Accuracy in trace analysis: Sampling, sample handling, analysis ; Proceedings of the 7th Materials Research Symposium. Held at the National Bureau of Standards, Gaithersburg, Md., October 7-11, 1974
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Bibliographic Details
Other Authors: LaFleur, Philip D. (Editor)
Format: Book
Language:English
Published: Washington U.S .Gov. Print. Off.
Series:NBS special publications ...
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