Zur Bestimmung minimaler bedingter Stichprobenpläne für die Gut-Schlecht-Prüfung:
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Bibliographic Details
Main Author: Vaerst, Rembert (Author)
Format: Book
Language:German
Published: 1981
Subjects:
Item Description:Siegen, Univ., Diss.
Physical Description:165 S. graph.Darst.

There is no print copy available.

Interlibrary loan Place Request Caution: Not in THWS collection!