Optical testing and metrology: 3 - 6 June 1986, Québec City, Canada
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Bibliographic Details
Format: Book
Language:English
Published: Bellingham, Wash., USA SPIE 1986
Series:International Society for Optical Engineering: Proceedings of SPIE. 661.
Subjects:
Item Description:Literaturangaben
Physical Description:VIII, 428 S. Ill., graph. Darst.
ISBN:0892526963

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