Fundamentals of surface and thin film analysis:
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Bibliographic Details
Main Authors: Feldman, Leonard C. (Author), Mayer, James W. 1930-2013 (Author)
Format: Book
Language:English
Published: New York [u.a.] North-Holland 1986
Edition:1. print.
Subjects:
Physical Description:XVIII, 352 S. graph. Darst.
ISBN:0444009892

There is no print copy available.

Interlibrary loan Place Request Caution: Not in THWS collection!