Defect analysis in electron microscopy:
Saved in:
| Main Authors: | , |
|---|---|
| Format: | Book |
| Language: | English |
| Published: |
London
Chapman and Hall
1975
|
| Edition: | 1. publ. |
| Series: | Science paperbacks.
|
| Subjects: | |
| Physical Description: | IX, 134 S. Ill. u. graph. Darst. |
Staff View
MARC
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| 650 | 4 | |a Crystals |x Defects | |
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Record in the Search Index
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| author | Loretto, Michael H. Smallman, Raymond E. |
| author_GND | (DE-588)132011123 |
| author_facet | Loretto, Michael H. Smallman, Raymond E. |
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| bvnumber | BV001971699 |
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| ctrlnum | (OCoLC)1582682 (DE-599)BVBBV001971699 |
| dewey-full | 548/.84 548/.81 |
| dewey-hundreds | 500 - Natural sciences and mathematics |
| dewey-ones | 548 - Crystallography |
| dewey-raw | 548/.84 548/.81 |
| dewey-search | 548/.84 548/.81 |
| dewey-sort | 3548 284 |
| dewey-tens | 540 - Chemistry and allied sciences |
| discipline | Chemie / Pharmazie |
| edition | 1. publ. |
| format | Book |
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| id | DE-604.BV001971699 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T15:38:09Z |
| institution | BVB |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-001285978 |
| oclc_num | 1582682 |
| open_access_boolean | |
| owner | DE-91 DE-BY-TUM |
| owner_facet | DE-91 DE-BY-TUM |
| physical | IX, 134 S. Ill. u. graph. Darst. |
| publishDate | 1975 |
| publishDateSearch | 1975 |
| publishDateSort | 1975 |
| publisher | Chapman and Hall |
| record_format | marc |
| series2 | Science paperbacks. |
| spelling | Loretto, Michael H. Verfasser (DE-588)132011123 aut Defect analysis in electron microscopy Michael H. Loretto ; Raymond Edward Smallman* 1. publ. London Chapman and Hall 1975 IX, 134 S. Ill. u. graph. Darst. txt rdacontent n rdamedia nc rdacarrier Science paperbacks. Crystals Defects Electron microscopy Gitterbaufehler (DE-588)4125030-8 gnd rswk-swf Elektronenmikroskopie (DE-588)4014327-2 gnd rswk-swf Gitterbaufehler (DE-588)4125030-8 s 1\p DE-604 Elektronenmikroskopie (DE-588)4014327-2 s 2\p DE-604 Smallman, Raymond E. Verfasser aut 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 2\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | Loretto, Michael H. Smallman, Raymond E. Defect analysis in electron microscopy Crystals Defects Electron microscopy Gitterbaufehler (DE-588)4125030-8 gnd Elektronenmikroskopie (DE-588)4014327-2 gnd |
| subject_GND | (DE-588)4125030-8 (DE-588)4014327-2 |
| title | Defect analysis in electron microscopy |
| title_auth | Defect analysis in electron microscopy |
| title_exact_search | Defect analysis in electron microscopy |
| title_full | Defect analysis in electron microscopy Michael H. Loretto ; Raymond Edward Smallman* |
| title_fullStr | Defect analysis in electron microscopy Michael H. Loretto ; Raymond Edward Smallman* |
| title_full_unstemmed | Defect analysis in electron microscopy Michael H. Loretto ; Raymond Edward Smallman* |
| title_short | Defect analysis in electron microscopy |
| title_sort | defect analysis in electron microscopy |
| topic | Crystals Defects Electron microscopy Gitterbaufehler (DE-588)4125030-8 gnd Elektronenmikroskopie (DE-588)4014327-2 gnd |
| topic_facet | Crystals Defects Electron microscopy Gitterbaufehler Elektronenmikroskopie |
| work_keys_str_mv | AT lorettomichaelh defectanalysisinelectronmicroscopy AT smallmanraymonde defectanalysisinelectronmicroscopy |