Secondary ion mass spectrometry: SIMS V ; proceedings of the fifth international conference, Washington, DC, September 30 - October 4, 1985
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Bibliographic Details
Other Authors: Benninghoven, Alfred (Editor)
Format: Conference Proceeding Book
Language:English
Published: Berlin [u.a.] Springer 1986
Series:Springer series in chemical physics 44
Subjects:
Physical Description:XXI, 561 S. Ill., graph. Darst.
ISBN:3540162631
0387162631

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