X-ray calibration: techn., sources and detectors ; 19 - 20 Aug. 1986, San Diego, Calif.
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Bibliographic Details
Format: Book
Language:Undetermined
Published: Washington, USA SPIE 1986
Series:International Society for Optical Engineering: Proceedings of SPIE. 689.
Subjects:
Item Description:Literaturangaben
Physical Description:VI, 254 S. Ill., graph. Darst.
ISBN:0892527242

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