Advanced light microscopy: 2 Specialized methods
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Buch |
| Sprache: | English |
| Veröffentlicht: |
Amsterdam u.a.
Elsevier u.a.
1989
|
| Online-Zugang: | Inhaltsverzeichnis |
| Beschreibung: | XIII, 494 S. Ill., graph. Darst. |
| ISBN: | 0444989188 |
Internformat
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| 245 | 1 | 0 | |a Advanced light microscopy |n 2 |p Specialized methods |c Maksymilian Pluta |
| 264 | 1 | |a Amsterdam u.a. |b Elsevier u.a. |c 1989 | |
| 300 | |a XIII, 494 S. |b Ill., graph. Darst. | ||
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Datensatz im Suchindex
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| adam_text | IMAGE 1
ADVANCED
LIGHT MICROSCOPY VOLUME 2 SPECIALIZED METHODS
MAKSYMILIAN PLUTA PROFESSOR OF APPLIED OPTICS HEAD OF THE PHYSICAL
OPTICS DEPARTMENT CENTRAL OPTICAL LABORATORY, WARSZAWA
ELSEVIER AMSTERDAM-OXFORD-NEW YORK-TOKYO PWN-POLISH SCIENTIFIC
PUBLISHERS WARSZAWA
1989
IMAGE 2
CONTENTS
INTRODUCTION, XI CHAPTER 5. PHASE CONTRAST MICROSCOPY, 1 5.1. GENERAL
PRINCIPLES, 1 5.2. TYPICAL PHASE CONTRAST SYSTEMS, 11
5.3. IMAGING PROPERTIES, 15 5.3.1. HALO, SHADING-OFF, AND IMAGE
FIDELITY, 15 5.3.2. RESOLUTION, 20 5.3.3. SENSITIVITY, 22 5.3.4.
INFLUENCE OF STRAY LIGHT, 25 5.4. NOMENCLATURE, 28
5.5. HIGHLY SENSITIVE PHASE CONTRAST DEVICES, 30 5.5.1. OPTICAL
PROPERTIES OF SOOT LAYERS, 30 5.5.2. HIGHLY SENSITIVE NEGATIVE PHASE
CONTRAST DEVICE (KFA), 32 5.5.3. HIGHLY SENSITIVE POSITIVE PHASE
CONTRAST DEVICE (KFS), 36
5.6. ALTERNATING PHASE CONTRAST SYSTEMS, 38 5.6.1. BEYER S PHASE
CONTRAST DEVICE, 39 V
5.6.2. DEVICE WITH BOTH POSITIVE AND NEGATIVE PHASE RINGS (KFZ), 42
5.7. PHASE CONTRAST SYSTEMS WITH CONTINUOUSLY VARIABLE IMAGE CONTRAST,
45 5.7.1. THE POLANRET SYSTEM, 46 5.7.2. NOMARSKI S VARIABLE ACHROMATIC
PHASE CONTRAST SYSTEM, 50 5.7.3. NIKON INTERFERENCE-PHASE CONTRAST
DEVICE, 52 5.7.4. VARIABLE PHASE CONTRAST DEVICE WITH A SINGLE
POLARIZING PHASE
RING, 54
5.8. PHASE CONTRAST MICROSCOPY BY USING INTERFERENCE SYSTEMS, 56 5.8.1.
INTERPHAKO, 57
5.8.2. VARIABLE PHASE CONTRAST MICROSCOPY BASED ON THE MICHELSON INTER
FEROMETER, 61
5.9. STEREOSCOPIC PHASE CONTRAST MICROSCOPE, 66 5.9.1. UNDERLYING
PRINCIPLES AND MODE OF OPERATION, 67
IMAGE 3
VI
CONTENTS
5.9.2. LATERAL RESOLUTION, 70 5.9.3. STEREOSCOPIC AXIAL RESOLUTION, 73
5.10. PHASE CONTRAST FOR INCIDENT LIGHT, 74 5.10.1. SYSTEM WITH PHASE
PLATE IMMEDIATELY BEHIND THE BEAM-SPLIT
TER, 74
5.10.2. INCIDENT-LIGHT PHASE CONTRAST MICROSCOPE WITH INTERNAL
PROJECTION SYSTEM, 76
5.10.3. SYSTEM WITH PHASE PLATE IN OBJECTIVES, 77 5.11. HOW AND WHERE TO
USE THE PHASE CONTRAST MICROSCOPE, 78 5.11.1. ADJUSTMENT OF PHASE
CONTRAST MICROSCOPES, 79 5.11.2. GENERAL REMARKS ON SPECIMENS FOR PHASE
CONTRAST MICRO
SCOPY, 81
5.11.3. PHASE CONTRAST MICROREFRACTOMETRY, 85 5.11.4. FIELDS OF
APPLICATION OF PHASE CONTRAST MICROSCOPY, 88
CHAPTER 6. AMPLITUDE CONTRAST, DARK-FIELD, OPTICAL STAINING, MODULATION
CON TRAST, AND OTHER RELATED TECHNIQUES, 91 6.1. AMPLITUDE CONTRAST
TECHNIQUE, 91 6.1.1. THEORETICAL CONSIDERATIONS, 91
6.1.2. PRACTICAL IMPLEMENTATION AND PROPERTIES, 96 6.2. OBLIQUE
ILLUMINATION, DARK-FIELD MICROSCOPY, AND RELATED TECHNIQUES, 100 6.2.1.
OBLIQUE ILLUMINATION, 101 6.2.2. OBLIQUE DARK-FIELD ILLUMINATION, 102
6.2.3. DARK-FIELD MICROSCOPY WITH DETUNED INTERFERENCE FILTERS, 108
6.2.4. CENTRAL DARK-FIELD MICROSCOPY, 110 6.2.5. MICROSTRIOSCOPY, 111
6.2.6. ULTRAMICROSCOPY, 112 6.3. OPTICAL STAINING, 113
6.3.1. RHEINBERG ILLUMINATION, 113 6.3.2. DOUBLE ILLUMINATION, 115
6.3.3. DISPERSION STAINING, 117 6.3.4. OTHER OPTICALLY STAINED IMAGES,
132 6.4. MODULATION CONTRAST MICROSCOPY, 134
6.4.1. THEORETICAL PRINCIPLES, 134 6.4.2. PRACTICAL IMPLEMENTATION, 138
6.4.3. PROPERTIES AND APPLICATIONS, 141
6.5. MONOOBJECTIVE STEREOSCOPIC MICROSCOPY, 142
IMAGE 4
CONTENTS
VII
CHAPTER 7. DIFFERENTIAL INTERFERENCE CONTRAST, 146
7.1. BACKGROUND AND PRINCIPLES OF DIC MICROSCOPY, 146 7.1.1. ON THE
TYPICAL USE OF THE MACH-ZEHNDER INTERFEROMETER, 148 7.1.2. MACH-ZEHNDER
INTERFERENCE SYSTEM USED AS A WAVEFRONT SHEAR INTER FEROMETER, 151
7.1.3. DIC MICROSCOPY AS A METHOD FOR DISPLAYING OPTICAL GRADIENTS, 153
7.1.4. DIC MICROSCOPY BASED ON THE DOUBLE REFRACTING INTERFERENCE
SYSTEM, 156 7.2. NOMARSKI DIC MICROSCOPY, 165
7.2.1. NOMARSKI DIC SYSTEM FOR TRANSMITTED LIGHT, 165 7.2.2. AMPLITUDE
DIC MICROSCOPY, 174 7.2.3. THE IMAGE OF A LIGHT POINT IN THE NOMARSKI
DIC MICROSCOPY, 175 7.2.4. NOMARSKI DIC SYSTEM FOR REFLECTED LIGHT, 177
7.3. VIDEO-ENHANCED DIC MICROSCOPY, 181
7.4. DIFFERENTIAL INTERFERENCE CONTRAST MICROSCOPY WITH CONTINUOUSLY
VARIABLE WAVEFRONT SHEAR, 183 7.4.1. TRANSMITTED-LIGHT VADIC SYSTEM WITH
PUPILAR COMPENSATION, 183 7.4.2. TRANSILLUMINATION VADIC SYSTEM WITH
CONDENSER SLIT DIA
PHRAGM, 189 7.4.3. VADIC SYSTEM FOR REFLECTED LIGHT, 192 7.5. A DIC
MICROSCOPE FOR TESTING CROSS-SECTIONS OF OPTICAL FIBRES, 196
CHAPTER 8. REFLECTION CONTRAST MICROSCOPY, 198 8.1. OPTICAL PRINCIPLES
OF RC MICROSCOPY, 198 8.1.1. LIGHT REFLECTION AND INTERFERENCE IN RC
IMAGE FORMATION, 198 8.1.2. DISCRIMINATION BETWEEN PURE REFLECTION AND
INTERFERENCE, 202
8.1.3. EVALUATION OF THE RC IMAGE BY MEASUREMENT OF REFLECTIVITY, 203
8.2. INSTRUMENTATION OF RC MICROSCOPY, 204 8.2.1. LEITZ-PLOEM RC
MICROSCOPY, 204 8.2.2. OTHER SYSTEMS FOR RC MICROSCOPY, 207
8.3. APPLICATIONS OF RC MICROSCOPY, 208
CHAPTER 9. FLUORESCENCE MICROSCOPY, 211 9.1. GENERAL PRINCIPLES AND
TYPES OF FLUORESCENCE MICROSCOPY, 212 9.2. IMMUNOFLUORESCENCE
MICROSCOPY, 216 9.3. INSTRUMENTATION OF FLUORESCENCE MICROSCOPY, 222
9.3.1. LIGHT SOURCES FOR FLUORESCENCE EXCITATION, 222
IMAGE 5
VIII
CONTENTS
9.3.2. EXCITER AND BARRIER FILTERS, 228 9.3.3. DICHROIC MIRRORS, 238
9.3.4. OBJECTIVES AND CONDENSERS FOR FLUORESCENCE MICROSCOPY, 240 9.3.5.
PLOEMOPAK EPI-ILLUMINATOR, 242 9.3.6. OTHER DEVICES AND FACILITIES, 246
9.4. FLUORESCENCE COMBINED WITH OTHER MICROSCOPICAL TECHNIQUES, 248 9.5.
LASER FLUORESCENCE MICROSCOPY, 252 9.6. TOTAL INTERNAL REFLECTION
FLUORESCENCE MICROSCOPY, 256 9.7. SURGICAL FLUORESCENCE MICROSCOPY, 257
9.8. FIELDS OF APPLICATION OF FLUORESCENCE MICROSCOPY, 262
9.8.1. APPLICATION IN BIOLOGY AND MEDICINE, 262 9.8.2. APPLICATION IN
MATERIALS SCIENCES, 263
CHAPTER 10. ULTRAVIOLET AND INFRARED MICROSCOPY, 264 10.1. OBSERVATION
OF UV AND IR IMAGES, 264 10.2. UV MICROSCOPY AND ITS APPLICATIONS, 268
10.3. IR MICROSCOPY AND ITS APPLICATIONS, 272 10.4. THERMAL MICROSCOPY,
278
CHAPTER 11. HOLOGRAPHIC MICROSCOPY, 282 11.1. A BIRD S EYE VIEW OF THE
HISTORY OF HOLOGRAPHIC MICROSCOPY, 283 11.2. PRINCIPLES OF HOLOGRAPHIC
MICROSCOPY, 285 11.2.1. RECORDING OF TYPICAL HOLOGRAMS OF TRANSPARENT
OBJECTS, 286
11.2.2. HOLOGRAPHIC IMAGE RECONSTRUCTION, 289 11.2.3. HOLOGRAPHY OF
LIGHT-REFLECTING OBJECTS, 292 11.2.4. CLASSIFICATION OF HOLOGRAMS, 295
11.3. HOLOGRAPHIC MICROSCOPY WITHOUT OBJECTIVE LENSES, 296
11.3.1. IN-LINE MICROHOLOGRAPHIC SYSTEM, 296 11.3.2. OFF-AXIS
MICROHOLOGRAPHIC SYSTEM, 300 11.3.3. OTHER LENSLESS HOLOGRAPHIC SYSTEMS
FOR MICROSCOPY, 301 11.4. HOLOGRAPHIC MICROSCOPY COMBINED WITH OBJECTIVE
LENSES, 302
11.4.1. MICROHOLOGRAPHIC SYSTEMS WITH PREMAGNIFICATION AND DIRECT
WAVEFRONT RECONSTRUCTION, 302 11.4.2. HOLOGRAPHIC MICROSCOPY WITH
PREMAGNIFICATION AND REVERSED WAVEFRONT RECONSTRUCTION, 308
11.4.3. OTHER LENS-ASSISTED HOLOGRAPHIC SYSTEMS FOR MICROSCOPY, 311
11.5. PROBLEMS OF COHERENT NOISE ELIMINATION FROM HOLOGRAPHIC MICRO
SCOPY, 312
IMAGE 6
CONTENTS IX
11.5.1. COHERENT NOISE AND SPECKLE PATTERNS, 312 11.5.2. TECHNIQUES FOR
COHERENT NOISE REDUCTION, 314 11.5.3. HOLOGRAPHIC MICROSCOPY WITH
UNIDIRECTIONAL SUPPRESSION OF CO HERENT NOISE, 317 11.6. HOLOGRAPHIC
INTERFERENCE MICROSCOPY, 325
11.6.1. ADVANTAGES OF HOLOGRAPHIC INTERFERENCE MICROSCOPY, 326 11.6.2.
REAL-TIME HOLOGRAPHIC INTERFERENCE METHODS, 329 11.6.3. DOUBLE-EXPOSURE
HOLOGRAPHIC INTERFERENCE MICROSCOPY, 332 11.6.4. IT IS POSSIBLE TO
ACCEPT HOLOGRAPHIC INTERFERENCE MICROSCOPY WITH
OUT COHERENT NOISE REDUCTION? 335 11.7. HOLOGRAPHIC PHASE CONTRAST
MICROSCOPY, 336 11.8. APPLICATIONS OF HOLOGRAPHIC MICROSCOPY, 337
11.8.1. EXAMPLES OF BIOLOGICAL APPLICATIONS, 338
11.8.2. APPLICATIONS IN MATERIALS SCIENCES, 339 11.8.3. HOLOGRAPHIC
IMAGING AND ANALYSIS OF THREE-DIMENSIONAL DISTRIBU TION OF PARTICLES,
340
CHAPTER 12. LASER PROJECTION, SCANNING, AND OTHER NEW MICROSCOPE SYS
TEMS, 353 12.1. LASER PROJECTION MICROSCOPE WITH BRIGHTNESS AMPLIFIER,
353 12.2. SCANNING OPTICAL MICROSCOPY, 355
12.2.1. CONFOCAL SCANNING MICROSCOPY, 356 12.2.2. LASER-SCAN MICROSCOPE
DEVELOPED BY * ZEISS OBERKOCHEN, 363 12.2.3. TANDEM SCANNING
REFLECTED-LIGHT MICROSCOPE, 365 12.2.4. OTHER SCANNING LIGHT
MICROSCOPES, 368 12.3. NONLINEAR MICROSCOPY WITH SECOND HARMONIC
GENERATION, 371 12.4. RAMAN MICROSCOPY, 373 12.5. OPTOACOUSTIC AND
PHOTOTHERMAL MICROSCOPY, 375 EPILOGUE TO VOLUME 2, 380
REFERENCES, 384 INDEX OF NAMES, 421 SUBJECT INDEX, 424 PLATES, 447
|
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| isbn | 0444989188 |
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| spelling | Pluta, Maksymilian Verfasser aut Advanced light microscopy 2 Specialized methods Maksymilian Pluta Amsterdam u.a. Elsevier u.a. 1989 XIII, 494 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier (DE-604)BV006113562 2 GBV Datenaustausch application/pdf http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=003862178&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA Inhaltsverzeichnis |
| spellingShingle | Pluta, Maksymilian Advanced light microscopy |
| title | Advanced light microscopy |
| title_auth | Advanced light microscopy |
| title_exact_search | Advanced light microscopy |
| title_full | Advanced light microscopy 2 Specialized methods Maksymilian Pluta |
| title_fullStr | Advanced light microscopy 2 Specialized methods Maksymilian Pluta |
| title_full_unstemmed | Advanced light microscopy 2 Specialized methods Maksymilian Pluta |
| title_short | Advanced light microscopy |
| title_sort | advanced light microscopy specialized methods |
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