Electron microscopy in the study of materials:
Saved in:
| Main Authors: | , |
|---|---|
| Format: | Book |
| Language: | English |
| Published: |
London
Arnold
1976
|
| Series: | The structures and properties of solids.
7. |
| Subjects: | |
| Physical Description: | 174 S.: Ill., graph.Darst., Tab. |
Staff View
MARC
| LEADER | 00000nam a2200000 cb4500 | ||
|---|---|---|---|
| 001 | BV005762543 | ||
| 003 | DE-604 | ||
| 005 | 00000000000000.0 | ||
| 007 | t | ||
| 008 | 921030s1976 |||| 00||| eng d | ||
| 035 | |a (OCoLC)3043860 | ||
| 035 | |a (DE-599)BVBBV005762543 | ||
| 040 | |a DE-604 |b ger |e rakddb | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-703 | ||
| 050 | 0 | |a TA407 | |
| 082 | 0 | |a 530.4/1 |2 18 | |
| 084 | |a UH 6300 |0 (DE-625)159498: |2 rvk | ||
| 100 | 1 | |a Grundy, Philip J. |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a Electron microscopy in the study of materials |c Philip J. Grundy ; Grenville A. Jones* |
| 264 | 1 | |a London |b Arnold |c 1976 | |
| 300 | |a 174 S.: Ill., graph.Darst., Tab. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 490 | 1 | |a The structures and properties of solids. |v 7. | |
| 650 | 7 | |a Elektronenmicroscopie |2 gtt | |
| 650 | 7 | |a Materiaalkunde |2 gtt | |
| 650 | 4 | |a Matériaux | |
| 650 | 4 | |a Microscopie électronique | |
| 650 | 7 | |a Vastestoffysica |2 gtt | |
| 650 | 4 | |a Electron microscopy | |
| 650 | 4 | |a Materials | |
| 650 | 0 | 7 | |a Werkstoffkunde |0 (DE-588)4079184-1 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Elektronenmikroskopie |0 (DE-588)4014327-2 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Werkstoffprüfung |0 (DE-588)4037934-6 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Kristallstruktur |0 (DE-588)4136176-3 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Elektronenmikroskop |0 (DE-588)4014326-0 |2 gnd |9 rswk-swf |
| 689 | 0 | 0 | |a Elektronenmikroskopie |0 (DE-588)4014327-2 |D s |
| 689 | 0 | 1 | |a Werkstoffprüfung |0 (DE-588)4037934-6 |D s |
| 689 | 0 | |5 DE-604 | |
| 689 | 1 | 0 | |a Elektronenmikroskopie |0 (DE-588)4014327-2 |D s |
| 689 | 1 | 1 | |a Werkstoffkunde |0 (DE-588)4079184-1 |D s |
| 689 | 1 | |8 1\p |5 DE-604 | |
| 689 | 2 | 0 | |a Kristallstruktur |0 (DE-588)4136176-3 |D s |
| 689 | 2 | |8 2\p |5 DE-604 | |
| 689 | 3 | 0 | |a Elektronenmikroskop |0 (DE-588)4014326-0 |D s |
| 689 | 3 | |8 3\p |5 DE-604 | |
| 700 | 1 | |a Jones, Grenville A. |e Verfasser |4 aut | |
| 830 | 0 | |a The structures and properties of solids. |v 7. |w (DE-604)BV001890114 |9 7 | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-003599249 | ||
| 883 | 1 | |8 1\p |a cgwrk |d 20201028 |q DE-101 |u https://d-nb.info/provenance/plan#cgwrk | |
| 883 | 1 | |8 2\p |a cgwrk |d 20201028 |q DE-101 |u https://d-nb.info/provenance/plan#cgwrk | |
| 883 | 1 | |8 3\p |a cgwrk |d 20201028 |q DE-101 |u https://d-nb.info/provenance/plan#cgwrk | |
Record in the Search Index
| _version_ | 1804119945813950464 |
|---|---|
| any_adam_object | |
| author | Grundy, Philip J. Jones, Grenville A. |
| author_facet | Grundy, Philip J. Jones, Grenville A. |
| author_role | aut aut |
| author_sort | Grundy, Philip J. |
| author_variant | p j g pj pjg g a j ga gaj |
| building | Verbundindex |
| bvnumber | BV005762543 |
| callnumber-first | T - Technology |
| callnumber-label | TA407 |
| callnumber-raw | TA407 |
| callnumber-search | TA407 |
| callnumber-sort | TA 3407 |
| callnumber-subject | TA - General and Civil Engineering |
| classification_rvk | UH 6300 |
| ctrlnum | (OCoLC)3043860 (DE-599)BVBBV005762543 |
| dewey-full | 530.4/1 |
| dewey-hundreds | 500 - Natural sciences and mathematics |
| dewey-ones | 530 - Physics |
| dewey-raw | 530.4/1 |
| dewey-search | 530.4/1 |
| dewey-sort | 3530.4 11 |
| dewey-tens | 530 - Physics |
| discipline | Physik |
| format | Book |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>02294nam a2200613 cb4500</leader><controlfield tag="001">BV005762543</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">00000000000000.0</controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">921030s1976 |||| 00||| eng d</controlfield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)3043860</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV005762543</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rakddb</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-703</subfield></datafield><datafield tag="050" ind1=" " ind2="0"><subfield code="a">TA407</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">530.4/1</subfield><subfield code="2">18</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">UH 6300</subfield><subfield code="0">(DE-625)159498:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Grundy, Philip J.</subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Electron microscopy in the study of materials</subfield><subfield code="c">Philip J. Grundy ; Grenville A. Jones*</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">London</subfield><subfield code="b">Arnold</subfield><subfield code="c">1976</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">174 S.: Ill., graph.Darst., Tab.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="1" ind2=" "><subfield code="a">The structures and properties of solids.</subfield><subfield code="v">7.</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Elektronenmicroscopie</subfield><subfield code="2">gtt</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Materiaalkunde</subfield><subfield code="2">gtt</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Matériaux</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Microscopie électronique</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Vastestoffysica</subfield><subfield code="2">gtt</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electron microscopy</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Materials</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Werkstoffkunde</subfield><subfield code="0">(DE-588)4079184-1</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Elektronenmikroskopie</subfield><subfield code="0">(DE-588)4014327-2</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Werkstoffprüfung</subfield><subfield code="0">(DE-588)4037934-6</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Kristallstruktur</subfield><subfield code="0">(DE-588)4136176-3</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Elektronenmikroskop</subfield><subfield code="0">(DE-588)4014326-0</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Elektronenmikroskopie</subfield><subfield code="0">(DE-588)4014327-2</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="1"><subfield code="a">Werkstoffprüfung</subfield><subfield code="0">(DE-588)4037934-6</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="1" ind2="0"><subfield code="a">Elektronenmikroskopie</subfield><subfield code="0">(DE-588)4014327-2</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="1" ind2="1"><subfield code="a">Werkstoffkunde</subfield><subfield code="0">(DE-588)4079184-1</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="1" ind2=" "><subfield code="8">1\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="2" ind2="0"><subfield code="a">Kristallstruktur</subfield><subfield code="0">(DE-588)4136176-3</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="2" ind2=" "><subfield code="8">2\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="3" ind2="0"><subfield code="a">Elektronenmikroskop</subfield><subfield code="0">(DE-588)4014326-0</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="3" ind2=" "><subfield code="8">3\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Jones, Grenville A.</subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="830" ind1=" " ind2="0"><subfield code="a">The structures and properties of solids.</subfield><subfield code="v">7.</subfield><subfield code="w">(DE-604)BV001890114</subfield><subfield code="9">7</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-003599249</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">1\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">2\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">3\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield></record></collection> |
| id | DE-604.BV005762543 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-09T16:34:16Z |
| institution | BVB |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-003599249 |
| oclc_num | 3043860 |
| open_access_boolean | |
| owner | DE-703 |
| owner_facet | DE-703 |
| physical | 174 S.: Ill., graph.Darst., Tab. |
| publishDate | 1976 |
| publishDateSearch | 1976 |
| publishDateSort | 1976 |
| publisher | Arnold |
| record_format | marc |
| series | The structures and properties of solids. |
| series2 | The structures and properties of solids. |
| spelling | Grundy, Philip J. Verfasser aut Electron microscopy in the study of materials Philip J. Grundy ; Grenville A. Jones* London Arnold 1976 174 S.: Ill., graph.Darst., Tab. txt rdacontent n rdamedia nc rdacarrier The structures and properties of solids. 7. Elektronenmicroscopie gtt Materiaalkunde gtt Matériaux Microscopie électronique Vastestoffysica gtt Electron microscopy Materials Werkstoffkunde (DE-588)4079184-1 gnd rswk-swf Elektronenmikroskopie (DE-588)4014327-2 gnd rswk-swf Werkstoffprüfung (DE-588)4037934-6 gnd rswk-swf Kristallstruktur (DE-588)4136176-3 gnd rswk-swf Elektronenmikroskop (DE-588)4014326-0 gnd rswk-swf Elektronenmikroskopie (DE-588)4014327-2 s Werkstoffprüfung (DE-588)4037934-6 s DE-604 Werkstoffkunde (DE-588)4079184-1 s 1\p DE-604 Kristallstruktur (DE-588)4136176-3 s 2\p DE-604 Elektronenmikroskop (DE-588)4014326-0 s 3\p DE-604 Jones, Grenville A. Verfasser aut The structures and properties of solids. 7. (DE-604)BV001890114 7 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 2\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 3\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | Grundy, Philip J. Jones, Grenville A. Electron microscopy in the study of materials The structures and properties of solids. Elektronenmicroscopie gtt Materiaalkunde gtt Matériaux Microscopie électronique Vastestoffysica gtt Electron microscopy Materials Werkstoffkunde (DE-588)4079184-1 gnd Elektronenmikroskopie (DE-588)4014327-2 gnd Werkstoffprüfung (DE-588)4037934-6 gnd Kristallstruktur (DE-588)4136176-3 gnd Elektronenmikroskop (DE-588)4014326-0 gnd |
| subject_GND | (DE-588)4079184-1 (DE-588)4014327-2 (DE-588)4037934-6 (DE-588)4136176-3 (DE-588)4014326-0 |
| title | Electron microscopy in the study of materials |
| title_auth | Electron microscopy in the study of materials |
| title_exact_search | Electron microscopy in the study of materials |
| title_full | Electron microscopy in the study of materials Philip J. Grundy ; Grenville A. Jones* |
| title_fullStr | Electron microscopy in the study of materials Philip J. Grundy ; Grenville A. Jones* |
| title_full_unstemmed | Electron microscopy in the study of materials Philip J. Grundy ; Grenville A. Jones* |
| title_short | Electron microscopy in the study of materials |
| title_sort | electron microscopy in the study of materials |
| topic | Elektronenmicroscopie gtt Materiaalkunde gtt Matériaux Microscopie électronique Vastestoffysica gtt Electron microscopy Materials Werkstoffkunde (DE-588)4079184-1 gnd Elektronenmikroskopie (DE-588)4014327-2 gnd Werkstoffprüfung (DE-588)4037934-6 gnd Kristallstruktur (DE-588)4136176-3 gnd Elektronenmikroskop (DE-588)4014326-0 gnd |
| topic_facet | Elektronenmicroscopie Materiaalkunde Matériaux Microscopie électronique Vastestoffysica Electron microscopy Materials Werkstoffkunde Elektronenmikroskopie Werkstoffprüfung Kristallstruktur Elektronenmikroskop |
| volume_link | (DE-604)BV001890114 |
| work_keys_str_mv | AT grundyphilipj electronmicroscopyinthestudyofmaterials AT jonesgrenvillea electronmicroscopyinthestudyofmaterials |