International Symposium on Electron Microscopy: Beijing, China October 22 - 23, 1990
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Bibliographic Details
Corporate Author: International Symposium on Electron Microscopy Peking (Author)
Format: Conference Proceeding Book
Language:English
Published: Singapore u.a. World Scientific 1991
Subjects:
Physical Description:XII, 478 S. Ill., graph. Darst.
ISBN:9810205317

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Interlibrary loan Place Request Caution: Not in THWS collection!