Secondary ion mass spectrometry: SIMS II. Proceedings of the 2nd Internat. Conference on Secondary Ion Mass Spectrometry (SIMS II) Stanford Univ., Stanford, Calif., USA, Aug. 27-31, 1979
Gespeichert in:
| Format: | Tagungsbericht Buch |
|---|---|
| Sprache: | Undetermined |
| Veröffentlicht: |
Berlin
Springer
1979
|
| Schriftenreihe: | Springer series in chemical physics. 9.
|
| Schlagworte: | |
| Beschreibung: | XIII, 298 S. zahlr. graph. Darst. |
| ISBN: | 3540098437 |
Internformat
MARC
| LEADER | 00000nam a2200000 cb4500 | ||
|---|---|---|---|
| 001 | BV006101349 | ||
| 003 | DE-604 | ||
| 005 | 00000000000000.0 | ||
| 007 | t | ||
| 008 | 921030s1979 d||| |||| 10||| und d | ||
| 020 | |a 3540098437 |9 3-540-09843-7 | ||
| 035 | |a (OCoLC)630834521 | ||
| 035 | |a (DE-599)BVBBV006101349 | ||
| 040 | |a DE-604 |b ger |e rakddb | ||
| 041 | |a und | ||
| 049 | |a DE-703 | ||
| 084 | |a UM 2110 |0 (DE-625)145843: |2 rvk | ||
| 245 | 1 | 0 | |a Secondary ion mass spectrometry |b SIMS II. Proceedings of the 2nd Internat. Conference on Secondary Ion Mass Spectrometry (SIMS II) Stanford Univ., Stanford, Calif., USA, Aug. 27-31, 1979 |c Urheber: SIMS <2, 1979, Stanford, Calif.>* |
| 264 | 1 | |a Berlin |b Springer |c 1979 | |
| 300 | |a XIII, 298 S. |b zahlr. graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 490 | 0 | |a Springer series in chemical physics. 9. | |
| 650 | 0 | 7 | |a Sekundärionen-Massenspektrometrie |0 (DE-588)4077346-2 |2 gnd |9 rswk-swf |
| 655 | 7 | |0 (DE-588)1071861417 |a Konferenzschrift |y 1979 |z Stanford Calif. |2 gnd-content | |
| 689 | 0 | 0 | |a Sekundärionen-Massenspektrometrie |0 (DE-588)4077346-2 |D s |
| 689 | 0 | |5 DE-604 | |
| 711 | 2 | |a SIMS |n 2 |d 1979 |c Stanford, Calif. |j Sonstige |0 (DE-588)2061206-0 |4 oth | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-003853825 | ||
Datensatz im Suchindex
| _version_ | 1804120325816844288 |
|---|---|
| any_adam_object | |
| building | Verbundindex |
| bvnumber | BV006101349 |
| classification_rvk | UM 2110 |
| ctrlnum | (OCoLC)630834521 (DE-599)BVBBV006101349 |
| discipline | Physik |
| format | Conference Proceeding Book |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01293nam a2200325 cb4500</leader><controlfield tag="001">BV006101349</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">00000000000000.0</controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">921030s1979 d||| |||| 10||| und d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">3540098437</subfield><subfield code="9">3-540-09843-7</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)630834521</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV006101349</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rakddb</subfield></datafield><datafield tag="041" ind1=" " ind2=" "><subfield code="a">und</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-703</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">UM 2110</subfield><subfield code="0">(DE-625)145843:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Secondary ion mass spectrometry</subfield><subfield code="b">SIMS II. Proceedings of the 2nd Internat. Conference on Secondary Ion Mass Spectrometry (SIMS II) Stanford Univ., Stanford, Calif., USA, Aug. 27-31, 1979</subfield><subfield code="c">Urheber: SIMS <2, 1979, Stanford, Calif.>*</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Berlin</subfield><subfield code="b">Springer</subfield><subfield code="c">1979</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">XIII, 298 S.</subfield><subfield code="b">zahlr. graph. Darst.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="0" ind2=" "><subfield code="a">Springer series in chemical physics. 9.</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Sekundärionen-Massenspektrometrie</subfield><subfield code="0">(DE-588)4077346-2</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="655" ind1=" " ind2="7"><subfield code="0">(DE-588)1071861417</subfield><subfield code="a">Konferenzschrift</subfield><subfield code="y">1979</subfield><subfield code="z">Stanford Calif.</subfield><subfield code="2">gnd-content</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Sekundärionen-Massenspektrometrie</subfield><subfield code="0">(DE-588)4077346-2</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="711" ind1="2" ind2=" "><subfield code="a">SIMS</subfield><subfield code="n">2</subfield><subfield code="d">1979</subfield><subfield code="c">Stanford, Calif.</subfield><subfield code="j">Sonstige</subfield><subfield code="0">(DE-588)2061206-0</subfield><subfield code="4">oth</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-003853825</subfield></datafield></record></collection> |
| genre | (DE-588)1071861417 Konferenzschrift 1979 Stanford Calif. gnd-content |
| genre_facet | Konferenzschrift 1979 Stanford Calif. |
| id | DE-604.BV006101349 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T16:40:18Z |
| institution | BVB |
| institution_GND | (DE-588)2061206-0 |
| isbn | 3540098437 |
| language | Undetermined |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-003853825 |
| oclc_num | 630834521 |
| open_access_boolean | |
| owner | DE-703 |
| owner_facet | DE-703 |
| physical | XIII, 298 S. zahlr. graph. Darst. |
| publishDate | 1979 |
| publishDateSearch | 1979 |
| publishDateSort | 1979 |
| publisher | Springer |
| record_format | marc |
| series2 | Springer series in chemical physics. 9. |
| spelling | Secondary ion mass spectrometry SIMS II. Proceedings of the 2nd Internat. Conference on Secondary Ion Mass Spectrometry (SIMS II) Stanford Univ., Stanford, Calif., USA, Aug. 27-31, 1979 Urheber: SIMS <2, 1979, Stanford, Calif.>* Berlin Springer 1979 XIII, 298 S. zahlr. graph. Darst. txt rdacontent n rdamedia nc rdacarrier Springer series in chemical physics. 9. Sekundärionen-Massenspektrometrie (DE-588)4077346-2 gnd rswk-swf (DE-588)1071861417 Konferenzschrift 1979 Stanford Calif. gnd-content Sekundärionen-Massenspektrometrie (DE-588)4077346-2 s DE-604 SIMS 2 1979 Stanford, Calif. Sonstige (DE-588)2061206-0 oth |
| spellingShingle | Secondary ion mass spectrometry SIMS II. Proceedings of the 2nd Internat. Conference on Secondary Ion Mass Spectrometry (SIMS II) Stanford Univ., Stanford, Calif., USA, Aug. 27-31, 1979 Sekundärionen-Massenspektrometrie (DE-588)4077346-2 gnd |
| subject_GND | (DE-588)4077346-2 (DE-588)1071861417 |
| title | Secondary ion mass spectrometry SIMS II. Proceedings of the 2nd Internat. Conference on Secondary Ion Mass Spectrometry (SIMS II) Stanford Univ., Stanford, Calif., USA, Aug. 27-31, 1979 |
| title_auth | Secondary ion mass spectrometry SIMS II. Proceedings of the 2nd Internat. Conference on Secondary Ion Mass Spectrometry (SIMS II) Stanford Univ., Stanford, Calif., USA, Aug. 27-31, 1979 |
| title_exact_search | Secondary ion mass spectrometry SIMS II. Proceedings of the 2nd Internat. Conference on Secondary Ion Mass Spectrometry (SIMS II) Stanford Univ., Stanford, Calif., USA, Aug. 27-31, 1979 |
| title_full | Secondary ion mass spectrometry SIMS II. Proceedings of the 2nd Internat. Conference on Secondary Ion Mass Spectrometry (SIMS II) Stanford Univ., Stanford, Calif., USA, Aug. 27-31, 1979 Urheber: SIMS <2, 1979, Stanford, Calif.>* |
| title_fullStr | Secondary ion mass spectrometry SIMS II. Proceedings of the 2nd Internat. Conference on Secondary Ion Mass Spectrometry (SIMS II) Stanford Univ., Stanford, Calif., USA, Aug. 27-31, 1979 Urheber: SIMS <2, 1979, Stanford, Calif.>* |
| title_full_unstemmed | Secondary ion mass spectrometry SIMS II. Proceedings of the 2nd Internat. Conference on Secondary Ion Mass Spectrometry (SIMS II) Stanford Univ., Stanford, Calif., USA, Aug. 27-31, 1979 Urheber: SIMS <2, 1979, Stanford, Calif.>* |
| title_short | Secondary ion mass spectrometry |
| title_sort | secondary ion mass spectrometry sims ii proceedings of the 2nd internat conference on secondary ion mass spectrometry sims ii stanford univ stanford calif usa aug 27 31 1979 |
| title_sub | SIMS II. Proceedings of the 2nd Internat. Conference on Secondary Ion Mass Spectrometry (SIMS II) Stanford Univ., Stanford, Calif., USA, Aug. 27-31, 1979 |
| topic | Sekundärionen-Massenspektrometrie (DE-588)4077346-2 gnd |
| topic_facet | Sekundärionen-Massenspektrometrie Konferenzschrift 1979 Stanford Calif. |
| work_keys_str_mv | AT simsstanfordcalif secondaryionmassspectrometrysimsiiproceedingsofthe2ndinternatconferenceonsecondaryionmassspectrometrysimsiistanfordunivstanfordcalifusaaug27311979 |