Proceedings of IEEE Workshop on Expert Systems and Pattern Analysis: October 31, 1986, Paris, France
Gespeichert in:
Körperschaft: | |
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Format: | Tagungsbericht Buch |
Sprache: | Undetermined |
Veröffentlicht: |
Singapore u.a.
World Scientific
1987
|
Schriftenreihe: | International journal of pattern recognition and artificial intelligence
1,2 |
Schlagworte: | |
Beschreibung: | VI S., S. 178 - 302 Ill. |
Internformat
MARC
LEADER | 00000nam a2200000 cb4500 | ||
---|---|---|---|
001 | BV001854177 | ||
003 | DE-604 | ||
005 | 00000000000000.0 | ||
007 | t | ||
008 | 890907s1987 a||| |||| 10||| und d | ||
035 | |a (OCoLC)165644928 | ||
035 | |a (DE-599)BVBBV001854177 | ||
040 | |a DE-604 |b ger |e rakddb | ||
041 | |a und | ||
049 | |a DE-12 | ||
111 | 2 | |a Workshop on Expert Systems and Pattern Analysis |d 1986 |c Paris |j Verfasser |0 (DE-588)814863-6 |4 aut | |
245 | 1 | 0 | |a Proceedings of IEEE Workshop on Expert Systems and Pattern Analysis |b October 31, 1986, Paris, France |c ed. by C. H. Chen |
246 | 1 | 3 | |a Expert systems and pattern analysis |
264 | 1 | |a Singapore u.a. |b World Scientific |c 1987 | |
300 | |a VI S., S. 178 - 302 |b Ill. | ||
336 | |b txt |2 rdacontent | ||
337 | |b n |2 rdamedia | ||
338 | |b nc |2 rdacarrier | ||
490 | 0 | |a International journal of pattern recognition and artificial intelligence |v 1,2 | |
650 | 0 | 7 | |a Expertensystem |0 (DE-588)4113491-6 |2 gnd |9 rswk-swf |
650 | 0 | 7 | |a Mustererkennung |0 (DE-588)4040936-3 |2 gnd |9 rswk-swf |
655 | 7 | |0 (DE-588)1071861417 |a Konferenzschrift |y 1986 |z Paris |2 gnd-content | |
689 | 0 | 0 | |a Expertensystem |0 (DE-588)4113491-6 |D s |
689 | 0 | 1 | |a Mustererkennung |0 (DE-588)4040936-3 |D s |
689 | 0 | |5 DE-604 | |
700 | 1 | |a Chen, Chi-hau |d 1937- |e Sonstige |0 (DE-588)110444965 |4 oth | |
999 | |a oai:aleph.bib-bvb.de:BVB01-001227805 |
Datensatz im Suchindex
_version_ | 1804116319809830912 |
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any_adam_object | |
author_GND | (DE-588)110444965 |
author_corporate | Workshop on Expert Systems and Pattern Analysis Paris |
author_corporate_role | aut |
author_facet | Workshop on Expert Systems and Pattern Analysis Paris |
author_sort | Workshop on Expert Systems and Pattern Analysis Paris |
building | Verbundindex |
bvnumber | BV001854177 |
ctrlnum | (OCoLC)165644928 (DE-599)BVBBV001854177 |
format | Conference Proceeding Book |
fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01360nam a2200349 cb4500</leader><controlfield tag="001">BV001854177</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">00000000000000.0</controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">890907s1987 a||| |||| 10||| und d</controlfield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)165644928</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV001854177</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rakddb</subfield></datafield><datafield tag="041" ind1=" " ind2=" "><subfield code="a">und</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-12</subfield></datafield><datafield tag="111" ind1="2" ind2=" "><subfield code="a">Workshop on Expert Systems and Pattern Analysis</subfield><subfield code="d">1986</subfield><subfield code="c">Paris</subfield><subfield code="j">Verfasser</subfield><subfield code="0">(DE-588)814863-6</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Proceedings of IEEE Workshop on Expert Systems and Pattern Analysis</subfield><subfield code="b">October 31, 1986, Paris, France</subfield><subfield code="c">ed. by C. H. Chen</subfield></datafield><datafield tag="246" ind1="1" ind2="3"><subfield code="a">Expert systems and pattern analysis</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Singapore u.a.</subfield><subfield code="b">World Scientific</subfield><subfield code="c">1987</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">VI S., S. 178 - 302</subfield><subfield code="b">Ill.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="0" ind2=" "><subfield code="a">International journal of pattern recognition and artificial intelligence</subfield><subfield code="v">1,2</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Expertensystem</subfield><subfield code="0">(DE-588)4113491-6</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Mustererkennung</subfield><subfield code="0">(DE-588)4040936-3</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="655" ind1=" " ind2="7"><subfield code="0">(DE-588)1071861417</subfield><subfield code="a">Konferenzschrift</subfield><subfield code="y">1986</subfield><subfield code="z">Paris</subfield><subfield code="2">gnd-content</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Expertensystem</subfield><subfield code="0">(DE-588)4113491-6</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="1"><subfield code="a">Mustererkennung</subfield><subfield code="0">(DE-588)4040936-3</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Chen, Chi-hau</subfield><subfield code="d">1937-</subfield><subfield code="e">Sonstige</subfield><subfield code="0">(DE-588)110444965</subfield><subfield code="4">oth</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-001227805</subfield></datafield></record></collection> |
genre | (DE-588)1071861417 Konferenzschrift 1986 Paris gnd-content |
genre_facet | Konferenzschrift 1986 Paris |
id | DE-604.BV001854177 |
illustrated | Illustrated |
indexdate | 2024-07-09T15:36:37Z |
institution | BVB |
institution_GND | (DE-588)814863-6 |
language | Undetermined |
oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-001227805 |
oclc_num | 165644928 |
open_access_boolean | |
owner | DE-12 |
owner_facet | DE-12 |
physical | VI S., S. 178 - 302 Ill. |
publishDate | 1987 |
publishDateSearch | 1987 |
publishDateSort | 1987 |
publisher | World Scientific |
record_format | marc |
series2 | International journal of pattern recognition and artificial intelligence |
spelling | Workshop on Expert Systems and Pattern Analysis 1986 Paris Verfasser (DE-588)814863-6 aut Proceedings of IEEE Workshop on Expert Systems and Pattern Analysis October 31, 1986, Paris, France ed. by C. H. Chen Expert systems and pattern analysis Singapore u.a. World Scientific 1987 VI S., S. 178 - 302 Ill. txt rdacontent n rdamedia nc rdacarrier International journal of pattern recognition and artificial intelligence 1,2 Expertensystem (DE-588)4113491-6 gnd rswk-swf Mustererkennung (DE-588)4040936-3 gnd rswk-swf (DE-588)1071861417 Konferenzschrift 1986 Paris gnd-content Expertensystem (DE-588)4113491-6 s Mustererkennung (DE-588)4040936-3 s DE-604 Chen, Chi-hau 1937- Sonstige (DE-588)110444965 oth |
spellingShingle | Proceedings of IEEE Workshop on Expert Systems and Pattern Analysis October 31, 1986, Paris, France Expertensystem (DE-588)4113491-6 gnd Mustererkennung (DE-588)4040936-3 gnd |
subject_GND | (DE-588)4113491-6 (DE-588)4040936-3 (DE-588)1071861417 |
title | Proceedings of IEEE Workshop on Expert Systems and Pattern Analysis October 31, 1986, Paris, France |
title_alt | Expert systems and pattern analysis |
title_auth | Proceedings of IEEE Workshop on Expert Systems and Pattern Analysis October 31, 1986, Paris, France |
title_exact_search | Proceedings of IEEE Workshop on Expert Systems and Pattern Analysis October 31, 1986, Paris, France |
title_full | Proceedings of IEEE Workshop on Expert Systems and Pattern Analysis October 31, 1986, Paris, France ed. by C. H. Chen |
title_fullStr | Proceedings of IEEE Workshop on Expert Systems and Pattern Analysis October 31, 1986, Paris, France ed. by C. H. Chen |
title_full_unstemmed | Proceedings of IEEE Workshop on Expert Systems and Pattern Analysis October 31, 1986, Paris, France ed. by C. H. Chen |
title_short | Proceedings of IEEE Workshop on Expert Systems and Pattern Analysis |
title_sort | proceedings of ieee workshop on expert systems and pattern analysis october 31 1986 paris france |
title_sub | October 31, 1986, Paris, France |
topic | Expertensystem (DE-588)4113491-6 gnd Mustererkennung (DE-588)4040936-3 gnd |
topic_facet | Expertensystem Mustererkennung Konferenzschrift 1986 Paris |
work_keys_str_mv | AT workshoponexpertsystemsandpatternanalysisparis proceedingsofieeeworkshoponexpertsystemsandpatternanalysisoctober311986parisfrance AT chenchihau proceedingsofieeeworkshoponexpertsystemsandpatternanalysisoctober311986parisfrance AT workshoponexpertsystemsandpatternanalysisparis expertsystemsandpatternanalysis AT chenchihau expertsystemsandpatternanalysis |