Fault-tolerance through reconfiguration of VLSI and WSI arrays:
Saved in:
| Main Authors: | , , |
|---|---|
| Format: | Book |
| Language: | English |
| Published: |
Cambridge, Mass. u.a.
MIT Pr.
1989
|
| Series: | MIT Press series in computer systems
|
| Subjects: | |
| Physical Description: | 301 S. |
| ISBN: | 0262140446 |
Staff View
MARC
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Record in the Search Index
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| author_facet | Negrini, R. Sami, Mariagiovanna Stefanelli, Renato |
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| classification_rvk | ST 190 |
| ctrlnum | (OCoLC)18290085 (DE-599)BVBBV002506185 |
| dewey-full | 004.2 |
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| dewey-ones | 004 - Computer science |
| dewey-raw | 004.2 |
| dewey-search | 004.2 |
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| discipline | Informatik |
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| id | DE-604.BV002506185 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-09T15:46:02Z |
| institution | BVB |
| isbn | 0262140446 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-001614313 |
| oclc_num | 18290085 |
| open_access_boolean | |
| owner | DE-12 DE-739 DE-83 DE-11 |
| owner_facet | DE-12 DE-739 DE-83 DE-11 |
| physical | 301 S. |
| publishDate | 1989 |
| publishDateSearch | 1989 |
| publishDateSort | 1989 |
| publisher | MIT Pr. |
| record_format | marc |
| series2 | MIT Press series in computer systems |
| spelling | Negrini, R. Verfasser aut Fault-tolerance through reconfiguration of VLSI and WSI arrays R. Negrini ; M. G. Sami ; R. Stefanelli Cambridge, Mass. u.a. MIT Pr. 1989 301 S. txt rdacontent n rdamedia nc rdacarrier MIT Press series in computer systems Integrated circuits Fault tolerance Integrated circuits Very large scale integration Integrated circuits Wafer-scale integration Wafer-Integration (DE-588)4226609-9 gnd rswk-swf VLSI (DE-588)4117388-0 gnd rswk-swf Fehlertoleranz (DE-588)4123192-2 gnd rswk-swf Fehlertoleranz (DE-588)4123192-2 s VLSI (DE-588)4117388-0 s DE-604 Wafer-Integration (DE-588)4226609-9 s Sami, Mariagiovanna Verfasser aut Stefanelli, Renato Verfasser aut |
| spellingShingle | Negrini, R. Sami, Mariagiovanna Stefanelli, Renato Fault-tolerance through reconfiguration of VLSI and WSI arrays Integrated circuits Fault tolerance Integrated circuits Very large scale integration Integrated circuits Wafer-scale integration Wafer-Integration (DE-588)4226609-9 gnd VLSI (DE-588)4117388-0 gnd Fehlertoleranz (DE-588)4123192-2 gnd |
| subject_GND | (DE-588)4226609-9 (DE-588)4117388-0 (DE-588)4123192-2 |
| title | Fault-tolerance through reconfiguration of VLSI and WSI arrays |
| title_auth | Fault-tolerance through reconfiguration of VLSI and WSI arrays |
| title_exact_search | Fault-tolerance through reconfiguration of VLSI and WSI arrays |
| title_full | Fault-tolerance through reconfiguration of VLSI and WSI arrays R. Negrini ; M. G. Sami ; R. Stefanelli |
| title_fullStr | Fault-tolerance through reconfiguration of VLSI and WSI arrays R. Negrini ; M. G. Sami ; R. Stefanelli |
| title_full_unstemmed | Fault-tolerance through reconfiguration of VLSI and WSI arrays R. Negrini ; M. G. Sami ; R. Stefanelli |
| title_short | Fault-tolerance through reconfiguration of VLSI and WSI arrays |
| title_sort | fault tolerance through reconfiguration of vlsi and wsi arrays |
| topic | Integrated circuits Fault tolerance Integrated circuits Very large scale integration Integrated circuits Wafer-scale integration Wafer-Integration (DE-588)4226609-9 gnd VLSI (DE-588)4117388-0 gnd Fehlertoleranz (DE-588)4123192-2 gnd |
| topic_facet | Integrated circuits Fault tolerance Integrated circuits Very large scale integration Integrated circuits Wafer-scale integration Wafer-Integration VLSI Fehlertoleranz |
| work_keys_str_mv | AT negrinir faulttolerancethroughreconfigurationofvlsiandwsiarrays AT samimariagiovanna faulttolerancethroughreconfigurationofvlsiandwsiarrays AT stefanellirenato faulttolerancethroughreconfigurationofvlsiandwsiarrays |