Attribute sampling plans, tables of tests and confidence limits for proportions:
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Bibliographic Details
Main Authors: Odeh, Robert E. (Author), Owen, Donald B. 1922-1991 (Author)
Format: Book
Language:English
Published: New York, Ny [u.a.] Marcel Dekker 1983
Series:Statistics 49
Subjects:
Physical Description:XI, 368 Seiten
ISBN:0824771362

There is no print copy available.

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