VLSI system test cost versus quality: 1990 IEEE VLSI Test Symposium April 10 - 11, 1990 Bally's Park Place Casino Hotel Atlantic City, NJ
Saved in:
| Format: | Conference Proceeding Book |
|---|---|
| Language: | English |
| Published: |
Lakehurst, NJ
[circa 1990]
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| Subjects: | |
| Physical Description: | Getr. Zählung graph. Darst. |
Staff View
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| indexdate | 2024-07-09T16:12:36Z |
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| physical | Getr. Zählung graph. Darst. |
| publishDate | 1990 |
| publishDateSearch | 1990 |
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| spelling | VLSI system test cost versus quality 1990 IEEE VLSI Test Symposium April 10 - 11, 1990 Bally's Park Place Casino Hotel Atlantic City, NJ Chairperson: Wesley E. Radcliffe Lakehurst, NJ [circa 1990] Getr. Zählung graph. Darst. txt rdacontent n rdamedia nc rdacarrier Integrated circuits Very large scale integration Testing Congresses VLSI (DE-588)4117388-0 gnd rswk-swf Testen (DE-588)4367264-4 gnd rswk-swf (DE-588)1071861417 Konferenzschrift 1990 Atlantic City NJ gnd-content VLSI (DE-588)4117388-0 s Testen (DE-588)4367264-4 s DE-604 Radcliffe, Wesley E. Sonstige oth Institute of Electrical and Electronics Engineers Sonstige (DE-588)1692-5 oth VLSI Test Symposium 8 1990 Atlantic City, NJ Sonstige (DE-588)1221739-6 oth |
| spellingShingle | VLSI system test cost versus quality 1990 IEEE VLSI Test Symposium April 10 - 11, 1990 Bally's Park Place Casino Hotel Atlantic City, NJ Integrated circuits Very large scale integration Testing Congresses VLSI (DE-588)4117388-0 gnd Testen (DE-588)4367264-4 gnd |
| subject_GND | (DE-588)4117388-0 (DE-588)4367264-4 (DE-588)1071861417 |
| title | VLSI system test cost versus quality 1990 IEEE VLSI Test Symposium April 10 - 11, 1990 Bally's Park Place Casino Hotel Atlantic City, NJ |
| title_auth | VLSI system test cost versus quality 1990 IEEE VLSI Test Symposium April 10 - 11, 1990 Bally's Park Place Casino Hotel Atlantic City, NJ |
| title_exact_search | VLSI system test cost versus quality 1990 IEEE VLSI Test Symposium April 10 - 11, 1990 Bally's Park Place Casino Hotel Atlantic City, NJ |
| title_full | VLSI system test cost versus quality 1990 IEEE VLSI Test Symposium April 10 - 11, 1990 Bally's Park Place Casino Hotel Atlantic City, NJ Chairperson: Wesley E. Radcliffe |
| title_fullStr | VLSI system test cost versus quality 1990 IEEE VLSI Test Symposium April 10 - 11, 1990 Bally's Park Place Casino Hotel Atlantic City, NJ Chairperson: Wesley E. Radcliffe |
| title_full_unstemmed | VLSI system test cost versus quality 1990 IEEE VLSI Test Symposium April 10 - 11, 1990 Bally's Park Place Casino Hotel Atlantic City, NJ Chairperson: Wesley E. Radcliffe |
| title_short | VLSI system test cost versus quality |
| title_sort | vlsi system test cost versus quality 1990 ieee vlsi test symposium april 10 11 1990 bally s park place casino hotel atlantic city nj |
| title_sub | 1990 IEEE VLSI Test Symposium April 10 - 11, 1990 Bally's Park Place Casino Hotel Atlantic City, NJ |
| topic | Integrated circuits Very large scale integration Testing Congresses VLSI (DE-588)4117388-0 gnd Testen (DE-588)4367264-4 gnd |
| topic_facet | Integrated circuits Very large scale integration Testing Congresses VLSI Testen Konferenzschrift 1990 Atlantic City NJ |
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