Zur Bestimmung minimaler bedingter Stichprobenpläne für die Gut-Schlecht-Prüfung:
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Bibliographic Details
Main Author: Vaerst, Rembert (Author)
Format: Book
Language:German
Published: Siegen 1981
Subjects:
Item Description:Siegen, Univ., Diss., 1981
Physical Description:145 S. graph. Darst.

There is no print copy available.

Interlibrary loan Place Request Caution: Not in THWS collection!