The application of electron microscopy to materials science: proceedings of an international workshop, held in China, Gauonzhou, August 1988
Saved in:
| Format: | Book |
|---|---|
| Language: | English |
| Published: |
Vaduz
Sci-Tech Publ.
1989
|
| Series: | Diffusion and defect data
Part B, Solid state phenomena ; 5 |
| Subjects: | |
| Item Description: | Nebent.: Electron microscopy. - Literaturangaben |
| Physical Description: | 209 S. Ill., graph. Darst. |
| ISBN: | 3908044014 |
Staff View
MARC
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| 245 | 1 | 0 | |a The application of electron microscopy to materials science |b proceedings of an international workshop, held in China, Gauonzhou, August 1988 |c ed.: K. H. Kuo |
| 246 | 1 | 3 | |a Electron microscopy |
| 264 | 1 | |a Vaduz |b Sci-Tech Publ. |c 1989 | |
| 300 | |a 209 S. |b Ill., graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 490 | 1 | |a Diffusion and defect data : Part B, Solid state phenomena |v 5 | |
| 500 | |a Nebent.: Electron microscopy. - Literaturangaben | ||
| 650 | 4 | |a Electron microscopy |v Congresses | |
| 650 | 4 | |a Materials |v Congresses | |
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Record in the Search Index
| _version_ | 1804116674362736640 |
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| building | Verbundindex |
| bvnumber | BV002219932 |
| callnumber-first | Q - Science |
| callnumber-label | QH212 |
| callnumber-raw | QH212.E4 |
| callnumber-search | QH212.E4 |
| callnumber-sort | QH 3212 E4 |
| callnumber-subject | QH - Natural History and Biology |
| classification_rvk | UH 6300 |
| classification_tum | WER 770f |
| ctrlnum | (OCoLC)21003019 (DE-599)BVBBV002219932 |
| dewey-full | 541.3 |
| dewey-hundreds | 500 - Natural sciences and mathematics |
| dewey-ones | 541 - Physical chemistry |
| dewey-raw | 541.3 |
| dewey-search | 541.3 |
| dewey-sort | 3541.3 |
| dewey-tens | 540 - Chemistry and allied sciences |
| discipline | Chemie / Pharmazie Physik Werkstoffwissenschaften |
| format | Book |
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| genre | (DE-588)1071861417 Konferenzschrift 1988 Gauonzhou gnd-content |
| genre_facet | Konferenzschrift 1988 Gauonzhou |
| id | DE-604.BV002219932 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T15:42:16Z |
| institution | BVB |
| isbn | 3908044014 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-001457998 |
| oclc_num | 21003019 |
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| owner_facet | DE-91 DE-BY-TUM DE-355 DE-BY-UBR DE-706 DE-188 |
| physical | 209 S. Ill., graph. Darst. |
| publishDate | 1989 |
| publishDateSearch | 1989 |
| publishDateSort | 1989 |
| publisher | Sci-Tech Publ. |
| record_format | marc |
| series | Diffusion and defect data |
| series2 | Diffusion and defect data : Part B, Solid state phenomena |
| spelling | The application of electron microscopy to materials science proceedings of an international workshop, held in China, Gauonzhou, August 1988 ed.: K. H. Kuo Electron microscopy Vaduz Sci-Tech Publ. 1989 209 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Diffusion and defect data : Part B, Solid state phenomena 5 Nebent.: Electron microscopy. - Literaturangaben Electron microscopy Congresses Materials Congresses Elektronenmikroskopie (DE-588)4014327-2 gnd rswk-swf Werkstoffkunde (DE-588)4079184-1 gnd rswk-swf (DE-588)1071861417 Konferenzschrift 1988 Gauonzhou gnd-content Elektronenmikroskopie (DE-588)4014327-2 s Werkstoffkunde (DE-588)4079184-1 s DE-604 Guo, Kexin Sonstige oth Diffusion and defect data Part B, Solid state phenomena ; 5 (DE-604)BV021637351 5 |
| spellingShingle | The application of electron microscopy to materials science proceedings of an international workshop, held in China, Gauonzhou, August 1988 Diffusion and defect data Electron microscopy Congresses Materials Congresses Elektronenmikroskopie (DE-588)4014327-2 gnd Werkstoffkunde (DE-588)4079184-1 gnd |
| subject_GND | (DE-588)4014327-2 (DE-588)4079184-1 (DE-588)1071861417 |
| title | The application of electron microscopy to materials science proceedings of an international workshop, held in China, Gauonzhou, August 1988 |
| title_alt | Electron microscopy |
| title_auth | The application of electron microscopy to materials science proceedings of an international workshop, held in China, Gauonzhou, August 1988 |
| title_exact_search | The application of electron microscopy to materials science proceedings of an international workshop, held in China, Gauonzhou, August 1988 |
| title_full | The application of electron microscopy to materials science proceedings of an international workshop, held in China, Gauonzhou, August 1988 ed.: K. H. Kuo |
| title_fullStr | The application of electron microscopy to materials science proceedings of an international workshop, held in China, Gauonzhou, August 1988 ed.: K. H. Kuo |
| title_full_unstemmed | The application of electron microscopy to materials science proceedings of an international workshop, held in China, Gauonzhou, August 1988 ed.: K. H. Kuo |
| title_short | The application of electron microscopy to materials science |
| title_sort | the application of electron microscopy to materials science proceedings of an international workshop held in china gauonzhou august 1988 |
| title_sub | proceedings of an international workshop, held in China, Gauonzhou, August 1988 |
| topic | Electron microscopy Congresses Materials Congresses Elektronenmikroskopie (DE-588)4014327-2 gnd Werkstoffkunde (DE-588)4079184-1 gnd |
| topic_facet | Electron microscopy Congresses Materials Congresses Elektronenmikroskopie Werkstoffkunde Konferenzschrift 1988 Gauonzhou |
| volume_link | (DE-604)BV021637351 |
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