Verfügbarkeit: Secondary ion mass spectrometry

Secondary ion mass spectrometry: SIMS IV ; proceedings of the fourth international conference, Osaka, Japan, November 13 - 19, 1983

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Bibliographische Detailangaben
Weitere Verfasser:	Benninghoven, Alfred (HerausgeberIn)
Format:	Tagungsbericht Buch
Sprache:	English
Veröffentlicht:	Berlin [u.a.] Springer 1984
Schriftenreihe:	Springer series in chemical physics 36
Schlagworte:	Ionenstrahl Sekundärionen-Massenspektrometrie Massenspektrometrie Konferenzschrift > 1983 > Osaka
Beschreibung:	NT: SIMS
Beschreibung:	XV, 503 S. Ill., graph. Darst.
ISBN:	354013316X 038713316X

Internformat

MARC


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Datensatz im Suchindex

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format	Conference Proceeding Book
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genre	(DE-588)1071861417 Konferenzschrift 1983 Osaka gnd-content
genre_facet	Konferenzschrift 1983 Osaka
id	DE-604.BV000219067
illustrated	Illustrated
indexdate	2024-07-09T15:10:35Z
institution	BVB
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isbn	354013316X 038713316X
language	English
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physical	XV, 503 S. Ill., graph. Darst.
publishDate	1984
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publisher	Springer
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series	Springer series in chemical physics
series2	Springer series in chemical physics
spelling	Secondary ion mass spectrometry SIMS IV ; proceedings of the fourth international conference, Osaka, Japan, November 13 - 19, 1983 [Fourth International Conference on Secondary ion mass spectrometry]. Ed.: A. Benninghoven ... SIMS Berlin [u.a.] Springer 1984 XV, 503 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Springer series in chemical physics 36 NT: SIMS Ionenstrahl (DE-588)4162347-2 gnd rswk-swf Sekundärionen-Massenspektrometrie (DE-588)4077346-2 gnd rswk-swf Massenspektrometrie (DE-588)4037882-2 gnd rswk-swf (DE-588)1071861417 Konferenzschrift 1983 Osaka gnd-content Sekundärionen-Massenspektrometrie (DE-588)4077346-2 s DE-604 Massenspektrometrie (DE-588)4037882-2 s 1\p DE-604 Ionenstrahl (DE-588)4162347-2 s 2\p DE-604 Benninghoven, Alfred edt SIMS 4 1983 Osaka Sonstige (DE-588)814126-5 oth Springer series in chemical physics 36 (DE-604)BV000000670 36 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 2\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk
spellingShingle	Secondary ion mass spectrometry SIMS IV ; proceedings of the fourth international conference, Osaka, Japan, November 13 - 19, 1983 Springer series in chemical physics Ionenstrahl (DE-588)4162347-2 gnd Sekundärionen-Massenspektrometrie (DE-588)4077346-2 gnd Massenspektrometrie (DE-588)4037882-2 gnd
subject_GND	(DE-588)4162347-2 (DE-588)4077346-2 (DE-588)4037882-2 (DE-588)1071861417
title	Secondary ion mass spectrometry SIMS IV ; proceedings of the fourth international conference, Osaka, Japan, November 13 - 19, 1983
title_alt	SIMS
title_auth	Secondary ion mass spectrometry SIMS IV ; proceedings of the fourth international conference, Osaka, Japan, November 13 - 19, 1983
title_exact_search	Secondary ion mass spectrometry SIMS IV ; proceedings of the fourth international conference, Osaka, Japan, November 13 - 19, 1983
title_full	Secondary ion mass spectrometry SIMS IV ; proceedings of the fourth international conference, Osaka, Japan, November 13 - 19, 1983 [Fourth International Conference on Secondary ion mass spectrometry]. Ed.: A. Benninghoven ...
title_fullStr	Secondary ion mass spectrometry SIMS IV ; proceedings of the fourth international conference, Osaka, Japan, November 13 - 19, 1983 [Fourth International Conference on Secondary ion mass spectrometry]. Ed.: A. Benninghoven ...
title_full_unstemmed	Secondary ion mass spectrometry SIMS IV ; proceedings of the fourth international conference, Osaka, Japan, November 13 - 19, 1983 [Fourth International Conference on Secondary ion mass spectrometry]. Ed.: A. Benninghoven ...
title_short	Secondary ion mass spectrometry
title_sort	secondary ion mass spectrometry sims iv proceedings of the fourth international conference osaka japan november 13 19 1983
title_sub	SIMS IV ; proceedings of the fourth international conference, Osaka, Japan, November 13 - 19, 1983
topic	Ionenstrahl (DE-588)4162347-2 gnd Sekundärionen-Massenspektrometrie (DE-588)4077346-2 gnd Massenspektrometrie (DE-588)4037882-2 gnd
topic_facet	Ionenstrahl Sekundärionen-Massenspektrometrie Massenspektrometrie Konferenzschrift 1983 Osaka
volume_link	(DE-604)BV000000670
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