Secondary ion mass spectrometry: SIMS V ; proceedings of the fifth international conference, Washington, DC, September 30 - October 4, 1985
Gespeichert in:
Weitere Verfasser: | |
---|---|
Format: | Tagungsbericht Buch |
Sprache: | English |
Veröffentlicht: |
Berlin [u.a.]
Springer
1986
|
Schriftenreihe: | Springer series in chemical physics
44 |
Schlagworte: | |
Beschreibung: | XXI, 561 S. Ill., graph. Darst. |
ISBN: | 3540162631 0387162631 |
Internformat
MARC
LEADER | 00000nam a2200000 cb4500 | ||
---|---|---|---|
001 | BV000517726 | ||
003 | DE-604 | ||
005 | 20130805 | ||
007 | t | ||
008 | 870612s1986 ad|| |||| 10||| eng d | ||
020 | |a 3540162631 |9 3-540-16263-1 | ||
020 | |a 0387162631 |9 0-387-16263-1 | ||
035 | |a (OCoLC)13331329 | ||
035 | |a (DE-599)BVBBV000517726 | ||
040 | |a DE-604 |b ger |e rakddb | ||
041 | 0 | |a eng | |
049 | |a DE-12 |a DE-384 |a DE-188 | ||
050 | 0 | |a QD96.S43 | |
082 | 0 | |a 539/.6/028 |2 19 | |
245 | 1 | 0 | |a Secondary ion mass spectrometry |b SIMS V ; proceedings of the fifth international conference, Washington, DC, September 30 - October 4, 1985 |c [Fifth International Conference on Secondary ion mass spectrometry]. Ed.: A. Benninghoven ... |
246 | 1 | 3 | |a SIMS V |
264 | 1 | |a Berlin [u.a.] |b Springer |c 1986 | |
300 | |a XXI, 561 S. |b Ill., graph. Darst. | ||
336 | |b txt |2 rdacontent | ||
337 | |b n |2 rdamedia | ||
338 | |b nc |2 rdacarrier | ||
490 | 1 | |a Springer series in chemical physics |v 44 | |
650 | 4 | |a Secondary ion mass spectrometry |v Congresses | |
650 | 0 | 7 | |a Sekundärionen-Massenspektrometrie |0 (DE-588)4077346-2 |2 gnd |9 rswk-swf |
655 | 7 | |0 (DE-588)1071861417 |a Konferenzschrift |y 1985 |z Washington DC |2 gnd-content | |
689 | 0 | 0 | |a Sekundärionen-Massenspektrometrie |0 (DE-588)4077346-2 |D s |
689 | 0 | |5 DE-604 | |
700 | 1 | |a Benninghoven, Alfred |4 edt | |
711 | 2 | |a SIMS |n 5 |d 1985 |c Washington, DC |j Sonstige |0 (DE-588)800133-9 |4 oth | |
830 | 0 | |a Springer series in chemical physics |v 44 |w (DE-604)BV000000670 |9 44 | |
999 | |a oai:aleph.bib-bvb.de:BVB01-000319473 |
Datensatz im Suchindex
_version_ | 1804114966769303552 |
---|---|
any_adam_object | |
author2 | Benninghoven, Alfred |
author2_role | edt |
author2_variant | a b ab |
author_facet | Benninghoven, Alfred |
building | Verbundindex |
bvnumber | BV000517726 |
callnumber-first | Q - Science |
callnumber-label | QD96 |
callnumber-raw | QD96.S43 |
callnumber-search | QD96.S43 |
callnumber-sort | QD 296 S43 |
callnumber-subject | QD - Chemistry |
ctrlnum | (OCoLC)13331329 (DE-599)BVBBV000517726 |
dewey-full | 539/.6/028 |
dewey-hundreds | 500 - Natural sciences and mathematics |
dewey-ones | 539 - Modern physics |
dewey-raw | 539/.6/028 |
dewey-search | 539/.6/028 |
dewey-sort | 3539 16 228 |
dewey-tens | 530 - Physics |
discipline | Physik |
format | Conference Proceeding Book |
fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01569nam a2200397 cb4500</leader><controlfield tag="001">BV000517726</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20130805 </controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">870612s1986 ad|| |||| 10||| eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">3540162631</subfield><subfield code="9">3-540-16263-1</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">0387162631</subfield><subfield code="9">0-387-16263-1</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)13331329</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV000517726</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rakddb</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-12</subfield><subfield code="a">DE-384</subfield><subfield code="a">DE-188</subfield></datafield><datafield tag="050" ind1=" " ind2="0"><subfield code="a">QD96.S43</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">539/.6/028</subfield><subfield code="2">19</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Secondary ion mass spectrometry</subfield><subfield code="b">SIMS V ; proceedings of the fifth international conference, Washington, DC, September 30 - October 4, 1985</subfield><subfield code="c">[Fifth International Conference on Secondary ion mass spectrometry]. Ed.: A. Benninghoven ...</subfield></datafield><datafield tag="246" ind1="1" ind2="3"><subfield code="a">SIMS V</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Berlin [u.a.]</subfield><subfield code="b">Springer</subfield><subfield code="c">1986</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">XXI, 561 S.</subfield><subfield code="b">Ill., graph. Darst.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="1" ind2=" "><subfield code="a">Springer series in chemical physics</subfield><subfield code="v">44</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Secondary ion mass spectrometry</subfield><subfield code="v">Congresses</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Sekundärionen-Massenspektrometrie</subfield><subfield code="0">(DE-588)4077346-2</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="655" ind1=" " ind2="7"><subfield code="0">(DE-588)1071861417</subfield><subfield code="a">Konferenzschrift</subfield><subfield code="y">1985</subfield><subfield code="z">Washington DC</subfield><subfield code="2">gnd-content</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Sekundärionen-Massenspektrometrie</subfield><subfield code="0">(DE-588)4077346-2</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Benninghoven, Alfred</subfield><subfield code="4">edt</subfield></datafield><datafield tag="711" ind1="2" ind2=" "><subfield code="a">SIMS</subfield><subfield code="n">5</subfield><subfield code="d">1985</subfield><subfield code="c">Washington, DC</subfield><subfield code="j">Sonstige</subfield><subfield code="0">(DE-588)800133-9</subfield><subfield code="4">oth</subfield></datafield><datafield tag="830" ind1=" " ind2="0"><subfield code="a">Springer series in chemical physics</subfield><subfield code="v">44</subfield><subfield code="w">(DE-604)BV000000670</subfield><subfield code="9">44</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-000319473</subfield></datafield></record></collection> |
genre | (DE-588)1071861417 Konferenzschrift 1985 Washington DC gnd-content |
genre_facet | Konferenzschrift 1985 Washington DC |
id | DE-604.BV000517726 |
illustrated | Illustrated |
indexdate | 2024-07-09T15:15:07Z |
institution | BVB |
institution_GND | (DE-588)800133-9 |
isbn | 3540162631 0387162631 |
language | English |
oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-000319473 |
oclc_num | 13331329 |
open_access_boolean | |
owner | DE-12 DE-384 DE-188 |
owner_facet | DE-12 DE-384 DE-188 |
physical | XXI, 561 S. Ill., graph. Darst. |
publishDate | 1986 |
publishDateSearch | 1986 |
publishDateSort | 1986 |
publisher | Springer |
record_format | marc |
series | Springer series in chemical physics |
series2 | Springer series in chemical physics |
spelling | Secondary ion mass spectrometry SIMS V ; proceedings of the fifth international conference, Washington, DC, September 30 - October 4, 1985 [Fifth International Conference on Secondary ion mass spectrometry]. Ed.: A. Benninghoven ... SIMS V Berlin [u.a.] Springer 1986 XXI, 561 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Springer series in chemical physics 44 Secondary ion mass spectrometry Congresses Sekundärionen-Massenspektrometrie (DE-588)4077346-2 gnd rswk-swf (DE-588)1071861417 Konferenzschrift 1985 Washington DC gnd-content Sekundärionen-Massenspektrometrie (DE-588)4077346-2 s DE-604 Benninghoven, Alfred edt SIMS 5 1985 Washington, DC Sonstige (DE-588)800133-9 oth Springer series in chemical physics 44 (DE-604)BV000000670 44 |
spellingShingle | Secondary ion mass spectrometry SIMS V ; proceedings of the fifth international conference, Washington, DC, September 30 - October 4, 1985 Springer series in chemical physics Secondary ion mass spectrometry Congresses Sekundärionen-Massenspektrometrie (DE-588)4077346-2 gnd |
subject_GND | (DE-588)4077346-2 (DE-588)1071861417 |
title | Secondary ion mass spectrometry SIMS V ; proceedings of the fifth international conference, Washington, DC, September 30 - October 4, 1985 |
title_alt | SIMS V |
title_auth | Secondary ion mass spectrometry SIMS V ; proceedings of the fifth international conference, Washington, DC, September 30 - October 4, 1985 |
title_exact_search | Secondary ion mass spectrometry SIMS V ; proceedings of the fifth international conference, Washington, DC, September 30 - October 4, 1985 |
title_full | Secondary ion mass spectrometry SIMS V ; proceedings of the fifth international conference, Washington, DC, September 30 - October 4, 1985 [Fifth International Conference on Secondary ion mass spectrometry]. Ed.: A. Benninghoven ... |
title_fullStr | Secondary ion mass spectrometry SIMS V ; proceedings of the fifth international conference, Washington, DC, September 30 - October 4, 1985 [Fifth International Conference on Secondary ion mass spectrometry]. Ed.: A. Benninghoven ... |
title_full_unstemmed | Secondary ion mass spectrometry SIMS V ; proceedings of the fifth international conference, Washington, DC, September 30 - October 4, 1985 [Fifth International Conference on Secondary ion mass spectrometry]. Ed.: A. Benninghoven ... |
title_short | Secondary ion mass spectrometry |
title_sort | secondary ion mass spectrometry sims v proceedings of the fifth international conference washington dc september 30 october 4 1985 |
title_sub | SIMS V ; proceedings of the fifth international conference, Washington, DC, September 30 - October 4, 1985 |
topic | Secondary ion mass spectrometry Congresses Sekundärionen-Massenspektrometrie (DE-588)4077346-2 gnd |
topic_facet | Secondary ion mass spectrometry Congresses Sekundärionen-Massenspektrometrie Konferenzschrift 1985 Washington DC |
volume_link | (DE-604)BV000000670 |
work_keys_str_mv | AT benninghovenalfred secondaryionmassspectrometrysimsvproceedingsofthefifthinternationalconferencewashingtondcseptember30october41985 AT simswashingtondc secondaryionmassspectrometrysimsvproceedingsofthefifthinternationalconferencewashingtondcseptember30october41985 AT benninghovenalfred simsv AT simswashingtondc simsv |