Secondary ion mass spectrometry: SIMS IV ; proceedings of the fourth international conference, Osaka, Japan, November 13 - 19, 1983
Saved in:
| Other Authors: | |
|---|---|
| Format: | Conference Proceeding Book |
| Language: | English |
| Published: |
Berlin [u.a.]
Springer
1984
|
| Series: | Springer series in chemical physics
36 |
| Subjects: | |
| Item Description: | NT: SIMS |
| Physical Description: | XV, 503 S. Ill., graph. Darst. |
| ISBN: | 354013316X 038713316X |
Staff View
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Record in the Search Index
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| author2 | Benninghoven, Alfred 1932- |
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| author_GND | (DE-588)1038450934 |
| author_facet | Benninghoven, Alfred 1932- |
| building | Verbundindex |
| bvnumber | BV000219067 |
| classification_tum | PHY 547f PHY 115f PHY 791f |
| ctrlnum | (OCoLC)165803735 (DE-599)BVBBV000219067 |
| discipline | Physik |
| format | Conference Proceeding Book |
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| genre | (DE-588)1071861417 Konferenzschrift 1983 Osaka gnd-content |
| genre_facet | Konferenzschrift 1983 Osaka |
| id | DE-604.BV000219067 |
| illustrated | Illustrated |
| indexdate | 2025-05-02T14:00:48Z |
| institution | BVB |
| institution_GND | (DE-588)814126-5 |
| isbn | 354013316X 038713316X |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-000130043 |
| oclc_num | 165803735 |
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| owner | DE-12 DE-29T DE-91G DE-BY-TUM DE-188 DE-706 |
| owner_facet | DE-12 DE-29T DE-91G DE-BY-TUM DE-188 DE-706 |
| physical | XV, 503 S. Ill., graph. Darst. |
| publishDate | 1984 |
| publishDateSearch | 1984 |
| publishDateSort | 1984 |
| publisher | Springer |
| record_format | marc |
| series | Springer series in chemical physics |
| series2 | Springer series in chemical physics |
| spelling | Secondary ion mass spectrometry SIMS IV ; proceedings of the fourth international conference, Osaka, Japan, November 13 - 19, 1983 [Fourth International Conference on Secondary ion mass spectrometry]. Ed.: A. Benninghoven ... SIMS Berlin [u.a.] Springer 1984 XV, 503 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Springer series in chemical physics 36 NT: SIMS Sekundärionen-Massenspektrometrie (DE-588)4077346-2 gnd rswk-swf Massenspektrometrie (DE-588)4037882-2 gnd rswk-swf Ionenstrahl (DE-588)4162347-2 gnd rswk-swf (DE-588)1071861417 Konferenzschrift 1983 Osaka gnd-content Sekundärionen-Massenspektrometrie (DE-588)4077346-2 s DE-604 Massenspektrometrie (DE-588)4037882-2 s Ionenstrahl (DE-588)4162347-2 s Benninghoven, Alfred 1932- (DE-588)1038450934 edt SIMS 4 1983 Osaka Sonstige (DE-588)814126-5 oth Springer series in chemical physics 36 (DE-604)BV000000670 36 |
| spellingShingle | Secondary ion mass spectrometry SIMS IV ; proceedings of the fourth international conference, Osaka, Japan, November 13 - 19, 1983 Springer series in chemical physics Sekundärionen-Massenspektrometrie (DE-588)4077346-2 gnd Massenspektrometrie (DE-588)4037882-2 gnd Ionenstrahl (DE-588)4162347-2 gnd |
| subject_GND | (DE-588)4077346-2 (DE-588)4037882-2 (DE-588)4162347-2 (DE-588)1071861417 |
| title | Secondary ion mass spectrometry SIMS IV ; proceedings of the fourth international conference, Osaka, Japan, November 13 - 19, 1983 |
| title_alt | SIMS |
| title_auth | Secondary ion mass spectrometry SIMS IV ; proceedings of the fourth international conference, Osaka, Japan, November 13 - 19, 1983 |
| title_exact_search | Secondary ion mass spectrometry SIMS IV ; proceedings of the fourth international conference, Osaka, Japan, November 13 - 19, 1983 |
| title_full | Secondary ion mass spectrometry SIMS IV ; proceedings of the fourth international conference, Osaka, Japan, November 13 - 19, 1983 [Fourth International Conference on Secondary ion mass spectrometry]. Ed.: A. Benninghoven ... |
| title_fullStr | Secondary ion mass spectrometry SIMS IV ; proceedings of the fourth international conference, Osaka, Japan, November 13 - 19, 1983 [Fourth International Conference on Secondary ion mass spectrometry]. Ed.: A. Benninghoven ... |
| title_full_unstemmed | Secondary ion mass spectrometry SIMS IV ; proceedings of the fourth international conference, Osaka, Japan, November 13 - 19, 1983 [Fourth International Conference on Secondary ion mass spectrometry]. Ed.: A. Benninghoven ... |
| title_short | Secondary ion mass spectrometry |
| title_sort | secondary ion mass spectrometry sims iv proceedings of the fourth international conference osaka japan november 13 19 1983 |
| title_sub | SIMS IV ; proceedings of the fourth international conference, Osaka, Japan, November 13 - 19, 1983 |
| topic | Sekundärionen-Massenspektrometrie (DE-588)4077346-2 gnd Massenspektrometrie (DE-588)4037882-2 gnd Ionenstrahl (DE-588)4162347-2 gnd |
| topic_facet | Sekundärionen-Massenspektrometrie Massenspektrometrie Ionenstrahl Konferenzschrift 1983 Osaka |
| volume_link | (DE-604)BV000000670 |
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