Rapid reliability assessment of VLSICs:
Saved in:
| Format: | Book |
|---|---|
| Language: | English |
| Published: |
New York u.a.
Plenum Pr.
1990
|
| Subjects: | |
| Physical Description: | IX, 202 S. graph. Darst. |
| ISBN: | 030643492X |
Staff View
MARC
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Record in the Search Index
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| id | DE-604.BV004337091 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T16:11:38Z |
| institution | BVB |
| isbn | 030643492X |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-002695233 |
| oclc_num | 20933809 |
| open_access_boolean | |
| owner | DE-91 DE-BY-TUM |
| owner_facet | DE-91 DE-BY-TUM |
| physical | IX, 202 S. graph. Darst. |
| publishDate | 1990 |
| publishDateSearch | 1990 |
| publishDateSort | 1990 |
| publisher | Plenum Pr. |
| record_format | marc |
| spelling | Rapid reliability assessment of VLSICs A. P. Dorey ... New York u.a. Plenum Pr. 1990 IX, 202 S. graph. Darst. txt rdacontent n rdamedia nc rdacarrier Integrated circuits Very large scale integration Reliability Integrated circuits Very large scale integration Testing Prüftechnik (DE-588)4047610-8 gnd rswk-swf VLSI (DE-588)4117388-0 gnd rswk-swf VLSI (DE-588)4117388-0 s Prüftechnik (DE-588)4047610-8 s DE-604 Dorey, A. P. Sonstige oth |
| spellingShingle | Rapid reliability assessment of VLSICs Integrated circuits Very large scale integration Reliability Integrated circuits Very large scale integration Testing Prüftechnik (DE-588)4047610-8 gnd VLSI (DE-588)4117388-0 gnd |
| subject_GND | (DE-588)4047610-8 (DE-588)4117388-0 |
| title | Rapid reliability assessment of VLSICs |
| title_auth | Rapid reliability assessment of VLSICs |
| title_exact_search | Rapid reliability assessment of VLSICs |
| title_full | Rapid reliability assessment of VLSICs A. P. Dorey ... |
| title_fullStr | Rapid reliability assessment of VLSICs A. P. Dorey ... |
| title_full_unstemmed | Rapid reliability assessment of VLSICs A. P. Dorey ... |
| title_short | Rapid reliability assessment of VLSICs |
| title_sort | rapid reliability assessment of vlsics |
| topic | Integrated circuits Very large scale integration Reliability Integrated circuits Very large scale integration Testing Prüftechnik (DE-588)4047610-8 gnd VLSI (DE-588)4117388-0 gnd |
| topic_facet | Integrated circuits Very large scale integration Reliability Integrated circuits Very large scale integration Testing Prüftechnik VLSI |
| work_keys_str_mv | AT doreyap rapidreliabilityassessmentofvlsics |