(1979). Secondary ion mass spectrometry: SIMS II. Proceedings of the 2nd Internat. Conference on Secondary Ion Mass Spectrometry (SIMS II) Stanford Univ., Stanford, Calif., USA, Aug. 27-31, 1979. Springer.
Chicago Style (17th ed.) CitationSecondary Ion Mass Spectrometry: SIMS II. Proceedings of the 2nd Internat. Conference on Secondary Ion Mass Spectrometry (SIMS II) Stanford Univ., Stanford, Calif., USA, Aug. 27-31, 1979. Berlin: Springer, 1979.
MLA (9th ed.) CitationSecondary Ion Mass Spectrometry: SIMS II. Proceedings of the 2nd Internat. Conference on Secondary Ion Mass Spectrometry (SIMS II) Stanford Univ., Stanford, Calif., USA, Aug. 27-31, 1979. Springer, 1979.
Warning: These citations may not always be 100% accurate.