Holdings: Practical scanning electron microscopy

Practical scanning electron microscopy: electron and ion microprobe analysis

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Bibliographic Details
Format:	Book
Language:	English
Published:	New York Plenum Pr. 1975
Subjects:	Analyse par microsonde Microscopes électroniques à balayage Microscopia Electron Probe Microanalysis Microprobe analysis Microscopy, Electron, Scanning Scanning electron microscopy Elektronenstrahlmikroanalyse Material Messtechnik Rasterelektronenmikroskopie Elektronenoptik Elektronenmikroskopie
Physical Description:	XVIII, 582 S. zahlr. Ill. u. graph. Darst.

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MARC


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Record in the Search Index

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discipline	Allgemeine Naturwissenschaft Physik Chemie
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id	DE-604.BV001967792
illustrated	Illustrated
indexdate	2024-07-09T15:38:05Z
institution	BVB
language	English
oai_aleph_id	oai:aleph.bib-bvb.de:BVB01-001283332
oclc_num	1174600
open_access_boolean
owner	DE-91G DE-BY-TUM DE-703 DE-355 DE-BY-UBR DE-29T DE-20 DE-91 DE-BY-TUM
owner_facet	DE-91G DE-BY-TUM DE-703 DE-355 DE-BY-UBR DE-29T DE-20 DE-91 DE-BY-TUM
physical	XVIII, 582 S. zahlr. Ill. u. graph. Darst.
publishDate	1975
publishDateSearch	1975
publishDateSort	1975
publisher	Plenum Pr.
record_format	marc
spelling	Practical scanning electron microscopy electron and ion microprobe analysis ed. by Joseph I. Goldstein New York Plenum Pr. 1975 XVIII, 582 S. zahlr. Ill. u. graph. Darst. txt rdacontent n rdamedia nc rdacarrier Analyse par microsonde Microscopes électroniques à balayage Microscopia larpcal Electron Probe Microanalysis Microprobe analysis Microscopy, Electron, Scanning Scanning electron microscopy Elektronenstrahlmikroanalyse (DE-588)4151898-6 gnd rswk-swf Material (DE-588)4169078-3 gnd rswk-swf Messtechnik (DE-588)4114575-6 gnd rswk-swf Rasterelektronenmikroskopie (DE-588)4048455-5 gnd rswk-swf Elektronenoptik (DE-588)4151879-2 gnd rswk-swf Elektronenmikroskopie (DE-588)4014327-2 gnd rswk-swf Rasterelektronenmikroskopie (DE-588)4048455-5 s DE-604 Elektronenstrahlmikroanalyse (DE-588)4151898-6 s 1\p DE-604 Elektronenoptik (DE-588)4151879-2 s 2\p DE-604 Material (DE-588)4169078-3 s 3\p DE-604 Elektronenmikroskopie (DE-588)4014327-2 s 4\p DE-604 Messtechnik (DE-588)4114575-6 s 5\p DE-604 Goldstein, Joseph 1939-2015 Sonstige (DE-588)1023852381 oth 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 2\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 3\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 4\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 5\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk
spellingShingle	Practical scanning electron microscopy electron and ion microprobe analysis Analyse par microsonde Microscopes électroniques à balayage Microscopia larpcal Electron Probe Microanalysis Microprobe analysis Microscopy, Electron, Scanning Scanning electron microscopy Elektronenstrahlmikroanalyse (DE-588)4151898-6 gnd Material (DE-588)4169078-3 gnd Messtechnik (DE-588)4114575-6 gnd Rasterelektronenmikroskopie (DE-588)4048455-5 gnd Elektronenoptik (DE-588)4151879-2 gnd Elektronenmikroskopie (DE-588)4014327-2 gnd
subject_GND	(DE-588)4151898-6 (DE-588)4169078-3 (DE-588)4114575-6 (DE-588)4048455-5 (DE-588)4151879-2 (DE-588)4014327-2
title	Practical scanning electron microscopy electron and ion microprobe analysis
title_auth	Practical scanning electron microscopy electron and ion microprobe analysis
title_exact_search	Practical scanning electron microscopy electron and ion microprobe analysis
title_full	Practical scanning electron microscopy electron and ion microprobe analysis ed. by Joseph I. Goldstein
title_fullStr	Practical scanning electron microscopy electron and ion microprobe analysis ed. by Joseph I. Goldstein
title_full_unstemmed	Practical scanning electron microscopy electron and ion microprobe analysis ed. by Joseph I. Goldstein
title_short	Practical scanning electron microscopy
title_sort	practical scanning electron microscopy electron and ion microprobe analysis
title_sub	electron and ion microprobe analysis
topic	Analyse par microsonde Microscopes électroniques à balayage Microscopia larpcal Electron Probe Microanalysis Microprobe analysis Microscopy, Electron, Scanning Scanning electron microscopy Elektronenstrahlmikroanalyse (DE-588)4151898-6 gnd Material (DE-588)4169078-3 gnd Messtechnik (DE-588)4114575-6 gnd Rasterelektronenmikroskopie (DE-588)4048455-5 gnd Elektronenoptik (DE-588)4151879-2 gnd Elektronenmikroskopie (DE-588)4014327-2 gnd
topic_facet	Analyse par microsonde Microscopes électroniques à balayage Microscopia Electron Probe Microanalysis Microprobe analysis Microscopy, Electron, Scanning Scanning electron microscopy Elektronenstrahlmikroanalyse Material Messtechnik Rasterelektronenmikroskopie Elektronenoptik Elektronenmikroskopie
work_keys_str_mv	AT goldsteinjoseph practicalscanningelectronmicroscopyelectronandionmicroprobeanalysis

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