Grundlagen und Anwendung der Röntgen-Feinstruktur-Analyse:
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Buch |
| Sprache: | German |
| Veröffentlicht: |
München
Oldenbourg
1959
|
| Schlagworte: | |
| Beschreibung: | Literaturverzeichnis Seiten [426]-437 |
| Beschreibung: | 447 Seiten Illustrationen, Diagramme |
Internformat
MARC
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| 245 | 1 | 0 | |a Grundlagen und Anwendung der Röntgen-Feinstruktur-Analyse |c von Dr. rer. nat. Hans Neff, Laboratoriumsvorstand im Wernerwerk für Meßtechnik der Siemens & Halske Aktiengesellschaft |
| 246 | 1 | 3 | |a Grundlagen und Anwendung der Röntgenfeinstrukturanalyse |
| 264 | 1 | |a München |b Oldenbourg |c 1959 | |
| 300 | |a 447 Seiten |b Illustrationen, Diagramme | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 500 | |a Literaturverzeichnis Seiten [426]-437 | ||
| 650 | 4 | |a X-ray crystallography | |
| 650 | 4 | |a X-rays |x Diffraction | |
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Datensatz im Suchindex
| _version_ | 1833267411913015296 |
|---|---|
| adam_text | |
| any_adam_object | |
| author | Neff, Hans 1920- |
| author_GND | (DE-588)1070045802 |
| author_facet | Neff, Hans 1920- |
| author_role | aut |
| author_sort | Neff, Hans 1920- |
| author_variant | h n hn |
| building | Verbundindex |
| bvnumber | BV001929549 |
| callnumber-first | Q - Science |
| callnumber-label | QC482 |
| callnumber-raw | QC482 |
| callnumber-search | QC482 |
| callnumber-sort | QC 3482 |
| callnumber-subject | QC - Physics |
| classification_rvk | UQ 5100 |
| ctrlnum | (OCoLC)6793715 (DE-599)BVBBV001929549 |
| dewey-full | 548.8 |
| dewey-hundreds | 500 - Natural sciences and mathematics |
| dewey-ones | 548 - Crystallography |
| dewey-raw | 548.8 |
| dewey-search | 548.8 |
| dewey-sort | 3548.8 |
| dewey-tens | 540 - Chemistry and allied sciences |
| discipline | Chemie / Pharmazie Physik |
| format | Book |
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| id | DE-604.BV001929549 |
| illustrated | Illustrated |
| indexdate | 2025-05-27T10:00:45Z |
| institution | BVB |
| language | German |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-001257616 |
| oclc_num | 6793715 |
| open_access_boolean | |
| owner | DE-91 DE-BY-TUM DE-20 DE-29 DE-29T DE-Aug4 DE-12 DE-83 DE-11 DE-188 DE-19 DE-BY-UBM DE-B1550 DE-210 DE-M490 |
| owner_facet | DE-91 DE-BY-TUM DE-20 DE-29 DE-29T DE-Aug4 DE-12 DE-83 DE-11 DE-188 DE-19 DE-BY-UBM DE-B1550 DE-210 DE-M490 |
| physical | 447 Seiten Illustrationen, Diagramme |
| psigel | TUB-nveb |
| publishDate | 1959 |
| publishDateSearch | 1959 |
| publishDateSort | 1959 |
| publisher | Oldenbourg |
| record_format | marc |
| spelling | Neff, Hans 1920- Verfasser (DE-588)1070045802 aut Grundlagen und Anwendung der Röntgen-Feinstruktur-Analyse von Dr. rer. nat. Hans Neff, Laboratoriumsvorstand im Wernerwerk für Meßtechnik der Siemens & Halske Aktiengesellschaft Grundlagen und Anwendung der Röntgenfeinstrukturanalyse München Oldenbourg 1959 447 Seiten Illustrationen, Diagramme txt rdacontent n rdamedia nc rdacarrier Literaturverzeichnis Seiten [426]-437 X-ray crystallography X-rays Diffraction Silicate (DE-588)4077444-2 gnd rswk-swf Röntgenstrahlung (DE-588)4129728-3 gnd rswk-swf Kristall (DE-588)4033209-3 gnd rswk-swf Kristallographie (DE-588)4033217-2 gnd rswk-swf Pulvermethode (DE-588)4176353-1 gnd rswk-swf Röntgenstrukturanalyse (DE-588)4137203-7 gnd rswk-swf Legierung (DE-588)4035035-6 gnd rswk-swf Kristallgitter (DE-588)4139853-1 gnd rswk-swf Röntgenfeinstrukturanalyse (DE-588)4178308-6 gnd rswk-swf Kristallchemie (DE-588)4165759-7 gnd rswk-swf Röntgenbeugung (DE-588)4178306-2 gnd rswk-swf Kristall (DE-588)4033209-3 s Röntgenbeugung (DE-588)4178306-2 s Pulvermethode (DE-588)4176353-1 s Röntgenstrukturanalyse (DE-588)4137203-7 s 1\p DE-604 Kristallographie (DE-588)4033217-2 s 2\p DE-604 Röntgenfeinstrukturanalyse (DE-588)4178308-6 s 3\p DE-604 Legierung (DE-588)4035035-6 s 4\p DE-604 Kristallgitter (DE-588)4139853-1 s 5\p DE-604 Kristallchemie (DE-588)4165759-7 s 6\p DE-604 Röntgenstrahlung (DE-588)4129728-3 s 7\p DE-604 Silicate (DE-588)4077444-2 s 8\p DE-604 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 2\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 3\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 4\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 5\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 6\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 7\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 8\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | Neff, Hans 1920- Grundlagen und Anwendung der Röntgen-Feinstruktur-Analyse X-ray crystallography X-rays Diffraction Silicate (DE-588)4077444-2 gnd Röntgenstrahlung (DE-588)4129728-3 gnd Kristall (DE-588)4033209-3 gnd Kristallographie (DE-588)4033217-2 gnd Pulvermethode (DE-588)4176353-1 gnd Röntgenstrukturanalyse (DE-588)4137203-7 gnd Legierung (DE-588)4035035-6 gnd Kristallgitter (DE-588)4139853-1 gnd Röntgenfeinstrukturanalyse (DE-588)4178308-6 gnd Kristallchemie (DE-588)4165759-7 gnd Röntgenbeugung (DE-588)4178306-2 gnd |
| subject_GND | (DE-588)4077444-2 (DE-588)4129728-3 (DE-588)4033209-3 (DE-588)4033217-2 (DE-588)4176353-1 (DE-588)4137203-7 (DE-588)4035035-6 (DE-588)4139853-1 (DE-588)4178308-6 (DE-588)4165759-7 (DE-588)4178306-2 |
| title | Grundlagen und Anwendung der Röntgen-Feinstruktur-Analyse |
| title_alt | Grundlagen und Anwendung der Röntgenfeinstrukturanalyse |
| title_auth | Grundlagen und Anwendung der Röntgen-Feinstruktur-Analyse |
| title_exact_search | Grundlagen und Anwendung der Röntgen-Feinstruktur-Analyse |
| title_full | Grundlagen und Anwendung der Röntgen-Feinstruktur-Analyse von Dr. rer. nat. Hans Neff, Laboratoriumsvorstand im Wernerwerk für Meßtechnik der Siemens & Halske Aktiengesellschaft |
| title_fullStr | Grundlagen und Anwendung der Röntgen-Feinstruktur-Analyse von Dr. rer. nat. Hans Neff, Laboratoriumsvorstand im Wernerwerk für Meßtechnik der Siemens & Halske Aktiengesellschaft |
| title_full_unstemmed | Grundlagen und Anwendung der Röntgen-Feinstruktur-Analyse von Dr. rer. nat. Hans Neff, Laboratoriumsvorstand im Wernerwerk für Meßtechnik der Siemens & Halske Aktiengesellschaft |
| title_short | Grundlagen und Anwendung der Röntgen-Feinstruktur-Analyse |
| title_sort | grundlagen und anwendung der rontgen feinstruktur analyse |
| topic | X-ray crystallography X-rays Diffraction Silicate (DE-588)4077444-2 gnd Röntgenstrahlung (DE-588)4129728-3 gnd Kristall (DE-588)4033209-3 gnd Kristallographie (DE-588)4033217-2 gnd Pulvermethode (DE-588)4176353-1 gnd Röntgenstrukturanalyse (DE-588)4137203-7 gnd Legierung (DE-588)4035035-6 gnd Kristallgitter (DE-588)4139853-1 gnd Röntgenfeinstrukturanalyse (DE-588)4178308-6 gnd Kristallchemie (DE-588)4165759-7 gnd Röntgenbeugung (DE-588)4178306-2 gnd |
| topic_facet | X-ray crystallography X-rays Diffraction Silicate Röntgenstrahlung Kristall Kristallographie Pulvermethode Röntgenstrukturanalyse Legierung Kristallgitter Röntgenfeinstrukturanalyse Kristallchemie Röntgenbeugung |
| work_keys_str_mv | AT neffhans grundlagenundanwendungderrontgenfeinstrukturanalyse |