EXAFS: basic principles and data analysis
Saved in:
| Main Author: | |
|---|---|
| Format: | Book |
| Language: | English |
| Published: |
Berlin u.a.
Springer
1986
|
| Series: | Inorganic chemistry concepts
9 |
| Subjects: | |
| Item Description: | Literaturverz. S. [223]-284 |
| Physical Description: | XVIII, 349 S. graph. Darst. |
| ISBN: | 3540158332 0387158332 |
Staff View
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| 100 | 1 | |a Teo, Boon K. |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a EXAFS |b basic principles and data analysis |c Boon K. Teo |
| 264 | 1 | |a Berlin u.a. |b Springer |c 1986 | |
| 300 | |a XVIII, 349 S. |b graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 490 | 1 | |a Inorganic chemistry concepts |v 9 | |
| 500 | |a Literaturverz. S. [223]-284 | ||
| 650 | 4 | |a Extended X-ray absorption fine structure | |
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Record in the Search Index
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| author | Teo, Boon K. |
| author_facet | Teo, Boon K. |
| author_role | aut |
| author_sort | Teo, Boon K. |
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| building | Verbundindex |
| bvnumber | BV002272624 |
| callnumber-first | Q - Science |
| callnumber-label | QC482 |
| callnumber-raw | QC482.S6 |
| callnumber-search | QC482.S6 |
| callnumber-sort | QC 3482 S6 |
| callnumber-subject | QC - Physics |
| classification_rvk | UP 9310 UQ 5600 VG 8970 |
| classification_tum | PHY 782f |
| ctrlnum | (OCoLC)13122030 (DE-599)BVBBV002272624 |
| dewey-full | 539.7/222 |
| dewey-hundreds | 500 - Natural sciences and mathematics |
| dewey-ones | 539 - Modern physics |
| dewey-raw | 539.7/222 |
| dewey-search | 539.7/222 |
| dewey-sort | 3539.7 3222 |
| dewey-tens | 530 - Physics |
| discipline | Chemie / Pharmazie Physik |
| format | Book |
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| id | DE-604.BV002272624 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T15:43:09Z |
| institution | BVB |
| isbn | 3540158332 0387158332 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-001493180 |
| oclc_num | 13122030 |
| open_access_boolean | |
| owner | DE-384 DE-703 DE-355 DE-BY-UBR DE-20 DE-29T DE-19 DE-BY-UBM DE-83 DE-11 DE-188 |
| owner_facet | DE-384 DE-703 DE-355 DE-BY-UBR DE-20 DE-29T DE-19 DE-BY-UBM DE-83 DE-11 DE-188 |
| physical | XVIII, 349 S. graph. Darst. |
| publishDate | 1986 |
| publishDateSearch | 1986 |
| publishDateSort | 1986 |
| publisher | Springer |
| record_format | marc |
| series | Inorganic chemistry concepts |
| series2 | Inorganic chemistry concepts |
| spelling | Teo, Boon K. Verfasser aut EXAFS basic principles and data analysis Boon K. Teo Berlin u.a. Springer 1986 XVIII, 349 S. graph. Darst. txt rdacontent n rdamedia nc rdacarrier Inorganic chemistry concepts 9 Literaturverz. S. [223]-284 Extended X-ray absorption fine structure EXAFS (DE-588)4015942-5 gnd rswk-swf Röntgenabsorptionsfeinstruktur (DE-588)4178302-5 gnd rswk-swf Röntgenabsorptionsfeinstruktur (DE-588)4178302-5 s DE-604 EXAFS (DE-588)4015942-5 s Inorganic chemistry concepts 9 (DE-604)BV001891846 9 |
| spellingShingle | Teo, Boon K. EXAFS basic principles and data analysis Inorganic chemistry concepts Extended X-ray absorption fine structure EXAFS (DE-588)4015942-5 gnd Röntgenabsorptionsfeinstruktur (DE-588)4178302-5 gnd |
| subject_GND | (DE-588)4015942-5 (DE-588)4178302-5 |
| title | EXAFS basic principles and data analysis |
| title_auth | EXAFS basic principles and data analysis |
| title_exact_search | EXAFS basic principles and data analysis |
| title_full | EXAFS basic principles and data analysis Boon K. Teo |
| title_fullStr | EXAFS basic principles and data analysis Boon K. Teo |
| title_full_unstemmed | EXAFS basic principles and data analysis Boon K. Teo |
| title_short | EXAFS |
| title_sort | exafs basic principles and data analysis |
| title_sub | basic principles and data analysis |
| topic | Extended X-ray absorption fine structure EXAFS (DE-588)4015942-5 gnd Röntgenabsorptionsfeinstruktur (DE-588)4178302-5 gnd |
| topic_facet | Extended X-ray absorption fine structure EXAFS Röntgenabsorptionsfeinstruktur |
| volume_link | (DE-604)BV001891846 |
| work_keys_str_mv | AT teoboonk exafsbasicprinciplesanddataanalysis |