Selected reprints on logic design for testability:
Gespeichert in:
| Format: | Buch |
|---|---|
| Sprache: | English |
| Veröffentlicht: |
Silver Spring, MD
IEEE Computer Soc. Pr.
1984
|
| Schlagworte: | |
| Beschreibung: | VIII, 315 S. graph. Darst. |
| ISBN: | 0818605731 0818645733 |
Internformat
MARC
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| 245 | 1 | 0 | |a Selected reprints on logic design for testability |c comp. by Constantin C. Timoc. IEEE Computer Soc. |
| 264 | 1 | |a Silver Spring, MD |b IEEE Computer Soc. Pr. |c 1984 | |
| 300 | |a VIII, 315 S. |b graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
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| 650 | 4 | |a Circuits logiques - Essais | |
| 650 | 4 | |a Logic circuits |x Testing | |
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Datensatz im Suchindex
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| callnumber-search | TK7888.4 |
| callnumber-sort | TK 47888.4 |
| callnumber-subject | TK - Electrical and Nuclear Engineering |
| classification_rvk | ST 190 ZN 4030 |
| ctrlnum | (OCoLC)11175793 (DE-599)BVBBV005548309 |
| dewey-full | 621.3819/5835/0287 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 621 - Applied physics |
| dewey-raw | 621.3819/5835/0287 |
| dewey-search | 621.3819/5835/0287 |
| dewey-sort | 3621.3819 45835 3287 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Informatik Elektrotechnik / Elektronik / Nachrichtentechnik |
| format | Book |
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| genre | (DE-588)4143413-4 Aufsatzsammlung gnd-content |
| genre_facet | Aufsatzsammlung |
| id | DE-604.BV005548309 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T16:31:28Z |
| institution | BVB |
| institution_GND | (DE-588)25694-8 |
| isbn | 0818605731 0818645733 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-003479050 |
| oclc_num | 11175793 |
| open_access_boolean | |
| owner | DE-92 DE-739 DE-29T |
| owner_facet | DE-92 DE-739 DE-29T |
| physical | VIII, 315 S. graph. Darst. |
| publishDate | 1984 |
| publishDateSearch | 1984 |
| publishDateSort | 1984 |
| publisher | IEEE Computer Soc. Pr. |
| record_format | marc |
| spelling | Selected reprints on logic design for testability comp. by Constantin C. Timoc. IEEE Computer Soc. Silver Spring, MD IEEE Computer Soc. Pr. 1984 VIII, 315 S. graph. Darst. txt rdacontent n rdamedia nc rdacarrier Circuits logiques - Essais Logic circuits Testing Test (DE-588)4059549-3 gnd rswk-swf Entwurf (DE-588)4121208-3 gnd rswk-swf Logische Schaltung (DE-588)4131023-8 gnd rswk-swf (DE-588)4143413-4 Aufsatzsammlung gnd-content Logische Schaltung (DE-588)4131023-8 s Test (DE-588)4059549-3 s DE-604 Entwurf (DE-588)4121208-3 s Timoc, Constantin C. Sonstige oth IEEE Computer Society Sonstige (DE-588)25694-8 oth |
| spellingShingle | Selected reprints on logic design for testability Circuits logiques - Essais Logic circuits Testing Test (DE-588)4059549-3 gnd Entwurf (DE-588)4121208-3 gnd Logische Schaltung (DE-588)4131023-8 gnd |
| subject_GND | (DE-588)4059549-3 (DE-588)4121208-3 (DE-588)4131023-8 (DE-588)4143413-4 |
| title | Selected reprints on logic design for testability |
| title_auth | Selected reprints on logic design for testability |
| title_exact_search | Selected reprints on logic design for testability |
| title_full | Selected reprints on logic design for testability comp. by Constantin C. Timoc. IEEE Computer Soc. |
| title_fullStr | Selected reprints on logic design for testability comp. by Constantin C. Timoc. IEEE Computer Soc. |
| title_full_unstemmed | Selected reprints on logic design for testability comp. by Constantin C. Timoc. IEEE Computer Soc. |
| title_short | Selected reprints on logic design for testability |
| title_sort | selected reprints on logic design for testability |
| topic | Circuits logiques - Essais Logic circuits Testing Test (DE-588)4059549-3 gnd Entwurf (DE-588)4121208-3 gnd Logische Schaltung (DE-588)4131023-8 gnd |
| topic_facet | Circuits logiques - Essais Logic circuits Testing Test Entwurf Logische Schaltung Aufsatzsammlung |
| work_keys_str_mv | AT timocconstantinc selectedreprintsonlogicdesignfortestability AT ieeecomputersociety selectedreprintsonlogicdesignfortestability |