Encounter with chaos: self-organized hierarchical complexity in semiconductor experiments
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Bibliographic Details
Format: Book
Language:English
Published: Berlin [u.a.] Springer 1992
Subjects:
Online Access:Inhaltsverzeichnis
Physical Description:IX, 289 S. Ill., graph. Darst.
ISBN:3540558454
0387558454
3540556478
0387556478

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