The physics of SiO2 and its interfaces: Proceedings of the ... held at the IMB Thomas J. Watson Research Center, Yorktown Heights, New York, March 22-24, 1978
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Bibliographic Details
Format: Conference Proceeding Book
Language:Undetermined
Published: New York Pergamon Pr. 1978
Subjects:
Physical Description:XI, 488 S. graph. Darst.
ISBN:0080230490

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Interlibrary loan Place Request Caution: Not in THWS collection!