Advancing mission accomplishment: conference record Autotestcon 90, September 17 - 20, 1990 ; San Antonio Convention Center, San Antonio, Texas
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| Published: |
New York, NY
Inst. of Electrical and Electronics Engineers
1990
|
| Subjects: | |
| Online Access: | Inhaltsverzeichnis |
| Item Description: | Literaturangaben |
| Physical Description: | XXII, 594 S. Ill., graph. Darst. |
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| 084 | |a ELT 238f |2 stub | ||
| 245 | 1 | 0 | |a Advancing mission accomplishment |b conference record Autotestcon 90, September 17 - 20, 1990 ; San Antonio Convention Center, San Antonio, Texas |
| 264 | 1 | |a New York, NY |b Inst. of Electrical and Electronics Engineers |c 1990 | |
| 300 | |a XXII, 594 S. |b Ill., graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 500 | |a Literaturangaben | ||
| 650 | 0 | 7 | |a Automatisches Prüfen |0 (DE-588)4269925-3 |2 gnd |9 rswk-swf |
| 655 | 7 | |0 (DE-588)1071861417 |a Konferenzschrift |y 1990 |z San Antonio Tex. |2 gnd-content | |
| 689 | 0 | 0 | |a Automatisches Prüfen |0 (DE-588)4269925-3 |D s |
| 689 | 0 | |5 DE-604 | |
| 711 | 2 | |a Autotestcon |d 1990 |c San Antonio, Tex. |j Sonstige |0 (DE-588)5049493-4 |4 oth | |
| 856 | 4 | 2 | |m Digitalisierung TU Muenchen |q application/pdf |u http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=003888815&sequence=000002&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA |3 Inhaltsverzeichnis |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-003888815 | ||
Record in the Search Index
| _version_ | 1804120377591332864 |
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| adam_text | TABLE
OF
CONTENTS
Page
CONCEPTS
AND APPROACHES
SUPPORT SYSTEMS DESIGNS FOR THE
1990s
Mobile Tester
Switching Subsystem
Architecture
S.
Benedikt, Harris Corp....................................................................................................
З
EAST; Functional Avionics System Tester
W.A.
Boström
and H.J. Baluta, Grumman Corp
................................................................. 7
Benefits of Intelligent Support Systems
P.A.
Cundiff, Emerson Hectric Co
...................................................................................... 13
Vertical Commonality Through the Use of Ada in ATE Systems
D.E.
Caihoun, G.E.
Matýsek,
and T.W. Griffin,
Westinghouse
Electric Corp
......................... 21
DEVELOPING PORTABLE SUPPORT SYSTEMS
Developing Portable Testers
-
A User s Perspective
Maj.
L.B.
Glenesk,
Dept
of National Defence, Canada (late paper)
........................................
t
A Rapid Deployment System (RDS)
A. Cutolo and R. Nielsen, Grumman Corp. (late paper)
........................................................
t
CF-18 PATS
-
ATE on the Move
A.J. Guarino and J.M. Hedgecock, Harris Corp
.................................................................. 29
Systems Architecture for Portable ATE
D.C. Peterson, General Dynamics (late paper)
......................................................................
f
User Configuration Portable ATE
D. Snipes, Martin Marietta Electronic Systems
...................................................................... 33
Calibration in Portable Testers
T.
Russo,
Harris Corp
......................................................................................................... 41
Test and Maintenance-Aiding Features of the IMIS
L.M. Palmer, General Dynamics (late paper)
.........................................................................
f
A Portable Scalar Network Analyzer
f
or the Flight Line Environment
R. Scherer, R. Ray, and V. Tnish, Lockheed Sanders,
Inc
.................................................... 45
INNOVATIVE TPS STRATEGIES
Next Generation TPS
Architecture
Α.
Poon,
W
J.
Bertch, and
J.B.
Wood, General Dynamics
.................................................... 51
xiii
TABLE
OF
CONTENTS
(Conťd)
Page
Test Program Sets
-
A New Approach
H.H.
Dili, ARINC Research Corp
........................................................................................ 63
Intelligent Test Program Evaluation
R.G. Wright, Y. Dudey, and Henry Bowers, Prospective Computer Analysts, Inc.; and
P. JanuszandP.
Lyon, USA.............................................................................................. 71
A Probing Algorithm for Circuits Containing Feedback
B.L. Haviicsek,
Westinghouse
Hectric Corp
......................................................................... 77
Integrating Expert System Diagnostics Within ATE System Software
F.L. Buck,
Westinghouse
Hectric
Соф
................................................................................ 85
Dynamic Sequencing of Test Programs
A. Levy andJ. Pizzariella, Harris
Соф
............................................................................... 93
OVERCOMING THE BARRIERS TO TWO-LEVEL MAINTENANCE
Massive Monitoring: A Methodology to Ensure TLM Effectiveness
R.F. Price,
Westinghouse
БесМс Соф................................................................................
101
Advanced Diagnostic Architecture for JIAWG Compliant Designs
P. Dennis, Texas Instruments
.............................................................................................. 105
MIL-PRIME, The Performance Oriented Business Approach
M.
Beilo,
USAF (late paper)
................................................................................................
t
TECHNOLOGIES AND METHODOLOGIES
APPLYING NEW TECHNOLOGIES TO SUPPORT SYSTEMS
A
0.5
GHz to
20.0
GHz RF Generator Instrument-On-A-Card Using MMIC and
Field Programmable Gate Arrays
R.A. Lepine and A.R. Martuscelio, Lookheed Sanders
......................................................... 115
Had Your
SUPE
and ATE It Too
J.L.
Kunért,
USN (late paper)
..............................................................................................
t
Enhanced Calibration Techniques for VXIbus Instrumentation
G.J. Stefanelli,
AAI
Соф...................................................................................................
123
The Rote of Test Instrumentation in Integrated Diagnostics and
Common Testers
R.E. Hiebert, Jr., Colorado Data Systems,
Inc
...................................................................... 129
VKl ATE Technology
D.
La Cascia, SEMCO
........................................................................................................ 137
xiv
TABLE
OF
CONTENTS
(Conťd)
Page
Self-Improving
ATE
D.L. Chenoweth and M.J. Cassaro,
University of Louisville; and
R.
Cantone,
Automated
Technology Systems Corp
............................................................... 145
Software
Interoperability
-
The Challenge
in VXIbus
Systems
С
Thomsen, Brüel
&
Kjaer
................................................................................................. 153
PROGRAMMING LANGUAGES AND TECHNIQUES
The Changing Nature of MATE
CUL
R.
Brooks and M. Weiner, SofTech, Inc.; and
MSgt. J. Wyburn, USAF (late paper)
...................................................................................
t
An Automatic Diagnosis System with Fuzzy Diagnostic Approach
for Linear Analog Circuits
D. Guang-Hua and T. Ren-Heng, Beijing University
............................................................. 161
Inductive Learning Applied to Diagnostics
M.D. Walters, Emerson Electric Co
..................................................................................... 167
Interactive SRU Diagnosis Using Neural Networks
L.G. Alfred and L.V. Kirkland, USAF
................................................................................. 175
ENABLING TECHNOLOGIES FOR ENHANCING SYSTEM READINESS
Integration Techniques for VXIbus Instrumentation Systems
A.M. Gallagher, Harris
Соф
............................................................................................... 183
Downsizing with VXIbus
-
Lessons Learned
I.A.
Orlidge,
AAI Corp
...................................................................................................... 187
A Flexible, MATE Compliant Portable Test Set
S.
Parise,
Bendix
Test Systems Division, Allied Signal Aerospace Co
...................................... 195
Field Test Collimatorsfor Testing FLIR Systems
T. Johnson and S. Sharon,
CI
Systems,
Inc
......................................................................... 199
Computer-Aided Design and Tester Independence of Test Information
Standards
2Lt. A.S.
Pettinato
and W.E. Russell, Jr., USAF
................................................................ 205
The Application of Evidential Reasoning in a Portable Maintenance Aid
W.R. Simpson andJ.W. Sheppard, ARINC Research Corp
.................................................. 211
VLSI
Seiftest
as a Layer of Built-in Test-A Case Study
D.E.
Harris,
Westinghouse
Electric Corp
.................................................................................... 215
xv
TABLE
OF
CONTENTS
(Conťd)
Page
SOFTWARE DEVELOPMENT
ENVIRONMENTS AND
TOOLS
A
Comprehensive
Design and Maintenance Environment
for Test Program Sets
V.
Monie,
Honeywell
Inc...........................................................................................................
223
GRADE: A
Graphical ATE
Desktop Environment
W.L. Williams,
AAI Corp
......................................................................................................... 231
Ada
Software Support Environment
f
or Test
G.M.
DeWald
Gee, D.G. Crowe, andJ.P.
Souiikas,
Westinghouse
Electric Corp
.......................... 239
Standardized Ada Test Constructs in a VXIBUS Implementation
J. Ziegler, J.M.
Grasso, L.G.
Burgermeister,
and
D.E.
Sorensen, ITT Avionics
........................... 247
Interface Test Adapter Configurator
B. Phillips, Tinker Air Force Base; and
C. Bacon, Oklahoma State University
......................................................................................... 255
THE CHALLENGE OF SUPPORTING NEW TECHNOLOGIES
A User s View of the New MIL-STD-883 Procedure
5012
C. Pyron and S. Vining, Texas Instruments
Inc
.......................................................................... 261
ATE Digital Testing Using a Programmable Microsequencer Architecture
J. Beat, General Dynamics
........................................................................................................ 269
Support Environment Methodologies for the Rapid Reprogramming of
Operational Flight Programs
Lt. G.T. HowellandLt. J.W. McCord, USAF
........................................................................... 275
Migrating TPSs to Next Generation ATE
J.C. Bergeron, Schlumberger Technologies ATE Division
............................................................ 281
High Speed Test Adapters in the Functional Test Environment
M.A. Dziuk, USAF
................................................................................................................... 287
WAVES; A Simulation and Tester View
KG.
Hulmán, USAF
................................................................................................................ 291
RF TESTING
Modular Microwave Subsystems for Downsized ATE
M.K. Shandas and G.R. Basawapatna, Mierosource,
Inc
............................................................. 303
VXI Based Microwave Testing on the Flighttine
RJ. Bowes and J.R. Scoggins, Lockheed Sanders,
Inc
.......................................................... 309
χυί
TABLE
OF
CONTENTS
(Conťd)
Page
Smart
Subsystem Architectures Key to Effective MATE RF and
Microwave Testing
C. Fallon,
AAI
Corp.;
R.
Krupa, USAF;
and
С.
Wood, SofTech.
Inc.......................................................................................................
315
SYSTEMS ENGINEERING
ENHANCING SYSTEM MAINTAINABILITY WITH BIT/BITE
Implementing Boundary Scan Test Strategies
P.
Hansen, Teradyne
Inc
.................................................................................................... 325
An Embedded Maintenance Subsystem
E.A. Esker, W.R. Simpson, and J.W. Sheppard, ARINC Research Corp
............................... 331
Hierarchical Bit: Reusable Bit Software for Integrated Systems
W. Daniel and R.
Sällade,
Texas Instruments
Inc
................................................................. 337
CALS:
RESPONDING TO THE NEW REQUIREMENTS
From Design for Test to Concurrent Engineering
J.
Turino,
Logical Solutions Technology,
bc
........................................................................ 345
INTEGRATES
M.J.
Stora,
GenRad,
Inc
..................................................................................................... 351
Selecting and Implementing an Automated Technical Information
Production System
R. HarlowandL. Bullard, General Electric Co
.................................................................... 367
APUS
-
The European View of
CALS
Group Captain
MJ.
S.
Palmer, UK Ministry of Defence
........................................................ 373
DESIGNING FOR TESTABILITY
improving Testability Analysis Via an Automated MIL-STD-2165
Checklist Toot
W. Daniel and R.
Knott,
Texas Instruments
Inc
.................................................................... 379
Testability
f
or All Seasons
R.E. Hartwell,
General Electric Co
...................................................................................... 387
Reconsidering the Meaning of Testability in the
VISI
Environment
K.R.
Hilberth, GTT
Industries, Inc., and
B. Dahlberg,
Hi-Level Technology (late paper)
.....................................................................
f
хіні
TABLE
OF
CONTENTS
(Conťd)
Page
START;
System
Testability Analysis and Research Tool
K.R. Pattipati, S. Deb, M. Dontamsetty, and A. Maitra, University of Connecticut
................ 395
DEVELOPING SUPPORT CONCEPTS AND REQUIREMENTS
Decision Support Tools Help Transition CASS into the Fleet
C.J. Tyrpak, M.A
Malesich,
and J.P. McCabe, USN
........................................................... 405
Depot
101,
A Choose-Your-Own Software Maintenance Adventure
J.T.
Mederkom,
USAF
...................................................................................................... 411
The Dynamics of a Successful Engineering Support Effort for Intermediate ATE
DA. Park and R.J. Volentine, USAF
.................................................................................. 417
A Depot Users Viewpoint, The Need for a Philosophy of User Participation
and Continuous Improvement in ATE Applications to Electronics Repair
J.B. SidesandD.L. Haney, USAF
...................................................................................... 423
The Impact of Changing DOD Maintenance Philosophies on the Automatic
Test Equipment Industry
J.T. O Brien, Jr.,
AAI Corp
................................................................................................ 429
Lessons Learned Developing Organic Support for Avionics Equipment
С
Gelfond,
R.
Johns, and
D.
Presto, ITT Avionics
.............................................................. 435
A Look at the Challenges and Initiatives Resulting from the Streamlining
Defense Conference/Workshop
O.W. Sepp, O.W. Sepp &
Associates (late paper)
.................................................................
t
USING INTEGRATED DIAGNOSTICS TO IMPROVE
SYSTEM SUPPORTABILITY
A Navy Approach to Integrated Diagnostics
W.L.
Keiner, USN.............................................................................................................. 443
Integrated Diagnostic Framework for Establishing ATE Requirements
M. (k>Ias, General Dynamics (late paper)
.............................................................................
f
A System Testability Top-Down Apportionment Method
D.M. BeUehsen, B.A.
Keiley, and AM. Hanania, Harris Corp
.............................................. 451
Analytical Techniques for Diagnostic Functional Allocation
L.A. Stratton and D.C.
Doskočil,
General Electric Co
.......................................................... 465
Why an Air Force Centralized Integrated Diagnostics Office?
Maj.
A. Moselep, USAF
...................................................................................................... 473
XÜÍÜ
TABLE
OF
CONTENTS
(Conťd)
Page
Integrated Diagnosis
-
A Hierarchical Approach
J.W. Sheppard and W.R. Simpson, ARINC Research Corp
.................................................. 477
Generic Software Tool to Improve Diagnostic Systems by Feedback of
Field Experience Data
F. Setaruddin and A.J. Schlesinger, Harris Corp.; and
K. Davis and A.M. Stanley, Rockwell International Corp
....................................................... 485
SPECIAL TOPICS
COMMERCIAL AVIONICS TESTING
The Role of Voluntary Standards in Commercial Avionics Test
P. Prisaznuk, ARINC (late paper)
........................................................................................
t
SMART
608
Interface Connector Assembly
-
This NEW Standard
Employs Innovative Signal Distribution and Interface Techniques
J.D. Walsh, Racal-Dana Instruments
Inc
............................................................................... 493
Airlines Get SMART™ for Avionics Testing
E.M. Melendez, ARINC Corp.; and
D.C. Hart, TYX Corp
......................................................................................................... 505
Integrating Design for Testability and Automatic Testing Approaches
E.A. Esker, W.R. Simpson, and J.W. Sheppard, ARINC Research Corp.; and
J.P. Martin, Aerospatiale
.................................................................................................... 509
MECHANICAL SYSTEMS CONDITION MONITORING
Mechanical Diagnostics
-
Past, Present and Future
M.B. Walter, Scientific-Atlanta,
Inc
...................................................................................... 517
Oil Monitoring Technology
P.W. Centers, USAF
.......................................................................................................... 523
Neural Network System for Helicopter Diagnostics
M. Solorzano, USN (late paper)
...........................................................................................
f
A Mechanical System Condition-Based Maintenance Demonstration Model
G.W. Nickerson and C.P. Nemarich, USN
.......................................................................... 529
Space Propulsion Systems Diagnostics
S. Tulpule, United Technologies Research Center
................................................................. 535
Mechanical System Condition Monitor (MSCM) System Design
J.
Marciano,
J.
Pratt,
L.
Carlton,
and
R.
Carlson, United Technologies
................................ 543
xix
TABLE
OF
CONTENTS
(Conťd)
Page
V-22
Mechanical
Diagnostic Design
Approach
R.W.Balke,
Bell Helicopter
Textron,
Inc
.............................................................................. 549
Decision: To Monitor or Not to Monitor
K. Pierce, McDonnell Douglas Helicopter Gate paper)
............................................................
t
ENGINES AND ACCESSORIES
Second Generation Jet Engine Diagnostic Computer for Flight Line
Maintenance Applications
D.
Dauben,
SAI
Technology; and
£.
Tirey, United Technologies Corp
..................................................................................... 559
Engine Monitoring System Diagnostics for the TF30-P1
11
Engine
R.D. Somers, Southwest Research Institute
.......................................................................... 567
NDI Technique Development for Engine Reliability Enhancement
A.B. Richter,
Science Applications International, Corp. (late paper)
........................................
t
SEMINARS
Design Considerations in Low Level Analog Test Systems
D. Kirsop and J. Yeager, Keithley Instruments,
Inc
............................................................... 577
Integrated Diagnostics
f
rom
α
Concurrent Engineering Perspective
P.J. Giordano and M.
Noian,
Giordano Associates,
Inc
........................................................ 589
tManuscript not available at time of publication.
XX
AUTHOR INDEX
Allred, L.G., 175
Bacon,
С,
255
Balke, R.W., 549
Baiuta, H.J., 7
Basawapatna, G.R.,
303
Beat, J.,
269
Bellehsen,
D.M., 451
Bello,
M.,t
Benedikt, S.,
З
Bergeron, J.C,
281
Bertch,
W.
J.,
51
Boström, W.
Α.,
7
Bowers,
Η.,
71
Bowes, R.J.,
309
Brooks,
R. t
Buck, F.L.,
85
Bullard, L., 367
Burgermeister,
L.
G.,
247
Calhoun,
D.E., 21
Cantone, R.,
145
Carlson, R.,
543
Carlton, L.,
543
Cassaro, M.J.,
145
Centers, P.W.,
523
Chenoweth, D.L.,
145
Crowe, D.G.,
239
Cundiff,
P.A., 13
Cutolo, A.t
Dahlberg, B.t
Daniel, W.,
337, 379
Dauben,
D.,
559
Davis,
K.,
485
Deb, S.,
395
Dennis,
P.,
105
Dill,
H.H., 63
Dontamsetty,
M.,
395
Doskočil,
D.C., 465
Dudey, Y.,71
Dziuk, M.A.,
287
Esker,
EA.,
331, 509
Fallon, C,
315
Gallagher, A.M.,
183
Gee, G.M.DeWald,
239
Gelfond, C,
435
Giordano, P.J.,
589
Glenesk, L.B.f
Golas,
M.t
Grasso, J.M.,
247
Griffin,
T.W.,
21
Guarino, A.
J.,
29
Guang-Hua, D.,
161
Hanania, A.M.,
451
Haney, D.L.,
423
Hansen,
P.,
325
Harlow,
R.,
367
Harris, D.E., 215
Hart,
D.C,
505
Hartwell,
RE.,
387
Havlicsek, B.L.,
77
Hedgecock, J.M.,
29
Hiebert,
Jr., R.E.,
129
Hilberth, K.R.t
Hillman, R.G.,
291
Howell, G.T.,275
Janusz,
P.,
71
Johns,
R.,
435
Johnson,
T.,
199
Keiner, W.L., 443
Kelley, B.A., 451
Kirkland, L.V., 175
Kirsop, D., 577
Knott, R.,
379
Krupa, R.,
315
Kunért, J.L.t
La Cascia,
D.,
137
Lepine, R.A.,
115
Levy,
Α.,
93
Lyon, P.,
71
Maitra,
Α.,
395
Malesich,
Μ.Α.,
405
Marciano, J.,
543
Martin, J.P.,
509
Martuscello, A.R.,
115
Matýsek,
G.E.,
21
McCabe, J.P.,405
McCord, J.W.,
275
Melendez, E.M.,
505
Monie,
V.,
223
Moseley,
Α.,
473
Nemarich,
СР.,
529
Nickerson, G.W.,
529
Niederkom, J.T.,
411
Nielsen, R.t
Nolan,
M.,
589
O Brien, Jr., J.T.,
429
Orlidge, L.A.,
187
Palmer, L.M.f
Palmer, M.J.S.,
373
Parise, S.,
195
Park,
DA,
417
Pattipati. K.R., 395
Peterson, D.C.t
Pettinato, A.S.,
205
Phillips,
В.,
255
Pierce, K.t
Pizzariella, J.,
93
xxi
AUTHOR INDEX
(Conťd)
Poon,
Α.,
51
Pratt, J.,
543
Presto, D.,
435
Price, R.F.,
101
Pyron,
С,
261
Prisaznuk,
P.t
Ray, R., 45
Ren-Heng,
T.,
161
Richter, A.B.t
Russell, Jr., W.E.,
205
Russo,
T.,
41
Sällade, R.,
337
Scherer, R., 45
Schlesinger, A.J.,
485
Scoggins, J.R., 309
Sepp, O.W.t
Setaruddin, F., 485
Shandas, M.K., 303
Sharon,
S.,
199
Sheppard, J.W.,211,
331,
477, 509
Sides, J.B.,
423
Simpson, W.R.,
211, 331,
477, 509
Solorzano, M.t
Snipes,
D.,
33
Somers, R.D.,
567
Sorensen,
D.E., 247
Soulikas, J.P.,
239
Stanley,
A.M.,
485
Stefanelli, G.J.,
123
Stora,
M.J.,
351
Stratton, LA,
465
Thomsen, C,
153
Tirey, E.,
559
Trush, V.,
45
Tulpule, S.,
535
Turino,
J.,
345
Tyrpak, C.J.,
405
Vining, S.,
261
Volentine, R.J.,
417
Walsh, J.D.,
493
Walter, M.B.,
517
Walters, M.D.,
167
Weiner, M.t
Williams, W.L., 231
Wood, C, 315
Wood, J.B.,
51
Wright, R.G.,
71
Wyburn, J.t
Yeager, J., 577
Ziegler, J., 247
tManuscript
not available at time of publication.
XXI!
|
| any_adam_object | 1 |
| building | Verbundindex |
| bvnumber | BV006149830 |
| classification_tum | ELT 238f |
| ctrlnum | (OCoLC)631391240 (DE-599)BVBBV006149830 |
| discipline | Elektrotechnik |
| format | Conference Proceeding Book |
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| genre | (DE-588)1071861417 Konferenzschrift 1990 San Antonio Tex. gnd-content |
| genre_facet | Konferenzschrift 1990 San Antonio Tex. |
| id | DE-604.BV006149830 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T16:41:07Z |
| institution | BVB |
| institution_GND | (DE-588)5049493-4 |
| language | Undetermined |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-003888815 |
| oclc_num | 631391240 |
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| owner | DE-91 DE-BY-TUM DE-83 |
| owner_facet | DE-91 DE-BY-TUM DE-83 |
| physical | XXII, 594 S. Ill., graph. Darst. |
| publishDate | 1990 |
| publishDateSearch | 1990 |
| publishDateSort | 1990 |
| publisher | Inst. of Electrical and Electronics Engineers |
| record_format | marc |
| spelling | Advancing mission accomplishment conference record Autotestcon 90, September 17 - 20, 1990 ; San Antonio Convention Center, San Antonio, Texas New York, NY Inst. of Electrical and Electronics Engineers 1990 XXII, 594 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Literaturangaben Automatisches Prüfen (DE-588)4269925-3 gnd rswk-swf (DE-588)1071861417 Konferenzschrift 1990 San Antonio Tex. gnd-content Automatisches Prüfen (DE-588)4269925-3 s DE-604 Autotestcon 1990 San Antonio, Tex. Sonstige (DE-588)5049493-4 oth Digitalisierung TU Muenchen application/pdf http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=003888815&sequence=000002&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA Inhaltsverzeichnis |
| spellingShingle | Advancing mission accomplishment conference record Autotestcon 90, September 17 - 20, 1990 ; San Antonio Convention Center, San Antonio, Texas Automatisches Prüfen (DE-588)4269925-3 gnd |
| subject_GND | (DE-588)4269925-3 (DE-588)1071861417 |
| title | Advancing mission accomplishment conference record Autotestcon 90, September 17 - 20, 1990 ; San Antonio Convention Center, San Antonio, Texas |
| title_auth | Advancing mission accomplishment conference record Autotestcon 90, September 17 - 20, 1990 ; San Antonio Convention Center, San Antonio, Texas |
| title_exact_search | Advancing mission accomplishment conference record Autotestcon 90, September 17 - 20, 1990 ; San Antonio Convention Center, San Antonio, Texas |
| title_full | Advancing mission accomplishment conference record Autotestcon 90, September 17 - 20, 1990 ; San Antonio Convention Center, San Antonio, Texas |
| title_fullStr | Advancing mission accomplishment conference record Autotestcon 90, September 17 - 20, 1990 ; San Antonio Convention Center, San Antonio, Texas |
| title_full_unstemmed | Advancing mission accomplishment conference record Autotestcon 90, September 17 - 20, 1990 ; San Antonio Convention Center, San Antonio, Texas |
| title_short | Advancing mission accomplishment |
| title_sort | advancing mission accomplishment conference record autotestcon 90 september 17 20 1990 san antonio convention center san antonio texas |
| title_sub | conference record Autotestcon 90, September 17 - 20, 1990 ; San Antonio Convention Center, San Antonio, Texas |
| topic | Automatisches Prüfen (DE-588)4269925-3 gnd |
| topic_facet | Automatisches Prüfen Konferenzschrift 1990 San Antonio Tex. |
| url | http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=003888815&sequence=000002&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA |
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