Semiconductor material and device characterization:
Saved in:
| Main Author: | |
|---|---|
| Format: | Book |
| Language: | German |
| Published: |
New York [u.a.]
Wiley
1990
|
| Series: | A Wiley-Interscience publication
|
| Subjects: | |
| Physical Description: | XV, 599 S. Ill., graph. Darst. |
| ISBN: | 0471511048 |
Staff View
MARC
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Record in the Search Index
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| any_adam_object | |
| author | Schroder, Dieter K. |
| author_facet | Schroder, Dieter K. |
| author_role | aut |
| author_sort | Schroder, Dieter K. |
| author_variant | d k s dk dks |
| building | Verbundindex |
| bvnumber | BV004702191 |
| callnumber-first | Q - Science |
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| callnumber-raw | QC611 |
| callnumber-search | QC611 |
| callnumber-sort | QC 3611 |
| callnumber-subject | QC - Physics |
| classification_rvk | UP 2800 |
| classification_tum | ELT 072f ELT 300f |
| ctrlnum | (OCoLC)831357165 (DE-599)BVBBV004702191 |
| dewey-full | 621.381/52 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 621 - Applied physics |
| dewey-raw | 621.381/52 |
| dewey-search | 621.381/52 |
| dewey-sort | 3621.381 252 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Physik Elektrotechnik Elektrotechnik / Elektronik / Nachrichtentechnik |
| format | Book |
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| id | DE-604.BV004702191 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T16:16:20Z |
| institution | BVB |
| isbn | 0471511048 |
| language | German |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-002888341 |
| oclc_num | 831357165 |
| open_access_boolean | |
| owner | DE-91 DE-BY-TUM DE-29T DE-20 DE-703 DE-522 DE-11 |
| owner_facet | DE-91 DE-BY-TUM DE-29T DE-20 DE-703 DE-522 DE-11 |
| physical | XV, 599 S. Ill., graph. Darst. |
| publishDate | 1990 |
| publishDateSearch | 1990 |
| publishDateSort | 1990 |
| publisher | Wiley |
| record_format | marc |
| series2 | A Wiley-Interscience publication |
| spelling | Schroder, Dieter K. Verfasser aut Semiconductor material and device characterization Dieter K. Schroder New York [u.a.] Wiley 1990 XV, 599 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier A Wiley-Interscience publication Semiconducteurs Semiconducteurs - Essais Semiconducteurs ram Semiconductors Semiconductors Testing Halbleiterschaltung (DE-588)4158811-3 gnd rswk-swf Halbleiter (DE-588)4022993-2 gnd rswk-swf Halbleiterwerkstoff (DE-588)4158817-4 gnd rswk-swf Halbleiterbauelement (DE-588)4113826-0 gnd rswk-swf Prüftechnik (DE-588)4047610-8 gnd rswk-swf Halbleiterwerkstoff (DE-588)4158817-4 s DE-604 Halbleiterbauelement (DE-588)4113826-0 s Halbleiterschaltung (DE-588)4158811-3 s Prüftechnik (DE-588)4047610-8 s Halbleiter (DE-588)4022993-2 s |
| spellingShingle | Schroder, Dieter K. Semiconductor material and device characterization Semiconducteurs Semiconducteurs - Essais Semiconducteurs ram Semiconductors Semiconductors Testing Halbleiterschaltung (DE-588)4158811-3 gnd Halbleiter (DE-588)4022993-2 gnd Halbleiterwerkstoff (DE-588)4158817-4 gnd Halbleiterbauelement (DE-588)4113826-0 gnd Prüftechnik (DE-588)4047610-8 gnd |
| subject_GND | (DE-588)4158811-3 (DE-588)4022993-2 (DE-588)4158817-4 (DE-588)4113826-0 (DE-588)4047610-8 |
| title | Semiconductor material and device characterization |
| title_auth | Semiconductor material and device characterization |
| title_exact_search | Semiconductor material and device characterization |
| title_full | Semiconductor material and device characterization Dieter K. Schroder |
| title_fullStr | Semiconductor material and device characterization Dieter K. Schroder |
| title_full_unstemmed | Semiconductor material and device characterization Dieter K. Schroder |
| title_short | Semiconductor material and device characterization |
| title_sort | semiconductor material and device characterization |
| topic | Semiconducteurs Semiconducteurs - Essais Semiconducteurs ram Semiconductors Semiconductors Testing Halbleiterschaltung (DE-588)4158811-3 gnd Halbleiter (DE-588)4022993-2 gnd Halbleiterwerkstoff (DE-588)4158817-4 gnd Halbleiterbauelement (DE-588)4113826-0 gnd Prüftechnik (DE-588)4047610-8 gnd |
| topic_facet | Semiconducteurs Semiconducteurs - Essais Semiconductors Semiconductors Testing Halbleiterschaltung Halbleiter Halbleiterwerkstoff Halbleiterbauelement Prüftechnik |
| work_keys_str_mv | AT schroderdieterk semiconductormaterialanddevicecharacterization |