Tanner, B. K. (1980). Characterization of crystal growth defects by X-Ray methods: [proceedings of the NATO Advanced Study Institute on Characterization of Crystal Growth Defects by X-ray Models, held August 29 - September 10, 1979, at Durham University, Durham, United Kingdom]. Plenum Press.
Chicago-Zitierstil (17. Ausg.)Tanner, Brian K. Characterization of Crystal Growth Defects by X-Ray Methods: [proceedings of the NATO Advanced Study Institute on Characterization of Crystal Growth Defects by X-ray Models, Held August 29 - September 10, 1979, at Durham University, Durham, United Kingdom]. New York [u.a.]: Plenum Press, 1980.
MLA-Zitierstil (9. Ausg.)Tanner, Brian K. Characterization of Crystal Growth Defects by X-Ray Methods: [proceedings of the NATO Advanced Study Institute on Characterization of Crystal Growth Defects by X-ray Models, Held August 29 - September 10, 1979, at Durham University, Durham, United Kingdom]. Plenum Press, 1980.