VLSI system test cost versus quality: 1990 IEEE VLSI Test Symposium April 10 - 11, 1990 Bally's Park Place Casino Hotel Atlantic City, NJ
Gespeichert in:
| Format: | Tagungsbericht Buch |
|---|---|
| Sprache: | English |
| Veröffentlicht: |
Lakehurst, NJ
[circa 1990]
|
| Schlagworte: | |
| Beschreibung: | Getr. Zählung graph. Darst. |
Internformat
MARC
| LEADER | 00000nam a2200000 c 4500 | ||
|---|---|---|---|
| 001 | BV004405971 | ||
| 003 | DE-604 | ||
| 005 | 00000000000000.0 | ||
| 007 | t | ||
| 008 | 910710s1990 d||| |||| 10||| engod | ||
| 035 | |a (OCoLC)606318583 | ||
| 035 | |a (DE-599)BVBBV004405971 | ||
| 040 | |a DE-604 |b ger |e rakddb | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-91 | ||
| 050 | 0 | |a TK7874 | |
| 084 | |a ELT 359f |2 stub | ||
| 245 | 1 | 0 | |a VLSI system test cost versus quality |b 1990 IEEE VLSI Test Symposium April 10 - 11, 1990 Bally's Park Place Casino Hotel Atlantic City, NJ |c Chairperson: Wesley E. Radcliffe |
| 264 | 1 | |a Lakehurst, NJ |c [circa 1990] | |
| 300 | |a Getr. Zählung |b graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 650 | 4 | |a Integrated circuits |x Very large scale integration |x Testing |v Congresses | |
| 650 | 0 | 7 | |a VLSI |0 (DE-588)4117388-0 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Testen |0 (DE-588)4367264-4 |2 gnd |9 rswk-swf |
| 655 | 7 | |0 (DE-588)1071861417 |a Konferenzschrift |y 1990 |z Atlantic City NJ |2 gnd-content | |
| 689 | 0 | 0 | |a VLSI |0 (DE-588)4117388-0 |D s |
| 689 | 0 | 1 | |a Testen |0 (DE-588)4367264-4 |D s |
| 689 | 0 | |5 DE-604 | |
| 700 | 1 | |a Radcliffe, Wesley E. |e Sonstige |4 oth | |
| 710 | 2 | |a Institute of Electrical and Electronics Engineers |e Sonstige |0 (DE-588)1692-5 |4 oth | |
| 711 | 2 | |a VLSI Test Symposium |n 8 |d 1990 |c Atlantic City, NJ |j Sonstige |0 (DE-588)1221739-6 |4 oth | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-002734133 | ||
Datensatz im Suchindex
| _version_ | 1804118583538614272 |
|---|---|
| any_adam_object | |
| building | Verbundindex |
| bvnumber | BV004405971 |
| callnumber-first | T - Technology |
| callnumber-label | TK7874 |
| callnumber-raw | TK7874 |
| callnumber-search | TK7874 |
| callnumber-sort | TK 47874 |
| callnumber-subject | TK - Electrical and Nuclear Engineering |
| classification_tum | ELT 359f |
| ctrlnum | (OCoLC)606318583 (DE-599)BVBBV004405971 |
| discipline | Elektrotechnik |
| format | Conference Proceeding Book |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01438nam a2200373 c 4500</leader><controlfield tag="001">BV004405971</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">00000000000000.0</controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">910710s1990 d||| |||| 10||| engod</controlfield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)606318583</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV004405971</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rakddb</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-91</subfield></datafield><datafield tag="050" ind1=" " ind2="0"><subfield code="a">TK7874</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">ELT 359f</subfield><subfield code="2">stub</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">VLSI system test cost versus quality</subfield><subfield code="b">1990 IEEE VLSI Test Symposium April 10 - 11, 1990 Bally's Park Place Casino Hotel Atlantic City, NJ</subfield><subfield code="c">Chairperson: Wesley E. Radcliffe</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Lakehurst, NJ</subfield><subfield code="c">[circa 1990]</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">Getr. Zählung</subfield><subfield code="b">graph. Darst.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Integrated circuits</subfield><subfield code="x">Very large scale integration</subfield><subfield code="x">Testing</subfield><subfield code="v">Congresses</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">VLSI</subfield><subfield code="0">(DE-588)4117388-0</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Testen</subfield><subfield code="0">(DE-588)4367264-4</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="655" ind1=" " ind2="7"><subfield code="0">(DE-588)1071861417</subfield><subfield code="a">Konferenzschrift</subfield><subfield code="y">1990</subfield><subfield code="z">Atlantic City NJ</subfield><subfield code="2">gnd-content</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">VLSI</subfield><subfield code="0">(DE-588)4117388-0</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="1"><subfield code="a">Testen</subfield><subfield code="0">(DE-588)4367264-4</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Radcliffe, Wesley E.</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="710" ind1="2" ind2=" "><subfield code="a">Institute of Electrical and Electronics Engineers</subfield><subfield code="e">Sonstige</subfield><subfield code="0">(DE-588)1692-5</subfield><subfield code="4">oth</subfield></datafield><datafield tag="711" ind1="2" ind2=" "><subfield code="a">VLSI Test Symposium</subfield><subfield code="n">8</subfield><subfield code="d">1990</subfield><subfield code="c">Atlantic City, NJ</subfield><subfield code="j">Sonstige</subfield><subfield code="0">(DE-588)1221739-6</subfield><subfield code="4">oth</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-002734133</subfield></datafield></record></collection> |
| genre | (DE-588)1071861417 Konferenzschrift 1990 Atlantic City NJ gnd-content |
| genre_facet | Konferenzschrift 1990 Atlantic City NJ |
| id | DE-604.BV004405971 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T16:12:36Z |
| institution | BVB |
| institution_GND | (DE-588)1692-5 (DE-588)1221739-6 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-002734133 |
| oclc_num | 606318583 |
| open_access_boolean | |
| owner | DE-91 DE-BY-TUM |
| owner_facet | DE-91 DE-BY-TUM |
| physical | Getr. Zählung graph. Darst. |
| publishDate | 1990 |
| publishDateSearch | 1990 |
| publishDateSort | 1990 |
| record_format | marc |
| spelling | VLSI system test cost versus quality 1990 IEEE VLSI Test Symposium April 10 - 11, 1990 Bally's Park Place Casino Hotel Atlantic City, NJ Chairperson: Wesley E. Radcliffe Lakehurst, NJ [circa 1990] Getr. Zählung graph. Darst. txt rdacontent n rdamedia nc rdacarrier Integrated circuits Very large scale integration Testing Congresses VLSI (DE-588)4117388-0 gnd rswk-swf Testen (DE-588)4367264-4 gnd rswk-swf (DE-588)1071861417 Konferenzschrift 1990 Atlantic City NJ gnd-content VLSI (DE-588)4117388-0 s Testen (DE-588)4367264-4 s DE-604 Radcliffe, Wesley E. Sonstige oth Institute of Electrical and Electronics Engineers Sonstige (DE-588)1692-5 oth VLSI Test Symposium 8 1990 Atlantic City, NJ Sonstige (DE-588)1221739-6 oth |
| spellingShingle | VLSI system test cost versus quality 1990 IEEE VLSI Test Symposium April 10 - 11, 1990 Bally's Park Place Casino Hotel Atlantic City, NJ Integrated circuits Very large scale integration Testing Congresses VLSI (DE-588)4117388-0 gnd Testen (DE-588)4367264-4 gnd |
| subject_GND | (DE-588)4117388-0 (DE-588)4367264-4 (DE-588)1071861417 |
| title | VLSI system test cost versus quality 1990 IEEE VLSI Test Symposium April 10 - 11, 1990 Bally's Park Place Casino Hotel Atlantic City, NJ |
| title_auth | VLSI system test cost versus quality 1990 IEEE VLSI Test Symposium April 10 - 11, 1990 Bally's Park Place Casino Hotel Atlantic City, NJ |
| title_exact_search | VLSI system test cost versus quality 1990 IEEE VLSI Test Symposium April 10 - 11, 1990 Bally's Park Place Casino Hotel Atlantic City, NJ |
| title_full | VLSI system test cost versus quality 1990 IEEE VLSI Test Symposium April 10 - 11, 1990 Bally's Park Place Casino Hotel Atlantic City, NJ Chairperson: Wesley E. Radcliffe |
| title_fullStr | VLSI system test cost versus quality 1990 IEEE VLSI Test Symposium April 10 - 11, 1990 Bally's Park Place Casino Hotel Atlantic City, NJ Chairperson: Wesley E. Radcliffe |
| title_full_unstemmed | VLSI system test cost versus quality 1990 IEEE VLSI Test Symposium April 10 - 11, 1990 Bally's Park Place Casino Hotel Atlantic City, NJ Chairperson: Wesley E. Radcliffe |
| title_short | VLSI system test cost versus quality |
| title_sort | vlsi system test cost versus quality 1990 ieee vlsi test symposium april 10 11 1990 bally s park place casino hotel atlantic city nj |
| title_sub | 1990 IEEE VLSI Test Symposium April 10 - 11, 1990 Bally's Park Place Casino Hotel Atlantic City, NJ |
| topic | Integrated circuits Very large scale integration Testing Congresses VLSI (DE-588)4117388-0 gnd Testen (DE-588)4367264-4 gnd |
| topic_facet | Integrated circuits Very large scale integration Testing Congresses VLSI Testen Konferenzschrift 1990 Atlantic City NJ |
| work_keys_str_mv | AT radcliffewesleye vlsisystemtestcostversusquality1990ieeevlsitestsymposiumapril10111990ballysparkplacecasinohotelatlanticcitynj AT instituteofelectricalandelectronicsengineers vlsisystemtestcostversusquality1990ieeevlsitestsymposiumapril10111990ballysparkplacecasinohotelatlanticcitynj AT vlsitestsymposiumatlanticcitynj vlsisystemtestcostversusquality1990ieeevlsitestsymposiumapril10111990ballysparkplacecasinohotelatlanticcitynj |