS transistors par Alexandre Acović |
| title_full_unstemmed | Hot electron degradation in short-channel MOS transistors par Alexandre Acović |
| title_short | Hot electron degradation in short-channel MOS transistors |
| title_sort | hot electron degradation in short channel mos transistors |
| topic | Degradation Technik (DE-588)4206992-0 gnd Heißes Elektron (DE-588)4159455-1 gnd MOS-FET (DE-588)4207266-9 gnd |
| topic_facet | Degradation Technik Heißes Elektron MOS-FET Hochschulschrift |
| work_keys_str_mv | AT acovicalexandre hotelectrondegradationinshortchannelmostransistors |