Fault tolerant and fault testable hardware design:
Saved in:
| Main Author: | |
|---|---|
| Format: | Book |
| Language: | English |
| Published: |
Englewood Cliffs, NJ
Prentice-Hall
1985
|
| Subjects: | |
| Item Description: | Literaturangaben |
| Physical Description: | XIV, 263 S. graph. Darst. |
| ISBN: | 0133082482 |
Staff View
MARC
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Record in the Search Index
| _version_ | 1804116568165056512 |
|---|---|
| any_adam_object | |
| author | Lala, Parag K. |
| author_facet | Lala, Parag K. |
| author_role | aut |
| author_sort | Lala, Parag K. |
| author_variant | p k l pk pkl |
| building | Verbundindex |
| bvnumber | BV002114207 |
| callnumber-first | Q - Science |
| callnumber-label | QA76 |
| callnumber-raw | QA76.9.F38 TK7888.3 |
| callnumber-search | QA76.9.F38 TK7888.3 |
| callnumber-sort | QA 276.9 F38 |
| callnumber-subject | QA - Mathematics |
| classification_rvk | ST 150 |
| classification_tum | DAT 286f |
| ctrlnum | (OCoLC)10727078 (DE-599)BVBBV002114207 |
| dewey-full | 621.3819/583 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 621 - Applied physics |
| dewey-raw | 621.3819/583 |
| dewey-search | 621.3819/583 |
| dewey-sort | 3621.3819 3583 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Informatik Elektrotechnik / Elektronik / Nachrichtentechnik |
| format | Book |
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| id | DE-604.BV002114207 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T15:40:34Z |
| institution | BVB |
| isbn | 0133082482 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-001386644 |
| oclc_num | 10727078 |
| open_access_boolean | |
| owner | DE-91 DE-BY-TUM DE-91G DE-BY-TUM DE-384 DE-739 DE-29T DE-20 |
| owner_facet | DE-91 DE-BY-TUM DE-91G DE-BY-TUM DE-384 DE-739 DE-29T DE-20 |
| physical | XIV, 263 S. graph. Darst. |
| publishDate | 1985 |
| publishDateSearch | 1985 |
| publishDateSort | 1985 |
| publisher | Prentice-Hall |
| record_format | marc |
| spelling | Lala, Parag K. Verfasser aut Fault tolerant and fault testable hardware design Parag K. Lala Englewood Cliffs, NJ Prentice-Hall 1985 XIV, 263 S. graph. Darst. txt rdacontent n rdamedia nc rdacarrier Literaturangaben Ordinateurs - Fiabilité Tolérance aux fautes (Informatique) VLSI inriac autotest inriac code correcteur erreur inriac conception matériel inriac fiabilité inriac génération test inriac matériel inriac réseau logique programmable inriac test circuit inriac test erreur inriac testabilité inriac tolérance panne inriac Electronic digital computers Reliability Fault-tolerant computing Computerarchitektur (DE-588)4048717-9 gnd rswk-swf Fehlertoleranz (DE-588)4123192-2 gnd rswk-swf Zuverlässigkeit (DE-588)4059245-5 gnd rswk-swf Hardware (DE-588)4023422-8 gnd rswk-swf Hardware (DE-588)4023422-8 s Fehlertoleranz (DE-588)4123192-2 s DE-604 Computerarchitektur (DE-588)4048717-9 s Zuverlässigkeit (DE-588)4059245-5 s |
| spellingShingle | Lala, Parag K. Fault tolerant and fault testable hardware design Ordinateurs - Fiabilité Tolérance aux fautes (Informatique) VLSI inriac autotest inriac code correcteur erreur inriac conception matériel inriac fiabilité inriac génération test inriac matériel inriac réseau logique programmable inriac test circuit inriac test erreur inriac testabilité inriac tolérance panne inriac Electronic digital computers Reliability Fault-tolerant computing Computerarchitektur (DE-588)4048717-9 gnd Fehlertoleranz (DE-588)4123192-2 gnd Zuverlässigkeit (DE-588)4059245-5 gnd Hardware (DE-588)4023422-8 gnd |
| subject_GND | (DE-588)4048717-9 (DE-588)4123192-2 (DE-588)4059245-5 (DE-588)4023422-8 |
| title | Fault tolerant and fault testable hardware design |
| title_auth | Fault tolerant and fault testable hardware design |
| title_exact_search | Fault tolerant and fault testable hardware design |
| title_full | Fault tolerant and fault testable hardware design Parag K. Lala |
| title_fullStr | Fault tolerant and fault testable hardware design Parag K. Lala |
| title_full_unstemmed | Fault tolerant and fault testable hardware design Parag K. Lala |
| title_short | Fault tolerant and fault testable hardware design |
| title_sort | fault tolerant and fault testable hardware design |
| topic | Ordinateurs - Fiabilité Tolérance aux fautes (Informatique) VLSI inriac autotest inriac code correcteur erreur inriac conception matériel inriac fiabilité inriac génération test inriac matériel inriac réseau logique programmable inriac test circuit inriac test erreur inriac testabilité inriac tolérance panne inriac Electronic digital computers Reliability Fault-tolerant computing Computerarchitektur (DE-588)4048717-9 gnd Fehlertoleranz (DE-588)4123192-2 gnd Zuverlässigkeit (DE-588)4059245-5 gnd Hardware (DE-588)4023422-8 gnd |
| topic_facet | Ordinateurs - Fiabilité Tolérance aux fautes (Informatique) VLSI autotest code correcteur erreur conception matériel fiabilité génération test matériel réseau logique programmable test circuit test erreur testabilité tolérance panne Electronic digital computers Reliability Fault-tolerant computing Computerarchitektur Fehlertoleranz Zuverlässigkeit Hardware |
| work_keys_str_mv | AT lalaparagk faulttolerantandfaulttestablehardwaredesign |