(1992). Defect recognition in semiconductors before and after processing: Proceedings of the fourth International Conference ; Wilmslow, UK, 18 - 22 March 1991. Hilger.
Chicago Style (17th ed.) CitationDefect Recognition in Semiconductors Before and After Processing: Proceedings of the Fourth International Conference ; Wilmslow, UK, 18 - 22 March 1991. Bristol u.a: Hilger, 1992.
MLA (9th ed.) CitationDefect Recognition in Semiconductors Before and After Processing: Proceedings of the Fourth International Conference ; Wilmslow, UK, 18 - 22 March 1991. Hilger, 1992.
Warning: These citations may not always be 100% accurate.