LaFleur, P. D. Accuracy in trace analysis: Sampling, sample handling, analysis ; Proceedings of the 7th Materials Research Symposium. Held at the National Bureau of Standards, Gaithersburg, Md., October 7-11, 1974. U.S .Gov. Print. Off.
Chicago-Zitierstil (17. Ausg.)LaFleur, Philip D. Accuracy in Trace Analysis: Sampling, Sample Handling, Analysis ; Proceedings of the 7th Materials Research Symposium. Held at the National Bureau of Standards, Gaithersburg, Md., October 7-11, 1974. Washington: U.S .Gov. Print. Off.
MLA-Zitierstil (9. Ausg.)LaFleur, Philip D. Accuracy in Trace Analysis: Sampling, Sample Handling, Analysis ; Proceedings of the 7th Materials Research Symposium. Held at the National Bureau of Standards, Gaithersburg, Md., October 7-11, 1974. U.S .Gov. Print. Off.