Semiconductor device measurements: Significant contributions by John Temlin, Lee Miles, Ed Smith
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Buch |
| Sprache: | Undetermined |
| Veröffentlicht: |
Beaverton, Or.
Tektronix
1969
|
| Ausgabe: | 1. ed.,3.print. |
| Schriftenreihe: | Measurement concepts.
|
| Beschreibung: | 156 S. |
Internformat
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| 100 | 1 | |a Mulvey, John |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a Semiconductor device measurements |b Significant contributions by John Temlin, Lee Miles, Ed Smith |
| 250 | |a 1. ed.,3.print. | ||
| 264 | 1 | |a Beaverton, Or. |b Tektronix |c 1969 | |
| 300 | |a 156 S. | ||
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| 338 | |b nc |2 rdacarrier | ||
| 490 | 0 | |a Measurement concepts. | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-001498230 | ||
Datensatz im Suchindex
| _version_ | 1804116738662465536 |
|---|---|
| any_adam_object | |
| author | Mulvey, John |
| author_facet | Mulvey, John |
| author_role | aut |
| author_sort | Mulvey, John |
| author_variant | j m jm |
| building | Verbundindex |
| bvnumber | BV002280045 |
| ctrlnum | (OCoLC)630484672 (DE-599)BVBBV002280045 |
| edition | 1. ed.,3.print. |
| format | Book |
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| id | DE-604.BV002280045 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-09T15:43:17Z |
| institution | BVB |
| language | Undetermined |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-001498230 |
| oclc_num | 630484672 |
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| owner_facet | DE-91 DE-BY-TUM |
| physical | 156 S. |
| publishDate | 1969 |
| publishDateSearch | 1969 |
| publishDateSort | 1969 |
| publisher | Tektronix |
| record_format | marc |
| series2 | Measurement concepts. |
| spelling | Mulvey, John Verfasser aut Semiconductor device measurements Significant contributions by John Temlin, Lee Miles, Ed Smith 1. ed.,3.print. Beaverton, Or. Tektronix 1969 156 S. txt rdacontent n rdamedia nc rdacarrier Measurement concepts. |
| spellingShingle | Mulvey, John Semiconductor device measurements Significant contributions by John Temlin, Lee Miles, Ed Smith |
| title | Semiconductor device measurements Significant contributions by John Temlin, Lee Miles, Ed Smith |
| title_auth | Semiconductor device measurements Significant contributions by John Temlin, Lee Miles, Ed Smith |
| title_exact_search | Semiconductor device measurements Significant contributions by John Temlin, Lee Miles, Ed Smith |
| title_full | Semiconductor device measurements Significant contributions by John Temlin, Lee Miles, Ed Smith |
| title_fullStr | Semiconductor device measurements Significant contributions by John Temlin, Lee Miles, Ed Smith |
| title_full_unstemmed | Semiconductor device measurements Significant contributions by John Temlin, Lee Miles, Ed Smith |
| title_short | Semiconductor device measurements |
| title_sort | semiconductor device measurements significant contributions by john temlin lee miles ed smith |
| title_sub | Significant contributions by John Temlin, Lee Miles, Ed Smith |
| work_keys_str_mv | AT mulveyjohn semiconductordevicemeasurementssignificantcontributionsbyjohntemlinleemilesedsmith |