Electron probe microanalysis:
Gespeichert in:
Format: | Buch |
---|---|
Sprache: | English |
Veröffentlicht: |
New York
Acad. Press
1969
|
Schriftenreihe: | Advances in electronics and electron physics
Supplement ; 6 |
Schlagworte: | |
Beschreibung: | XII, 450 S. Ill., graph. Darst. |
Internformat
MARC
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245 | 1 | 0 | |a Electron probe microanalysis |c ed. by A. J. Tousimis |
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300 | |a XII, 450 S. |b Ill., graph. Darst. | ||
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490 | 1 | |a Advances in electronics and electron physics : Supplement |v 6 | |
650 | 0 | 7 | |a Elektronenstrahlmikroanalyse |0 (DE-588)4151898-6 |2 gnd |9 rswk-swf |
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700 | 1 | |a Tousimis, A. J. |e Sonstige |4 oth | |
830 | 0 | |a Advances in electronics and electron physics |v Supplement ; 6 |w (DE-604)BV001889378 |9 6 | |
999 | |a oai:aleph.bib-bvb.de:BVB01-001306076 |
Datensatz im Suchindex
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any_adam_object | |
building | Verbundindex |
bvnumber | BV002002189 |
classification_rvk | UH 5090 |
ctrlnum | (OCoLC)441943113 (OCoLC)604036106 (DE-599)BVBBV002002189 |
discipline | Physik |
format | Book |
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genre_facet | Aufsatzsammlung Konferenzschrift |
id | DE-604.BV002002189 |
illustrated | Illustrated |
indexdate | 2024-07-09T15:38:42Z |
institution | BVB |
language | English |
oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-001306076 |
oclc_num | 441943113 604036106 |
open_access_boolean | |
owner | DE-91 DE-BY-TUM DE-29T DE-703 DE-20 DE-83 DE-11 DE-210 DE-706 DE-188 |
owner_facet | DE-91 DE-BY-TUM DE-29T DE-703 DE-20 DE-83 DE-11 DE-210 DE-706 DE-188 |
physical | XII, 450 S. Ill., graph. Darst. |
publishDate | 1969 |
publishDateSearch | 1969 |
publishDateSort | 1969 |
publisher | Acad. Press |
record_format | marc |
series | Advances in electronics and electron physics |
series2 | Advances in electronics and electron physics : Supplement |
spelling | Electron probe microanalysis ed. by A. J. Tousimis New York Acad. Press 1969 XII, 450 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Advances in electronics and electron physics : Supplement 6 Elektronenstrahlmikroanalyse (DE-588)4151898-6 gnd rswk-swf (DE-588)4143413-4 Aufsatzsammlung gnd-content (DE-588)1071861417 Konferenzschrift gnd-content Elektronenstrahlmikroanalyse (DE-588)4151898-6 s DE-604 Tousimis, A. J. Sonstige oth Advances in electronics and electron physics Supplement ; 6 (DE-604)BV001889378 6 |
spellingShingle | Electron probe microanalysis Advances in electronics and electron physics Elektronenstrahlmikroanalyse (DE-588)4151898-6 gnd |
subject_GND | (DE-588)4151898-6 (DE-588)4143413-4 (DE-588)1071861417 |
title | Electron probe microanalysis |
title_auth | Electron probe microanalysis |
title_exact_search | Electron probe microanalysis |
title_full | Electron probe microanalysis ed. by A. J. Tousimis |
title_fullStr | Electron probe microanalysis ed. by A. J. Tousimis |
title_full_unstemmed | Electron probe microanalysis ed. by A. J. Tousimis |
title_short | Electron probe microanalysis |
title_sort | electron probe microanalysis |
topic | Elektronenstrahlmikroanalyse (DE-588)4151898-6 gnd |
topic_facet | Elektronenstrahlmikroanalyse Aufsatzsammlung Konferenzschrift |
volume_link | (DE-604)BV001889378 |
work_keys_str_mv | AT tousimisaj electronprobemicroanalysis |