Characterization of crystal growth defects by X-Ray methods: [proceedings of the NATO Advanced Study Institute on Characterization of Crystal Growth Defects by X-ray Models, held August 29 - September 10, 1979, at Durham University, Durham, United Kingdom]
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Bibliographic Details
Other Authors: Tanner, Brian K. 1947- (Editor)
Format: Conference Proceeding Book
Language:English
Published: New York [u.a.] Plenum Press 1980
Series:NATO: Nato advanced study institutes series / B 63
Subjects:
Online Access:Inhaltsverzeichnis
Physical Description:XXVI, 589 S. zahlr. Ill., graph. Darst.
ISBN:0306406284

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