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Bibliographic Details
Corporate Author:	International Test Conference Nashville, Tenn (Author)
Format:	Conference Proceeding Book
Language:	Undetermined
Published:	Los Alamitos, CA IEEE Computer Soc. Press 1991
Subjects:	Computersimulation Integrierte Schaltung Maschinelles Sehen Entwurf Prüftechnik Computerunterstütztes Verfahren Bildverstehen Mustererkennung Elektronik Telekommunikation Datenverarbeitungssystem Medizin VLSI Mikroelektronik Testen Konferenzschrift
Item Description:	Literaturangaben
Physical Description:	XIV, 1135 S. graph. Darst.

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MARC


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Record in the Search Index

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bvnumber	BV005485130
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ctrlnum	(OCoLC)630484668 (DE-599)BVBBV005485130
discipline	Elektrotechnik Elektrotechnik / Elektronik / Nachrichtentechnik
format	Conference Proceeding Book
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publisher	IEEE Computer Soc. Press
record_format	marc
spelling	International Test Conference 22 1991 Nashville, Tenn. Verfasser (DE-588)5067608-8 aut Proceedings International Test Conference 1991 (October 26 - 30, 1991, Opryland Hotel, Nashville, TN, USA) Test: faster, better, sooner Los Alamitos, CA IEEE Computer Soc. Press 1991 XIV, 1135 S. graph. Darst. txt rdacontent n rdamedia nc rdacarrier Literaturangaben Computersimulation (DE-588)4148259-1 gnd rswk-swf Integrierte Schaltung (DE-588)4027242-4 gnd rswk-swf Maschinelles Sehen (DE-588)4129594-8 gnd rswk-swf Entwurf (DE-588)4121208-3 gnd rswk-swf Prüftechnik (DE-588)4047610-8 gnd rswk-swf Computerunterstütztes Verfahren (DE-588)4139030-1 gnd rswk-swf Bildverstehen (DE-588)4202022-0 gnd rswk-swf Mustererkennung (DE-588)4040936-3 gnd rswk-swf Elektronik (DE-588)4014346-6 gnd rswk-swf Telekommunikation (DE-588)4059360-5 gnd rswk-swf Datenverarbeitungssystem (DE-588)4125229-9 gnd rswk-swf Medizin (DE-588)4038243-6 gnd rswk-swf VLSI (DE-588)4117388-0 gnd rswk-swf Mikroelektronik (DE-588)4039207-7 gnd rswk-swf Testen (DE-588)4367264-4 gnd rswk-swf (DE-588)1071861417 Konferenzschrift gnd-content Integrierte Schaltung (DE-588)4027242-4 s Prüftechnik (DE-588)4047610-8 s 1\p DE-604 Datenverarbeitungssystem (DE-588)4125229-9 s Computersimulation (DE-588)4148259-1 s 2\p DE-604 Telekommunikation (DE-588)4059360-5 s 3\p DE-604 Mikroelektronik (DE-588)4039207-7 s 4\p DE-604 Elektronik (DE-588)4014346-6 s Testen (DE-588)4367264-4 s 5\p DE-604 VLSI (DE-588)4117388-0 s Entwurf (DE-588)4121208-3 s 6\p DE-604 Computerunterstütztes Verfahren (DE-588)4139030-1 s Medizin (DE-588)4038243-6 s 7\p DE-604 8\p DE-604 Bildverstehen (DE-588)4202022-0 s Maschinelles Sehen (DE-588)4129594-8 s 9\p DE-604 Mustererkennung (DE-588)4040936-3 s 10\p DE-604 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 2\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 3\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 4\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 5\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 6\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 7\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 8\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 9\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 10\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk
spellingShingle	Proceedings Computersimulation (DE-588)4148259-1 gnd Integrierte Schaltung (DE-588)4027242-4 gnd Maschinelles Sehen (DE-588)4129594-8 gnd Entwurf (DE-588)4121208-3 gnd Prüftechnik (DE-588)4047610-8 gnd Computerunterstütztes Verfahren (DE-588)4139030-1 gnd Bildverstehen (DE-588)4202022-0 gnd Mustererkennung (DE-588)4040936-3 gnd Elektronik (DE-588)4014346-6 gnd Telekommunikation (DE-588)4059360-5 gnd Datenverarbeitungssystem (DE-588)4125229-9 gnd Medizin (DE-588)4038243-6 gnd VLSI (DE-588)4117388-0 gnd Mikroelektronik (DE-588)4039207-7 gnd Testen (DE-588)4367264-4 gnd
subject_GND	(DE-588)4148259-1 (DE-588)4027242-4 (DE-588)4129594-8 (DE-588)4121208-3 (DE-588)4047610-8 (DE-588)4139030-1 (DE-588)4202022-0 (DE-588)4040936-3 (DE-588)4014346-6 (DE-588)4059360-5 (DE-588)4125229-9 (DE-588)4038243-6 (DE-588)4117388-0 (DE-588)4039207-7 (DE-588)4367264-4 (DE-588)1071861417
title	Proceedings
title_alt	Test: faster, better, sooner
title_auth	Proceedings
title_exact_search	Proceedings
title_full	Proceedings International Test Conference 1991 (October 26 - 30, 1991, Opryland Hotel, Nashville, TN, USA)
title_fullStr	Proceedings International Test Conference 1991 (October 26 - 30, 1991, Opryland Hotel, Nashville, TN, USA)
title_full_unstemmed	Proceedings International Test Conference 1991 (October 26 - 30, 1991, Opryland Hotel, Nashville, TN, USA)
title_short	Proceedings
title_sort	proceedings
topic	Computersimulation (DE-588)4148259-1 gnd Integrierte Schaltung (DE-588)4027242-4 gnd Maschinelles Sehen (DE-588)4129594-8 gnd Entwurf (DE-588)4121208-3 gnd Prüftechnik (DE-588)4047610-8 gnd Computerunterstütztes Verfahren (DE-588)4139030-1 gnd Bildverstehen (DE-588)4202022-0 gnd Mustererkennung (DE-588)4040936-3 gnd Elektronik (DE-588)4014346-6 gnd Telekommunikation (DE-588)4059360-5 gnd Datenverarbeitungssystem (DE-588)4125229-9 gnd Medizin (DE-588)4038243-6 gnd VLSI (DE-588)4117388-0 gnd Mikroelektronik (DE-588)4039207-7 gnd Testen (DE-588)4367264-4 gnd
topic_facet	Computersimulation Integrierte Schaltung Maschinelles Sehen Entwurf Prüftechnik Computerunterstütztes Verfahren Bildverstehen Mustererkennung Elektronik Telekommunikation Datenverarbeitungssystem Medizin VLSI Mikroelektronik Testen Konferenzschrift
work_keys_str_mv	AT internationaltestconferencenashvilletenn proceedings AT internationaltestconferencenashvilletenn testfasterbettersooner

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