Testmustergenerierung und Fehlersimulation in digitalen Schaltungen mit hoher Komplexität:
Saved in:
| Main Author: | |
|---|---|
| Format: | Book |
| Language: | German |
| Published: |
Berlin u.a.
Springer
1988
|
| Series: | Informatik-Fachberichte
173 |
| Subjects: | |
| Physical Description: | IX, 165 S. graph. Darst. |
| ISBN: | 3540500510 0387500510 |
Staff View
MARC
| LEADER | 00000nam a2200000 cb4500 | ||
|---|---|---|---|
| 001 | BV000857567 | ||
| 003 | DE-604 | ||
| 005 | 19940627 | ||
| 007 | t| | ||
| 008 | 890109s1988 xx d||| |||| 00||| ger d | ||
| 020 | |a 3540500510 |9 3-540-50051-0 | ||
| 020 | |a 0387500510 |9 0-387-50051-0 | ||
| 035 | |a (OCoLC)19648137 | ||
| 035 | |a (DE-599)BVBBV000857567 | ||
| 040 | |a DE-604 |b ger |e rakddb | ||
| 041 | 0 | |a ger | |
| 049 | |a DE-12 |a DE-91G |a DE-384 |a DE-Aug4 |a DE-739 |a DE-898 |a DE-355 |a DE-20 |a DE-29T |a DE-19 |a DE-862 |a DE-706 |a DE-83 |a DE-11 |a DE-188 | ||
| 050 | 0 | |a TK7868.D5 | |
| 082 | 0 | |a 621.381 |2 20 | |
| 084 | |a ST 190 |0 (DE-625)143607: |2 rvk | ||
| 084 | |a ZN 5680 |0 (DE-625)157475: |2 rvk | ||
| 084 | |a ELT 035f |2 stub | ||
| 100 | 1 | |a Schulz, Michael H. |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a Testmustergenerierung und Fehlersimulation in digitalen Schaltungen mit hoher Komplexität |c Michael H. Schulz |
| 264 | 1 | |a Berlin u.a. |b Springer |c 1988 | |
| 300 | |a IX, 165 S. |b graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 490 | 1 | |a Informatik-Fachberichte |v 173 | |
| 650 | 4 | |a Digital electronics | |
| 650 | 0 | 7 | |a Integrierte Schaltung |0 (DE-588)4027242-4 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Schaltnetz |0 (DE-588)4052053-5 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Fehlersimulation |0 (DE-588)4234819-5 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Testmustergenerator |0 (DE-588)4210166-9 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Digitalschaltung |0 (DE-588)4012295-5 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Prüftechnik |0 (DE-588)4047610-8 |2 gnd |9 rswk-swf |
| 655 | 7 | |8 1\p |0 (DE-588)4113937-9 |a Hochschulschrift |2 gnd-content | |
| 689 | 0 | 0 | |a Digitalschaltung |0 (DE-588)4012295-5 |D s |
| 689 | 0 | 1 | |a Testmustergenerator |0 (DE-588)4210166-9 |D s |
| 689 | 0 | |5 DE-604 | |
| 689 | 1 | 0 | |a Digitalschaltung |0 (DE-588)4012295-5 |D s |
| 689 | 1 | 1 | |a Fehlersimulation |0 (DE-588)4234819-5 |D s |
| 689 | 1 | |5 DE-604 | |
| 689 | 2 | 0 | |a Schaltnetz |0 (DE-588)4052053-5 |D s |
| 689 | 2 | 1 | |a Testmustergenerator |0 (DE-588)4210166-9 |D s |
| 689 | 2 | |5 DE-604 | |
| 689 | 3 | 0 | |a Testmustergenerator |0 (DE-588)4210166-9 |D s |
| 689 | 3 | 1 | |a Integrierte Schaltung |0 (DE-588)4027242-4 |D s |
| 689 | 3 | |5 DE-604 | |
| 689 | 4 | 0 | |a Schaltnetz |0 (DE-588)4052053-5 |D s |
| 689 | 4 | 1 | |a Prüftechnik |0 (DE-588)4047610-8 |D s |
| 689 | 4 | |8 2\p |5 DE-604 | |
| 830 | 0 | |a Informatik-Fachberichte |v 173 |w (DE-604)BV000006843 |9 173 | |
| 883 | 1 | |8 1\p |a cgwrk |d 20201028 |q DE-101 |u https://d-nb.info/provenance/plan#cgwrk | |
| 883 | 1 | |8 2\p |a cgwrk |d 20201028 |q DE-101 |u https://d-nb.info/provenance/plan#cgwrk | |
| 943 | 1 | |a oai:aleph.bib-bvb.de:BVB01-000538172 | |
Record in the Search Index
| DE-BY-862_location | 2000 |
|---|---|
| DE-BY-FWS_call_number | 2000/ZN 5680 S388 |
| DE-BY-FWS_katkey | 31112 |
| DE-BY-FWS_media_number | 083000300193 |
| _version_ | 1824555280077160448 |
| adam_text | |
| any_adam_object | |
| author | Schulz, Michael H. |
| author_facet | Schulz, Michael H. |
| author_role | aut |
| author_sort | Schulz, Michael H. |
| author_variant | m h s mh mhs |
| building | Verbundindex |
| bvnumber | BV000857567 |
| callnumber-first | T - Technology |
| callnumber-label | TK7868 |
| callnumber-raw | TK7868.D5 |
| callnumber-search | TK7868.D5 |
| callnumber-sort | TK 47868 D5 |
| callnumber-subject | TK - Electrical and Nuclear Engineering |
| classification_rvk | ST 190 ZN 5680 |
| classification_tum | ELT 035f |
| ctrlnum | (OCoLC)19648137 (DE-599)BVBBV000857567 |
| dewey-full | 621.381 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 621 - Applied physics |
| dewey-raw | 621.381 |
| dewey-search | 621.381 |
| dewey-sort | 3621.381 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Informatik Elektrotechnik Elektrotechnik / Elektronik / Nachrichtentechnik |
| format | Book |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>00000nam a2200000 cb4500</leader><controlfield tag="001">BV000857567</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">19940627</controlfield><controlfield tag="007">t|</controlfield><controlfield tag="008">890109s1988 xx d||| |||| 00||| ger d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">3540500510</subfield><subfield code="9">3-540-50051-0</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">0387500510</subfield><subfield code="9">0-387-50051-0</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)19648137</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV000857567</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rakddb</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">ger</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-12</subfield><subfield code="a">DE-91G</subfield><subfield code="a">DE-384</subfield><subfield code="a">DE-Aug4</subfield><subfield code="a">DE-739</subfield><subfield code="a">DE-898</subfield><subfield code="a">DE-355</subfield><subfield code="a">DE-20</subfield><subfield code="a">DE-29T</subfield><subfield code="a">DE-19</subfield><subfield code="a">DE-862</subfield><subfield code="a">DE-706</subfield><subfield code="a">DE-83</subfield><subfield code="a">DE-11</subfield><subfield code="a">DE-188</subfield></datafield><datafield tag="050" ind1=" " ind2="0"><subfield code="a">TK7868.D5</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">621.381</subfield><subfield code="2">20</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">ST 190</subfield><subfield code="0">(DE-625)143607:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">ZN 5680</subfield><subfield code="0">(DE-625)157475:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">ELT 035f</subfield><subfield code="2">stub</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Schulz, Michael H.</subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Testmustergenerierung und Fehlersimulation in digitalen Schaltungen mit hoher Komplexität</subfield><subfield code="c">Michael H. Schulz</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Berlin u.a.</subfield><subfield code="b">Springer</subfield><subfield code="c">1988</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">IX, 165 S.</subfield><subfield code="b">graph. Darst.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="1" ind2=" "><subfield code="a">Informatik-Fachberichte</subfield><subfield code="v">173</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Digital electronics</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Integrierte Schaltung</subfield><subfield code="0">(DE-588)4027242-4</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Schaltnetz</subfield><subfield code="0">(DE-588)4052053-5</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Fehlersimulation</subfield><subfield code="0">(DE-588)4234819-5</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Testmustergenerator</subfield><subfield code="0">(DE-588)4210166-9</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Digitalschaltung</subfield><subfield code="0">(DE-588)4012295-5</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Prüftechnik</subfield><subfield code="0">(DE-588)4047610-8</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="655" ind1=" " ind2="7"><subfield code="8">1\p</subfield><subfield code="0">(DE-588)4113937-9</subfield><subfield code="a">Hochschulschrift</subfield><subfield code="2">gnd-content</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Digitalschaltung</subfield><subfield code="0">(DE-588)4012295-5</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="1"><subfield code="a">Testmustergenerator</subfield><subfield code="0">(DE-588)4210166-9</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="1" ind2="0"><subfield code="a">Digitalschaltung</subfield><subfield code="0">(DE-588)4012295-5</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="1" ind2="1"><subfield code="a">Fehlersimulation</subfield><subfield code="0">(DE-588)4234819-5</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="1" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="2" ind2="0"><subfield code="a">Schaltnetz</subfield><subfield code="0">(DE-588)4052053-5</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="2" ind2="1"><subfield code="a">Testmustergenerator</subfield><subfield code="0">(DE-588)4210166-9</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="2" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="3" ind2="0"><subfield code="a">Testmustergenerator</subfield><subfield code="0">(DE-588)4210166-9</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="3" ind2="1"><subfield code="a">Integrierte Schaltung</subfield><subfield code="0">(DE-588)4027242-4</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="3" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="4" ind2="0"><subfield code="a">Schaltnetz</subfield><subfield code="0">(DE-588)4052053-5</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="4" ind2="1"><subfield code="a">Prüftechnik</subfield><subfield code="0">(DE-588)4047610-8</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="4" ind2=" "><subfield code="8">2\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="830" ind1=" " ind2="0"><subfield code="a">Informatik-Fachberichte</subfield><subfield code="v">173</subfield><subfield code="w">(DE-604)BV000006843</subfield><subfield code="9">173</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">1\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">2\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield><datafield tag="943" ind1="1" ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-000538172</subfield></datafield></record></collection> |
| genre | 1\p (DE-588)4113937-9 Hochschulschrift gnd-content |
| genre_facet | Hochschulschrift |
| id | DE-604.BV000857567 |
| illustrated | Illustrated |
| indexdate | 2025-02-20T07:05:09Z |
| institution | BVB |
| isbn | 3540500510 0387500510 |
| language | German |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-000538172 |
| oclc_num | 19648137 |
| open_access_boolean | |
| owner | DE-12 DE-91G DE-BY-TUM DE-384 DE-Aug4 DE-739 DE-898 DE-BY-UBR DE-355 DE-BY-UBR DE-20 DE-29T DE-19 DE-BY-UBM DE-862 DE-BY-FWS DE-706 DE-83 DE-11 DE-188 |
| owner_facet | DE-12 DE-91G DE-BY-TUM DE-384 DE-Aug4 DE-739 DE-898 DE-BY-UBR DE-355 DE-BY-UBR DE-20 DE-29T DE-19 DE-BY-UBM DE-862 DE-BY-FWS DE-706 DE-83 DE-11 DE-188 |
| physical | IX, 165 S. graph. Darst. |
| publishDate | 1988 |
| publishDateSearch | 1988 |
| publishDateSort | 1988 |
| publisher | Springer |
| record_format | marc |
| series | Informatik-Fachberichte |
| series2 | Informatik-Fachberichte |
| spellingShingle | Schulz, Michael H. Testmustergenerierung und Fehlersimulation in digitalen Schaltungen mit hoher Komplexität Informatik-Fachberichte Digital electronics Integrierte Schaltung (DE-588)4027242-4 gnd Schaltnetz (DE-588)4052053-5 gnd Fehlersimulation (DE-588)4234819-5 gnd Testmustergenerator (DE-588)4210166-9 gnd Digitalschaltung (DE-588)4012295-5 gnd Prüftechnik (DE-588)4047610-8 gnd |
| subject_GND | (DE-588)4027242-4 (DE-588)4052053-5 (DE-588)4234819-5 (DE-588)4210166-9 (DE-588)4012295-5 (DE-588)4047610-8 (DE-588)4113937-9 |
| title | Testmustergenerierung und Fehlersimulation in digitalen Schaltungen mit hoher Komplexität |
| title_auth | Testmustergenerierung und Fehlersimulation in digitalen Schaltungen mit hoher Komplexität |
| title_exact_search | Testmustergenerierung und Fehlersimulation in digitalen Schaltungen mit hoher Komplexität |
| title_full | Testmustergenerierung und Fehlersimulation in digitalen Schaltungen mit hoher Komplexität Michael H. Schulz |
| title_fullStr | Testmustergenerierung und Fehlersimulation in digitalen Schaltungen mit hoher Komplexität Michael H. Schulz |
| title_full_unstemmed | Testmustergenerierung und Fehlersimulation in digitalen Schaltungen mit hoher Komplexität Michael H. Schulz |
| title_short | Testmustergenerierung und Fehlersimulation in digitalen Schaltungen mit hoher Komplexität |
| title_sort | testmustergenerierung und fehlersimulation in digitalen schaltungen mit hoher komplexitat |
| topic | Digital electronics Integrierte Schaltung (DE-588)4027242-4 gnd Schaltnetz (DE-588)4052053-5 gnd Fehlersimulation (DE-588)4234819-5 gnd Testmustergenerator (DE-588)4210166-9 gnd Digitalschaltung (DE-588)4012295-5 gnd Prüftechnik (DE-588)4047610-8 gnd |
| topic_facet | Digital electronics Integrierte Schaltung Schaltnetz Fehlersimulation Testmustergenerator Digitalschaltung Prüftechnik Hochschulschrift |
| volume_link | (DE-604)BV000006843 |
| work_keys_str_mv | AT schulzmichaelh testmustergenerierungundfehlersimulationindigitalenschaltungenmithoherkomplexitat |
THWS Schweinfurt Zentralbibliothek Lesesaal
| Call Number: |
2000 ZN 5680 S388 |
|---|---|
| Copy 1 | ausleihbar Available Place a Hold |